ICDD Clinic and Workshop Faculty
Faculty may change without prior notice to attendees.
XRF FACULTY
John Anzelmo
Anzelmo and Associates, Inc.
Madison, Wisconsin
The owner and President of Anzelmo and Associates, Inc., a firm providing
Marketing Consultation to Educational and High-Tech firms, as well as Analytical
X-ray and Sample Preparation Consultation, John is currently the Technical
Program Director for the ICDD XRF clinics. John brings 32 years of experience
in the fields of X-ray Fluorescence/X-ray Diffraction Analysis as Applications
Scientist, Laboratory Manager, Product Manager and Marketing Manager for
Applied Research Laboratories and Bruker AXS. He's been a faculty member
of the clinics for 17 years, both at the ICDD and SUNYA. John's industry
accomplishments include the development of Universal XRF Calibration for
Iron, Nickel and Cobalt base materials used heavily by Steel and High Alloy
mills in USA. John's publishing accomplishments include the first explicit
procedure for ASTM C-114 Qualification of Cement by XRF, and "… Universal
Method for Preparation of Powder Materials for XRF …" that is
used primarily by industries in mining, minerals, cement, slag and other
oxides. He has also written over forty publications and given hundreds
of presentations worldwide. John currently serves on the Denver X-ray Conference
Organizing Committee. His education includes a B.S. in Chemistry from Loyola
University, IL and graduate studies at the University of Wisconsin-Milwaukee.
Areas of expertise: XRF - applications, calibration, sample preparation,
instrument design; XRD - quantitative analysis and qualitative analysis
Larry Arias
Bruker AXS, Inc.
Madison, Wisconsin
Larry is the Senior XRF Application Scientist for Bruker AXS. He has been working in the field of XRF for over 29 years. He began his career as a Field Service Engineer with Philips Electronic Instruments in 1976 servicing and installing XRF and XRD instruments. Larry left the Service Department and joined the XRF Applications Laboratory at Philips in 1985. Three years later he left Philips to join the Siemens XRF Applications Laboratory. Siemens was later acquired by Bruker and is now known as Bruker AXS. During his time at both Philips and Bruker Larry organized and taught the user training courses and provided on-site training in XRF. Working in a manufactures Applications Laboratory for 20 years provided Larry a broad range of exposure to different analytical challenges in XRF.
Richard Bostwick
Spex SamplePrep LLC
Metuchen, New Jersey
Currently working as a Sales Specialist III with the Sample Preparation Equipment Division of SPEX CertiPrep, Inc., Richard's duties include technical sales, writing and editing, equipment demonstrations, sample preparation methods development, attending trade shows, etc. Richard's education includes the Blair Academy, Blairstown, NJ, Yale University, New Haven CT, B.A. 1965 and graduate work at Harvard Graduate School of Education, Cambridge MA, 1965-1967, and the University of Colorado, Boulder CO, intermittent 1969-73. His honors include the mineral species bostwickite, CaMn6Si3O16.7H2O, named in 1983.
Area of expertise: Sample preparation, particularly for XRF
Larry Creasy
Emeritus,Titanium Metals Corporation
Morgantown, Pennsylvania
With over 35 years of experience in the field, Larry began his chemistry career in the United States Marine Corps assigned to the Jet Propulsion Laboratory in Pasadena, CA working on semi-conducting polymers. From there he was employed by Lukens Steel Company in Coatesville where he developed their Research Chemistry Laboratory, established procedures in atomic emission, wavelength dispersive X-ray fluorescence and atomic absorption spectrometry for the analysis of steels, nickel alloys, steel-making materials and by-products. Next, he became employed by the National Bureau of Standards (now National Institute of Standards and Technology) where he was involved in evaluating potential Standard Reference Materials to determine their suitability for use as calibrants in atomic emission and X-ray fluorescence spectrometry in the metals industry.
Larry recently retired from TIMET in Morgantown, PA, and was involved in the development of procedures to analyze titanium, iron, cobalt and nickel-based alloys by X-ray fluorescence spectroscopy, and the development of reference materials (including homogeneity evaluation and round robin testing. Larry is very active in ASTM where he serves or has served as Chairman or Secretary for the Main Committee and various Subcommittees.
Larry was a contributing author for the book "A Practical Guide for the Preparation of Specimens for X-Ray Fluorescence and X-Ray Diffraction Analysis", Wiley-VCH, 1998 in addition to authoring a number of Standard Method and Guides, and presenting several papers and workshops at the Denver X-ray Conference.
Area of expertise: Metals analysis, with some in fusions of steel-making slags and ores
Mary Ann Zaitz
IBM Microelectronics
Hopewell Junction, New York
Mary Ann Zaitz is a Senior Engineer at IBM‘s East Fishkill facility for semiconductor Research and Development and advanced 300mm semiconductor manufacturing. She is a member of the Technology Analysis Group and is responsible for the XRF and TXRF laboratory and 300mm in line manufacturing metrology. Her characterization responsibilities cover a wide range of XRF and TXRF analysis including XRF thin film method development for in line metrology. Mary Ann introduced XRF thin films analysis into both the semiconductor wafer and packaging manufacturing lines for process control. She has published several papers on the topic. Mary Ann's work with TXRF analysis for ultra trace metal contamination has been instrumental in moving the TXRF from a lab-based instrument to an inline metrology tool. She provides XRF and TXRF technical support to all of IBM's sites including Yorktown Research Center and Albany Nano Technology Center. Mary Ann has several patents and patent disclosures at IBM.
As a team leader for the metals contamination group, Mary Ann is responsible for all in line contamination monitoring including TXRF, VPD-ICPMS and Elymat.
Mary Ann holds a B.S. Degree in Chemistry from SUNY at New Paltz and did graduate work in Materials Science at Columbia University.
Mary Ann was an instructor at the SUNY Albany XRF Clinic is currently an instructor with the XRF Clinic at the International Centre for Diffraction Data. She is a member of ICDD and is a former chairman of the ICDD XRF Subcommittee. Mary Ann is also a member of the Denver X-ray Conference Organizing Committee and has organized workshops and special sessions on many topics related to XRF/TXRF analysis. She is also a member of the Organizing Committee for the International TXRF Conference.
XRD FACULTY
Dr. Thomas Blanton
Eastman Kodak Company
Rochester, New York
Tom Blanton is a Research Associate at Eastman Kodak Company where he has been working in industrial applications of X-ray diffraction for 26 years. He is a member of the Corporate Engineering and Analytical Sciences Organization and is responsible for the operation of the XRD laboratory, utilizing diffractometers for powder, pole figure, nonambient, high-resolution, reflectivity, and two-dimensional XRD. Materials analyzed include inorganics, organics, solid state devices, thin films, corrosion products, ceramics, pharmaceuticals, polymers, and nanoparticulates. Tom is also the Technical Leader in the Specialty Materials Development Laboratory. His area of focus is utilization of XRD for microstructure characterization resulting in new materials development for intellectual property and product development. Tom has 120+ publications including 4 book chapters, 37 U.S. Patents and 36 (3 DE, 3 EU, 5 GB, 17 JP, 8 WO) international patents.
Tom Blanton is a member of the International Centre for Diffraction Data and an ICDD Fellow, Chairman of the ICDD Board of Directors, and a Lecturer at the University of Rochester. He has been an instructor at the SUNY Albany and ICDD XRD Clinics for 26 years.
Cyrus Crowder, Ph.D. ,
Principle Scientist
International Centre for Diffraction Data
Newtown Square, Pennsylvania
Dr. Cyrus Crowder received his BS in Chemistry at the University of Missouri - Rolla in 1976 and followed that with 2 years of teaching high school physical sciences and mathematics in Missouri. He returned to the University of Missouri - Rolla to receive an MS degree in Physical Chemistry in 1980 and a PhD in 1982 using neutron diffraction to do structural studies on magnetic intermetallics and their hydrides.
Dr. Crowder joined the Dow Chemical Company in 1982 and has been active in the field of X-ray diffraction since that time. As a member of Dow’s Analytical Sciences Laboratory, he used various X-ray diffraction techniques to solve both R&D and production-related problems in the fields of polymer science, pharmaceuticals, catalysis, ceramics, electronics, and composite materials. He was co-winner of an IR-100 award in 1987 for his work on the development of the combination DSC/XRD instrument and co-winner of the International Zeolite Association Breck Award in 1989 for his determination of the structure of VPI-5 - a molecular sieve with the largest known pores at the time. Before his retirement from Dow in September 2007, his responsibilities included Global Technology Steward for X-ray diffraction and tomography and representative for Dow on the DND-Cat Board of Directors at the APS synchrotron, Argonne National Laboratory.
He served for four years on the Board of Directors of the ICDD (1994-1998) and was elected ICDD Fellow in 2000. Dr. Crowder joined the ICDD as Principal Scientist in September of 2007 following his 25-year career at Dow.
Areas of expertise: XRD phase identification, phase quantitation by whole pattern methods, crystallography, synchrotron-based powder diffraction, combination thermal/phase analyses (DSC/XRD)
Dr. John Faber, Clinic Technical Advisor
Emeritus, International Centre for Diffraction Data
Newtown Square, Pennsylvania
Dr. Faber, who recently retired, was the ICDD's Principal Scientist responsible for creating
a team of specialists to develop new products based on relational database
(RDB)
technology,
including conversion from existing data structures, security and licensing
and utilization of web-based e-commerce. Dr. Faber's past experience
includes employment at the University of Illinois at Chicago as the
Associate Director of Research; Amoco Corporation as Associate Research
Scientist and Senior Research Scientist; and Argonne National Laboratory
as a Staff Scientist. His education includes Assoc. in Applied Science,
DeVry Technical Institute, Chicago, IL. He received his B.E.E. and Ph.D.
at Marquette University, Milwaukee, WI.
Dr. Timothy Fawcett, Executive Director
International Centre for Diffraction Data
Newtown Square, Pennsylvania
Tim began his career receiving his B.S. in Chemistry at the University of Massachusetts and a Ph.D. degree in Inorganic Chemistry at Rutgers University. At Rutgers he combined x-ray crystallography with various spectroscopy techniques to study amino acids, chromophores of metalloproteins, and cupruretic agents for Wilson's disease. He was hired into the x-ray diffraction laboratory of the Analytical Sciences Department of the Dow Chemical Company in Midland , Michigan.
During the next 10 years, he worked in the x-ray diffraction laboratory performing a wide range of analyses of corrosion products, inorganic materials, advanced ceramics, catalysts, pharmaceuticals and polymers. He eventually managed the inorganic analysis laboratories in Analytical Sciences, that included XRD, XRF, NAA, AA, ICP, AES, CHN, IC and electrochemical analyses. He worked with a team of scientists that developed and patented the simultaneous DSC/XRD/MS instrument, which won an IR-100 award in 1987. From 1986 to 1988 he served on the Board of Directors for the ICDD. During the 1990's, Tim managed several new product development groups in advanced materials, electronics, coatings, dispersions, ceramics and automotive components for different business organizations within the Dow Chemical Company. He became an ICDD fellow in 2000 and joined the ICDD as Executive Director in 2001.
uring his career, Tim has authored 35 publications, been a frequent guest lecturer, and presented several papers and workshops at global X-ray conferences. Several of his publications have been incorporated in the book, Methods & Practices in X-Ray Diffraction, published by the ICDD. As Executive Director he has directed and participated in the dramatic growth of the Powder Diffraction File to ~600,000 entries which is now used by scientists in over 100 countries.
Area of expertise: X-ray diffraction as an analytical technique
Catherine Foris
ForChem Consultant
Wilmington, Delaware
Catharine retired from the DuPont Company with more than thirty years experience in powder X-ray diffraction. She managed the Central Research and Development X-ray diffraction facilities at DuPont. The DuPont X-ray laboratory handled a wide range of samples including catalysts, coating materials, pigments, pharmaceuticals, metals, and electronic materials, and also provided support for manufacturing plant and customer problems.
Catharine has experience with diffractometer, synchrotron, single crystal, Guinier, and Debye-Scherrer techniques. She has numerous publications in the X-ray field. She has been an instructor and/or organizer of various workshops on X-ray techniques. She is a fellow of the International Centre for Diffraction Data and has served as an officer and a member of the Board of Directors. Previous professional experience includes membership in the U.S. National Committee for Crystallography (National Academy of Sciences), elected officer of the American Crystallography Association, and Committees of the American Institute of Physics and the American Society for Testing and Materials. She is also a member of the American Chemical Society and Sigma Xi.
Dr. Soorya N. Kabekkodu (Suri)
International Centre for Diffraction Data
Newtown Square, Pennsylvania
Suri received his MS in Chemistry from the Mangalore University in India in 1992. Suri’s thesis, "Structural Phase Transition in Inorganic Systems: Insights from X-ray Diffraction Studies", earned him his PhD in chemical crystallography from the Indian Institute of Science, a premier research institute in India, in 1999.
Suri joined the ICDD in June of 1999 as a Post Doctoral Research Fellow and accepted the position of Editor of Calculated Patterns in 2000. In 2003, he chaired the task group to develop a method to assign quality marks to calculated patterns. He developed and implemented the algorithm to evaluate the quality of calculated patterns based on the task group outcome. Suri has calculated and critically-reviewed (using his data evaluation suite) more than 700,000 diffraction patterns.
Suri is currently the Editor-in-Chief of the Powder Diffraction File (PDF) where he remains heavily involved in the significant crystallographic review of crystal structures and X-ray diffraction patterns prior to their publication. Over the years, he has developed various algorithms to evaluate and classify crystal structures, optimizing the editorial process. Automating the subfile assignment has enhanced the search/match capability using the Powder Diffraction File. Suri has spearheaded several projects leading to many of the enhancements to the PDF, including the addition of atomic coordinates, quality mark assignment, extensive cross-referencing, structure prototyping and classification. The quality improvements to the PDF have a direct impact on phase identification processes.
Areas of expertise: Chemical crystallography, structural chemistry, computational crystallography, X-ray diffraction
Dr. James Kaduk
Poly Crystallography Inc.
Naperville, Illinois
Recently retiring from INEOS Technologies, Analytical Science Research Division, Naperville, Illinois, Jim began his consulting firm, Poly Crystallography Inc.
While at INEOS, Jim served as an Associate Research Scientist running the XRD Laboratory. There, he characterized a wide variety of materials, including catalysts, organic small molecules, coordination complexes, polymers, corrosion deposits, and various sorts of crud. He is well-known for solving and refining crystal structures from powder diffraction data.
Jim currently serves as Past Chairman of the Board of Directors of the International Centre for Diffraction Data, Chair of the U. S. National Committee for Crystallography, a Co-Editor of Acta Crystallographica B: Structural Science and Advances in X-ray Analysis, a Consultant to the IUCr Commission on Powder Diffraction, and a member of the Denver X-ray Conference Organizing Committee. He is a member of the faculties of the ICDD XRD Clinic on advanced methods in powder diffraction, the ACA summer schools on small-molecule and macromolecular crystallography, and teaches at other short courses and workshops around the world. He is a Visiting Instructor at North Central College in Naperville, and a member of the Northwestern University Library Board of Governors.
His more than 80 publications deal principally with the solution and refinement of crystal structures using powder data. He has contributed more than 300 patterns to the Powder Diffraction File®.
W. Frank McClune
Emeritus, International Centre for Diffraction Data
Newtown Square, Pennsylvania
After dedicating 37 years of continuous service to the International Centre for Diffraction Data (ICDD), Frank McClune retired from his distinguished role as the Editor-in-Chief of the Powder Diffraction File (PDF).
During his tenure, Frank nurtured the transition of the PDF from cards and books into the PDF-4 family of relational database products available on CD-ROM and DVD. The PDF has grown tremendously in size and technical capability due to Frank’s coordination with editorial task teams, cooperating database organizations, and the development of an extensive and rigorous editorial process.
Frank has spent the majority of his career at the International Centre for Diffraction Data. To acknowledge his long and meritorious service, he was named an ICDD Fellow in 2000 and a Distinguished Fellow in 2003. Prior to joining the ICDD, Frank was employed at ARCO Chemical Company (formerly Atlantic Richfield Co.) as an analytical chemist.
Although retired, Frank continues to support ICDD’s editorial efforts in his latest role as Editor Emeritus.
Dr. Fangling Needham
International Centre for Diffraction Data
Newtown Square, Pennsylvania
Dr. Needham currently is part of the software/database development team in the Science Department of the ICDD. She has also developed software/databases in the chemistry industry for Princeton Applied Research and Princeton Instruments.
Dr. Needham's educational background includes a B.A. in Earth Science, Southern Connecticut State University, a Ph.D. in Organic Chemistry from Northeastern University and a post graduate certificate in Applied Science/Computer Science from Harvard University Extension.
Her experience in research also includes an American Cancer Society Research Fellow on Breast Cancer Research as a graduate student at Northeastern University, a post doctorate research fellow on positron emission tomography at Massachusetts General Hospital, Teaching Fellow in Chemistry at Northeastern University, and Teaching Fellow in Computer Science at Harvard University. Here at ICDD, she has also done research on pharmaceutical solids, using different instrument geometries and sample preparation methods to optimize powder diffraction data quality for both active pharmaceutical ingredients and excipients.
Dr. Susan L. Quick
The Pennsylvania State University
University Park, Pennsylvania
Since 1999, Dr. Quick has been an assistant professor of Computer Sciences and Engineering at The Pennsylvania State University. Her educational background includes degrees held in ceramic science and engineering and solid state science. Upon completion of her doctorate, she worked as a research associate at the Materials Research Laboratory at Penn State, where her research included calculation of powder diffraction patterns and the use of computer programs for analysis of powder diffraction data. Dr. Quick has been a valuable asset to the ICDD X-ray clinic for over 14 years.
Dr. Mark Rodriguez
Sandia National Laboratories
Albuquerque, New Mexico
Mark Rodriguez is a Professional Member of Technical Staff in the Materials Characterization Department at Sandia National Laboratories in Albuquerque, NM, where he has been for 16 years. He earned his B.S. in Ceramic Engineering from Alfred University in 1988 and Ph.D. in Ceramics from Alfred University in 1992. He previously worked as post-doctoral research associate in the Geology Department at Princeton University (1992-1994) and as a post-doctoral research associate at Sandia National Laboratories (1994-1997) prior to his full-time staff appointment. He is currently responsible for XRD characterization of new materials using standard powder XRD, single-crystal XRD, texture/pole-figure analysis, reflectivity, micro-diffraction/fluorescence, and the use of multivariate analysis in data reduction. Mark specializes in “in-situ” diffraction analysis such as high-temperature diffraction and data collection during applied fields. He has published over 100 technical papers, authored one book chapter, and has 2 issued patents.
Mark was named a Fellow of the ICDD in 2009, and is currently serving on the ICDD Board of Directors as a Director-at-Large. He has served as an instructor for the XRD-I Clinic for over a decade.
Dr. Earle R. Ryba
The Pennsylvania State University
University Park, Pennsylvania
Dr. Ryba celebrates 50 years on the faculty of the Materials Science and Engineering Department at The Pennsylvania State University. His dedication to the ICDD X-ray clinics is evident in over 27 years of instruction dating back to when the clinics were held at SUNYA. At Penn State, his teaching responsibilities have included powder and single crystal x–ray diffraction, crystallography, characterization of materials, microcomputer usage, general aspects of materials, physical metallurgy, electronic and other physical properties of materials, and technical writing. Recently, he has expanded into teaching courses on advanced geometrical crystallography, the Rietveld method, advanced powder diffraction, and small angle scattering.
He has also taught courses in crystallography and X-ray diffraction at two major universities in China.
Research interests: crystal structures, and crystal chemistry of intermetallic compounds and quasicrystals; X-ray diffraction studies of a variety of materials; structures and bonding in hydrogen storage materials; and new directions in crystallography.
Charles A. Weth
International Centre for Diffraction Data
Newtown Square, Pennsylvania
Charles received his B.S. from Manhattan College, NY and his M.S. from Villanova University, PA. He currently works as a Senior Software Engineer in the Science Department at the ICDD. His duties include preparation of index files for PDF-2 annual releases, preparation of installations for all software products, preparation of PCPDFWIN and PCSIWIN for the PDF-2, and assisting in the coding for the PDF-4 relational databases. Charles' previous software development experience includes development of graphical and interface elements in commercial applications.
Area of expertise: Development of scientific software
RIETVELD WORKSHOP FACULTY
Dr. Stacy Gates
International Centre for Diffraction Data
Newtown Square, PA
Stacy Gates is the newest Senior Scientific Editor at the International Centre for Diffraction Data (ICDD). Prior to joining ICDD, she completed a Postdoctoral position in the School of Natural Science and Mathematics Instrumentation Center at the University of Toledo, OH. Stacy obtained her BS in Chemistry at the University of Michigan, and her Ph.D. in Chemistry (focused on inorganic chemistry and crystallography) in 2008 at the University of Toledo. Her studies included the preparation and characterization of negative thermal expansion materials, and the investigation of transparent conducting oxides for use in photovoltaic devices. Stacy’s dissertation research on cationic influences of negative thermal expansion in A2M3O12 materials resulted in several publications, awards for Outstanding Graduate Research Paper (Univ. of Toledo-2007), poster prizes from the International Union of Crystallography, and Pittsburgh Diffraction Society, as well as the opportunity to present as an invited speaker at an international meeting, and give various presentations at national conferences.
In addition to her professional role in science, Dr. Gates enjoys teaching and being active in her community. She has been active in science-based, community outreach since 2004 and has most recently established an outreach program: S.C.O.P.E. (Scientists Changing Our Pre-college Education). In this program, scanning electron microscopy is used remotely at grade schools and high schools to teach students about advanced analytical instrumentation. She hopes to soon expand this program to include X-ray crystallography as well.
Amy Gindhart
International Centre for Diffraction Data
Newtown Square, Pennsylvania
Ms. Gindhart is a Senior Scientific Editor in the Publication Department at the International Centre for Diffraction Data. Some of her current responsibilities include production of the PDF-4/Organics Product as well as an Instructor at the Rietveld Refinement and Indexing Workshop at the ICDD.
Her Master’s Thesis was on the negative thermal expansion of AA’W3O12 (A,A’=Mg2+,Zr4+;Mg2+;Hf4+) compounds with respect to temperature and pressure phase transitions. She carried out the experiments between the University of Toledo, Cornell High Energy Synchrotron Source, and the National Institute of Standards and Technology’s Center for Neutron Research. She also did previous research on the analyzation of conformative effects of E. Coli GMP Synthetase using MALDI-TOF Mass Spectroscopy for her undergraduate research project.
She received her Bachelor’s of Science degree in Chemistry from Lebanon Valley College, Annville, PA and went on to receive her Master’s Degree in Chemistry/X-ray Crystallography from The University of Toledo, Toledo, OH. She received several accolades during her graduate career including the Pauling Poster Prize and the Margaret C. Etter Student Lecturer Award both from the American Crystallographic Association among other presentation awards.