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Lab Skills Enhanced with ICDD X-ray Clinics!

Leah Mooney
Education Coordinator, International Centre for Diffraction Data (ICDD)

The ICDD has provided quality training to the scientific community for over 15 years with annual XRF and XRD clinics. These clinics are a continuation of the SUNY Clinics held at the State University of New York in Albany for 25 years. Recently, our clinic on Practical X-ray Fluorescence was held 2-6 May and the XRD clinics were held 6-10 June for Fundamentals of X-ray Powder Diffractometry and 13-17 June for Advanced Methods in X-ray Powder Diffractometry. All clinics were held at the ICDD headquarters in Newtown Square, Pennsylvania , U.S.A.

Attendees of the ICDD 2005 clinics gained practical knowledge for improved lab performance through concise lectures on theory and applications, complimented with hands-on workshops. With the use of personal computers, live X-ray instrumentation and specimen preparation exercises, these clinics truly offered attendees a hands-on learning experience. Dr. Eugene Bertin, author of the handbook, “Principles and Practice of X-ray Spectrometric Analysis”, once again impressed attendees with his ever-popular lectures on the theory behind X-ray fluorescence. New this year for the Advanced XRD clinic, and in response to past clinic attendee evaluations, was an expanded session on the Rietveld Method.

The expert faculty of the clinics, with a wide-range of industry experience, provided attendees with the perfect learning experience. Our faculty has backgrounds in such fields as metals, minerals, microelectronics, polymers, organics, pharmaceuticals, and thin-films.

The 2005 XRF faculty included John A. Anzelmo, Anzelmo & Assoc., Inc.; Larry Arias, Bruker AXS, Inc.; Eugene Bertin, Emeritus RCA Laboratories; Richard Bostwick, SPEX SamplePrep, LLC; David Coler, PANalytical; Larry Creasy, TIMET; Al Martin, Rigaku/MSC, Inc. and Mary Ann Zaitz, IBM Microelectronics. Instructing during the XRD clinics were Thomas Blanton, Eastman Kodak Co.; Kurt Erlacher, Bruker AXS; John Faber, ICDD; Timothy Fawcett, ICDD; Lori Fields, Rigaku/MSC, Inc.; C.M. Foris, ForChem Consultant; Soorya Kabekkodu, ICDD; James Kaduk, INEOS Technologies Analytical Science Research Services ; W. Frank McClune, ICDD; Fangling Needham, ICDD; Susan Quick, The Pennsylvania State University; Mark Rodriguez, Sandia National Laboratories; Earle Ryba, The Pennsylvania State University; Charles Weth, ICDD and Stephen Williams, PANalytical.

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Not only did the clinics provide attendees with valuable knowledge to assist in their day to day job duties, but they also provided a forum for valuable discussions among peers in the shared field of materials characterization analysis.

In 2006, two new specialized workshops will be introduced by the ICDD in addition to our annual XRF and XRD clinics. These additions to the ICDD educational programs include an XRF specific sample preparation course and an advanced workshop on the Rietveld Method.

To enhance your lab skills with training from the ICDD, please visit us at www.icdd.com/education . If you would like more information on the forthcoming specialized workshop on Rietveld Methods contact Leah Mooney at e-mail: clinics@icdd.com

 

 

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