ICDD Clinic Faculty
XRF Faculty - XRD Faculty - XRF & XRD faculty may change without prior notice to attendees.
John Anzelmo
Anzelmo and Associates, Inc.
Madison, Wisconsin
The owner and President of Anzelmo and Associates, Inc., a firm providing
Marketing Consultation to Educational and High-Tech firms, as well as Analytical
X-ray and Sample Preparation Consultation, John is currently the Technical
Program Director for the ICDD XRF clinics. John brings 32 years of experience
in the fields of X-ray Fluorescence/X-ray Diffraction Analysis as Applications
Scientist, Laboratory Manager, Product Manager and Marketing Manager for
Applied Research Laboratories and Bruker AXS. He's been a faculty member
of the clinics for 17 years, both at the ICDD and SUNYA. John's industry
accomplishments include the development of Universal XRF Calibration for
Iron, Nickel and Cobalt base materials used heavily by Steel and High Alloy
mills in USA. John's publishing accomplishments include the first explicit
procedure for ASTM C-114 Qualification of Cement by XRF, and "… Universal
Method for Preparation of Powder Materials for XRF …" that is
used primarily by industries in mining, minerals, cement, slag and other
oxides. He has also written over forty publications and given hundreds
of presentations worldwide. John currently serves on the Denver X-ray Conference
Organizing Committee. His education includes a B.S. in Chemistry from Loyola
University, IL and graduate studies at the University of Wisconsin-Milwaukee.
Areas of expertise: XRF - applications, calibration, sample preparation,
instrument design; XRD - quantitative analysis and qualitative analysis
Larry Arias
Bruker AXS, Inc.
Madison, Wisconsin
Larry is the Senior XRF Application Scientist for Bruker AXS. He has been working in the field of XRF for over 29 years. He began his career as a Field Service Engineer with Philips Electronic Instruments in 1976 servicing and installing XRF and XRD instruments. Larry left the Service Department and joined the XRF Applications Laboratory at Philips in 1985. Three years later he left Philips to join the Siemens XRF Applications Laboratory. Siemens was later acquired by Bruker and is now known as Bruker AXS. During his time at both Philips and Bruker Larry organized and taught the user training courses and provided on-site training in XRF. Working in a manufactures Applications Laboratory for 20 years provided Larry a broad range of exposure to different analytical challenges in XRF.
Richard Bostwick
Spex SamplePrep LLC
Metuchen, New Jersey
Currently working as a Sales Specialist III with the Sample Preparation
Equipment Division of SPEX CertiPrep, Inc., Richard's duties include
technical sales, writing and editing, equipment demonstrations, sample
preparation methods development, attending trade shows, etc. Richard's
education includes the Blair Academy, Blairstown, NJ, Yale University, New
Haven CT, B.A. 1965 and graduate work at Harvard Graduate School of
Education, Cambridge MA, 1965-1967, and the University of Colorado,
Boulder CO, intermittent 1969-73. His honors include the mineral species
bostwickite, CaMn6Si3O16.7H2O, named in 1983.
Area of expertise: Sample preparation, particularly for XRF
Larry Creasy
Emeritus,Titanium Metals Corporation
Morgantown, Pennsylvania
With over 35 years of experience in the field, Larry began his chemistry
career in the United States Marine Corps assigned to the Jet Propulsion
Laboratory in Pasadena, CA working on semi-conducting polymers. From there
he was employed by Lukens Steel Company in Coatesville where he developed
their Research Chemistry Laboratory, established procedures in atomic
emission, wavelength dispersive X-ray fluorescence and atomic absorption
spectrometry for the analysis of steels, nickel alloys, steel-making
materials and by-products. Next, he became employed by the National Bureau
of Standards (now National Institute of Standards and Technology) where he
was involved in evaluating potential Standard Reference Materials to
determine their suitability for use as calibrants in atomic emission and
X-ray fluorescence spectrometry in the metals industry. Larry recently retired from TIMET in Morgantown, PA, and was involved in the
development of procedures to analyze titanium, iron, cobalt and
nickel-based alloys by X-ray fluorescence spectroscopy, and the
development of reference materials (including homogeneity evaluation and
round robin testing. Larry is very active in ASTM where he serves or has
served as Chairman or Secretary for the Main Committee and various
Subcommittees.
Larry was a contributing author for the book "A Practical Guide for the Preparation of Specimens for X-Ray Fluorescence and X-Ray Diffraction Analysis", Wiley-VCH, 1998 in addition to authoring a number of Standard Method and Guides, and presenting several papers and workshops at the Denver X-ray Conference.
Area of expertise: Metals analysis, with some in fusions of steel-making slags and ores
Al Martin
Rigaku MSC, Inc.
The Woodlands, TX
Al worked for seventeen years for private production lab in Toronto (XRAL) managing XRF, XRD, and INAA. He next spent six years with an Ontario government lab in Sudbury (Ministry of Northern Development and Mines) managing XRF, INAA, ancillary analysis testing of geological materials. Two years were spent with private production lab in Vancouver B.C. managing XRF. For the past six years Al has been with Rigaku as senior applications scientist and marketing and product manager.
Area of expertise: Geological applications using XRF
Mary Ann Zaitz
IBM Microelectronics
Hopewell Junction, New York
Mary Ann Zaitz is a Senior Engineer at IBM‘s East Fishkill facility for semiconductor Research and Development and advanced 300mm semiconductor manufacturing. She is a member of the Technology Analysis Group and is responsible for the XRF and TXRF laboratory and 300mm in line manufacturing metrology. Her characterization responsibilities cover a wide range of XRF and TXRF analysis including XRF thin film method development for in line metrology. Mary Ann introduced XRF thin films analysis into both the semiconductor wafer and packaging manufacturing lines for process control. She has published several papers on the topic. Mary Ann's work with TXRF analysis for ultra trace metal contamination has been instrumental in moving the TXRF from a lab-based instrument to an inline metrology tool. She provides XRF and TXRF technical support to all of IBM's sites including Yorktown Research Center and Albany Nano Technology Center. Mary Ann has several patents and patent disclosures at IBM.
As a team leader for the metals contamination group, Mary Ann is responsible for all in line contamination monitoring including TXRF, VPD-ICPMS and Elymat.
Mary Ann holds a B.S. Degree in Chemistry from SUNY at New Paltz and did graduate work in Materials Science at Columbia University.
Mary Ann was an instructor at the SUNY Albany XRF Clinic is currently an instructor with the XRF Clinic at the International Centre for Diffraction Data. She is a member of ICDD and is a former chairman of the ICDD XRF Subcommittee. Mary Ann is also a member of the Denver X-ray Conference Organizing Committee and has organized workshops and special sessions on many topics related to XRF/TXRF analysis. She is also a member of the Organizing Committee for the International TXRF Conference.
Dr. Thomas Blanton
Eastman Kodak Company
Rochester, New York
Tom Blanton is a Research Associate at Eastman Kodak Company where he has been working in industrial applications of X-ray diffraction for 26 years. He is a member of the Corporate Engineering and Analytical Sciences Organization and is responsible for the operation of the XRD laboratory, utilizing diffractometers for powder, pole figure, nonambient, high-resolution, reflectivity, and two-dimensional XRD. Materials analyzed include inorganics, organics, solid state devices, thin films, corrosion products, ceramics, pharmaceuticals, polymers, and nanoparticulates. Tom is also the Technical Leader in the Specialty Materials Development Laboratory. His area of focus is utilization of XRD for microstructure characterization resulting in new materials development for intellectual property and product development. Tom has 120+ publications including 4 book chapters, 37 U.S. Patents and 36 (3 DE, 3 EU, 5 GB, 17 JP, 8 WO) international patents.
Tom Blanton is a member of the International Centre for Diffraction Data and an ICDD Fellow, Chairman of the ICDD Board of Directors, and a Lecturer at the University of Rochester. He has been an instructor at the SUNY Albany and ICDD XRD Clinics for 26 years.
Cyrus Crowder, Ph.D. ,
Principle Scientist
International Centre for Diffraction Data
Newtown Square, Pennsylvania
Dr. Cyrus Crowder received his BS in Chemistry at the University of Missouri - Rolla in 1976 and followed that with 2 years of teaching high school physical sciences and mathematics in Missouri. He returned to the University of Missouri - Rolla to receive an MS degree in Physical Chemistry in 1980 and a PhD in 1982 using neutron diffraction to do structural studies on magnetic intermetallics and their hydrides.
Dr. Crowder joined the Dow Chemical Company in 1982 and has been active in the field of X-ray diffraction since that time. As a member of Dow’s Analytical Sciences Laboratory, he used various X-ray diffraction techniques to solve both R&D and production-related problems in the fields of polymer science, pharmaceuticals, catalysis, ceramics, electronics, and composite materials. He was co-winner of an IR-100 award in 1987 for his work on the development of the combination DSC/XRD instrument and co-winner of the International Zeolite Association Breck Award in 1989 for his determination of the structure of VPI-5 - a molecular sieve with the largest known pores at the time. Before his retirement from Dow in September 2007, his responsibilities included Global Technology Steward for X-ray diffraction and tomography and representative for Dow on the DND-Cat Board of Directors at the APS synchrotron, Argonne National Laboratory.
He served for four years on the Board of Directors of the ICDD (1994-1998) and was elected ICDD Fellow in 2000. Dr. Crowder joined the ICDD as Principal Scientist in September of 2007 following his 25-year career at Dow.
Areas of expertise: XRD phase identification, phase quantitation by whole pattern methods, crystallography, synchrotron-based powder diffraction, combination thermal/phase analyses (DSC/XRD)
Dr. John Faber, Clinic Technical Advisor
International Centre for Diffraction Data
Newtown Square, Pennsylvania
Dr. Faber, who recently retired, was the ICDD's Principal Scientist responsible for creating
a team of specialists to develop new products based on relational database
(RDB)
technology,
including conversion from existing data structures, security and licensing
and utilization of web-based e-commerce. Dr. Faber's past experience
includes employment at the University of Illinois at Chicago as the
Associate Director of Research; Amoco Corporation as Associate Research
Scientist and Senior Research Scientist; and Argonne National Laboratory
as a Staff Scientist. His education includes Assoc. in Applied Science,
DeVry Technical Institute, Chicago, IL. He received his B.E.E. and Ph.D.
at Marquette University, Milwaukee, WI.
Dr. Timothy Fawcett, Executive Director
International Centre for Diffraction Data
Newtown Square, Pennsylvania
Tim began his career receiving his B.S. in Chemistry at the University of Massachusetts and a Ph.D. degree in Inorganic Chemistry at Rutgers University . At Rutgers he combined x-ray crystallography with various spectroscopy techniques to study amino acids, chromophores of metalloproteins, and cupruretic agents for Wilson's disease. He was hired into the x-ray diffraction laboratory of the Analytical Sciences Department of the Dow Chemical Company in Midland , Michigan . During the next 10 years, he worked in the x-ray diffraction laboratory performing a wide range of analyses of corrosion products, inorganic materials, advanced ceramics, catalysts, pharmaceuticals and polymers. He eventually managed the inorganic analysis laboratories in Analytical Sciences, that included XRD, XRF, NAA, AA, ICP, AES, CHN, IC and electrochemical analyses. He worked with a team of scientists that developed and patented the simultaneous DSC/XRD/MS instrument, which won an IR-100 award in 1987. From 1986 to 1988 he served on the Board of Directors for the ICDD. During the 1990's, Tim managed several new product development groups in advanced materials, electronics, coatings, dispersions, ceramics and automotive components for different business organizations within the Dow Chemical Company. He became an ICDD fellow in 2000 and joined the ICDD as Executive Director in 2001. During his career, Tim has authored 35 publications, been a frequent guest lecturer, and presented several papers and workshops at global X-ray conferences. Several of his publications have been incorporated in the book, Methods & Practices in X-Ray Diffraction, published by the ICDD. As Executive Director he has directed and participated in the dramatic growth of the Powder Diffraction File to ~600,000 entries which is now used by scientists in over 100 countries.
Area of expertise: X-ray diffraction as an analytical technique
Dr. Soorya N. Kabekkodu (Suri)
International Centre for Diffraction Data
Newtown Square, Pennsylvania
Suri is currently the Editor-in-Chief of Powder Diffraction File at the ICDD. Suri is involved in the critical review of X-ray diffraction patterns before they get published in ICDD's Powder Diffraction File (PDF). Suri, with a doctorate in chemical crystallography, is responsible for crystallographic review, classification and evaluation of published crystal structures.
Areas of expertise: Chemical crystallography, structural chemistry, X-ray diffraction
Dr. James Kaduk
INEOS Technologies
Analytical Science Research Services
Naperville, Illinois
James A. (Jim) Kaduk is an Associate Research Scientist at INEOS Technologies
Analytical Science Research Services (formerly Innovene, BP, and Amoco), and runs the XRD Laboratory in Naperville IL. He characterizes a wide variety of materials, including catalysts, organic small molecules, coordination complexes, polymers, corrosion deposits, and various sorts of crud. He is well-known for solving and refining crystal structures from powder diffraction data.
In his spare time, Jim is Chairman of the Board of Directors of the International Centre for Diffraction Data, Chair of the U. S. National Committee for Crystallography, a Co-Editor of Acta Crystallographica B: Structural Science and Advances in X-ray Analysis, a Consultant to the IUCr Commission on Powder Diffraction, and a member of the Denver X-ray Conference Organizing Committee. He is a member of the faculties of the ICDD XRD Clinic on advanced methods in powder diffraction, the ACA summer schools on small-molecule and macromolecular crystallography, and teaches at other short courses and workshops around the world. He is a Visiting Instructor at North Central College in Naperville, and a member of the Northwestern University Library Board of Governors.
His >80 publications deal principally with the solution and refinement of crystal structures using powder data. He has contributed >300 pattern to the Powder Diffraction File.
W. Frank McClune
International Centre for Diffraction Data
Newtown Square, Pennsylvania
Dr. Fangling Needham
International Centre for Diffraction Data
Newtown Square, Pennsylvania
Dr. Needham currently is part of the software/database development team in
the Science Department of the ICDD. She has also developed
software/databases in the chemistry industry for PARC and PI. Dr.
Needham's educational background includes a B.A. in Earth Science,
Southern Connecticut State University, a Ph.D. in Organic Chemistry from
Northeastern University and a post graduate certificate in Apply
Science/Computer Science from Harvard University Extension. Her experience
in research also includes an American Cancer Society Research Fellow on
Breast Cancer Research as a graduate student at Northeastern University, a
post doctorate research fellow on positron emission tomography at
Massachusetts General Hospital, and teaching fellows in chemistry at
Northeastern University, and computer science at Harvard University.
Areas of expertise: Organic chemistry, computer science, and basic
crystallography
Dr. Susan L. Quick
The Pennsylvania State University
University Park, Pennsylvania
Since 1999, Dr. Quick has been an assistant professor of Computer Sciences
and Engineering at The Pennsylvania State University. Her educational background
includes degrees held in ceramic science and engineering and solid state
science. Upon completion of her doctorate, she worked as a research associate
at the Materials Research Laboratory at Penn State, where her research
included calculation of powder diffraction patterns and the use of computer
programs for analysis of powder diffraction data. Dr. Quick has been a
valuable asset to the ICDD X-ray clinic for over 14 years.
Dr. Joel Reid
International Centre for Diffraction Data
Newtown Square, Pennsylvania
Joel is a member of the editorial team in the Publication Department at the ICDD. He received his B.Sc.E. and Ph.D. in Engineering Physics from Queen’s University at Kingston, Ontario, Canada. Joel’s prior work experience includes two and a half years at Millenium Biologix Corporation, also in Kingston, working with powder diffraction data in the field of calcium phosphate based biomaterials.
Dr. Mark Rodriguez
Sandia National Laboratories
Albuquerque, New Mexico
Mark Rodriguez is a Professional Member of Technical Staff in the
Materials Characterization Department at Sandia National Laboratories in
Albuquerque, NM, where he has been for 8 years. He earned his B.S. in
Ceramic Engineering from Alfred University in 1988 and Ph.D. in Ceramics
from Alfred University in 1992. He previously worked as post-doctoral
research associate in the Geology Department at Princeton University
(1992-1994) and as a post-doctoral research associate at Sandia National
Laboratories (1994-1997) prior to his full-time staff appointment. He is
currently responsible for XRD characterization of new materials using
standard powder XRD, single crystal XRD, texture/pole-figure analysis,
reflectivity, and micro-diffraction. He specializes in "in-situ"
diffraction analysis such as high-temperature diffraction and data
collection during applied fields. As a member of the executive committee
for the new HiPPO neutron spectrometer, Mark's focus has been on in-situ
analysis using neutron scattering. He has published 81 technical papers,
authored one book chapter, and has 2 issued patents. He is also a member
of the ICDD.
Areas of expertise: Insitu XRD, reaction kinetics, Rietveld structure
refinement, and texture analysis
Dr. Earle R. Ryba
The Pennsylvania State University
University Park, Pennsylvania
Dr. Ryba celebrates over 40 years on the faculty of the Materials Science
and Engineering Department at The Pennsylvania State University. His dedication
to the ICDD X-ray clinics is evident in over 21 years of instruction dating
back to when the clinics were at SUNYA. At Penn State, his teaching responsibilities
have included powder and single crystal x–ray diffraction, crystallography,
characterization of materials, microcomputer usage, general aspects of
materials, physical metallurgy, electronic and other physical properties
of materials, technical writing. Recently, he has expanded into teaching
courses on geometrical crystallography, the Rietveld method and small angle
scattering.
Research interests: crystal structures, crystal chemistry and properties of intermetallic compounds; X-ray diffraction and X-ray reflectivity studies of a variety of materials; structure and adhesion at various interfaces, particularly polymer/metal; the crystalline character of polymer films; and structures and bonding in hydrogen storage materials
Charles A. Weth
International Centre for Diffraction Data
Newtown Square, Pennsylvania
Charles received his B.S. from Manhattan College, NY and his M.S. from
Villanova University, PA. He currently works as a Senior Software Engineer
in the Science Department at the ICDD. His duties include preparation of
index files for PDF-2 annual releases, preparation of installations for
all software products, preparation of PCPDFWIN and PCSIWIN for the PDF-2,
and assisting in the coding for the PDF-4 relational databases. Charles'
previous software development experience includes development of graphical
and interface elements in commercial applications.
Area of expertise: Development of scientific software