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> EDUCATION > CLINICS > Testimonial from the 2003 Ron Jenkins Tuition Waiver Recipient

From:
Georges Ekosse,
University of Botswana,
Botswana, Republic of South Africa

To: 
Leah Mooney

Between 2-6 June and 9-13 June 2003, I was privileged to receive the prestigious Ron Jenkins tuition award to attend two short courses: Fundamentals of X-ray Powder Diffraction and Advanced Methods in X-Ray Powder Diffraction offered by the International Center for Diffraction Data (ICDD). The two courses were very insightful and stimulating. I was given one to one attention on aspects of diffractometer geometry, quantitative analyses, and instrument setting and counting statistics, which I had not clearly understood. Furthermore there was active participation and classroom interaction among course participants. The teaching materials including the CD are currently used as reference material in the XRD Unit. It was such a wonderful re-orientation and learning curve for me!

On getting back to Botswana, there was rekindling of XRD research in the University. My colleagues have brought in quite a wide variety of samples for analyses. The load work is incredible and without doubt the University is reaping the benefits of the course. My Supervisor (Dean of Science) is so impressed with the increased performance demonstrated through extensive research and publications.

It should be noted that the X-ray diffraction unit (XRDU) at the University of Botswana is a Faculty of Science shared facility in which the main users are the Departments of Biological Sciences, Chemistry, Environmental Science, Geology and Physics. The Department of History, and the Departments of Civil and Mechanical Engineering of the Faculty of Engineering Technology, and Government Forensic Department also benefit from the Facility. Other users outside the University and Botswana (other African countries including Cameroon, Nigeria, Tanzania, Kenya and South Africa) now frequently bring in samples for analyses. A short course in "introduction to X-ray diffraction techniques" is being designed. As the Senior Scientist responsible for X-Ray Diffraction, I plan to expand the unit by acquiring a field X-Ray Diffraction System such as the one we used during the short course, a single crystal X-ray Diffractometer, and an X-Ray Florescence Spectrometer. It is anticipated that when the next short course in XRF is being offered, I will be given an opportunity to learn more.

Finally my deep gratitude to all the wonderful staff of ICDD under the leadership of Tim Fawcett.

 

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