HANDHELD XRF WORKSHOP
Date to be Determined
Register Online or fax the registration form to +610-325-9823!
The combination of portability, non-destructive on-site analysis, and relatively low cost has led to explosive growth in the use of handheld X-ray fluorescence spectrometers. Offering a wide array of capabilities, units are now being manufactured by dozens of different companies. Each unit combines state-of-the-art technology in miniaturized X-ray sources, advanced focusing optics and integrated Pocket PC technology for digital signal processing, telecommunications, and solid state reliability. Accessories such as GPS, wireless transmission, and integrated data analyses are being added to this platform, rapidly expanding the technology and its applications.
Portable, or handheld, XRF provides instant feedback for dynamic field use. This feature has been applied to metal sorting; RoHS WEEE; lead in paint; forensics, cultural heritage, environmental analysis; and mineral, mining and soil exploration. The workshop will focus on the basic physics, equipment, and optimized methods of analysis of handheld XRF spectrometers. While most applications are targeted for qualitative results, the workshop will show how to get the best results in any situation by having a basic understanding of the theory and practical limitations of these devices. The workshop will use live instrumentation and hands-on laboratory analyses.
This 3-day workshop is designed for current users who are seeking best methods and optimized results. It is also designed to provide basic theory and applications for those interested in understanding the best instrumentation and accessories for a particular application.
- X-ray physics, excitation & properties of X-ray spectra
- Precision and accuracy, counting statistics, limit of detection
- Surface effects, penetration depth, sampling effects, mineralogical effects
- What you need to know about your instrument: energy dispersive spectrometry; overview of components; selection of parameters for operation
- Radiation safety
- Compton scatter, FP methods, calibrations
- Comparison to certified values and ICP results
- General metals analysis - including precious metals and light elements in heavy matrices
- Consumer/RoHS products analysis - including surface /coatings considerations
- Geochem/mining analysis - including light elements in complex matrices
- Field Environmental - heavy metals in light matrices – soil, liquids and dust wipes
- Cultural Heritage - including paints, coatings, and surface considerations for unique objects
- Specimen considerations and influence on results
- Data Acquisition
- Specimen surface
- Irradiation depth
- Tricks of the trade
- Analysis of Results
John Anzelmo – Anzelmo & Associates, Inc., Madison, WI
Matthew Kreiner - Oxford Instruments, Concord, MA
John Patterson – Bruker Elemental, Kennewick, WA
Kim Russell – Olympus Innov-X, Woburn, MA
Mary Ann Zaitz – IBM Microelectronics, Hopewell Junction, NY
Fee and Registration
Registration fees include classroom and lab materials, and catered lunches. Registrations must be received no later than four weeks prior to the start of the workshop; payment must be received prior to the workshop to attend.
Price: - $899 USD.
ICDD must guarantee payment for meals and materials in advance. You will receive a 50% refund of the paid registration fee if your written cancellation is received at ICDD twenty business days prior to the start of class.
12 Campus Boulevard
Newtown Square, Pennsylvania, 19073-3273 U.S.A.
For More Information
Contact Eileen Jennings, Education Coordinator, Tel: +610-325-9814, Fax: +610-325-9823, E-mail: email@example.com.