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Workshop Brochure (PDF)
Registration Form to Fax (PDF)

21-23 October 2008
Sponsored by the International Centre for Diffraction Data
Newtown Square, Pennsylvania, U.S.A.

Instructors
Dr. Cyrus Crowder, International Centre for Diffraction Data, Newtown Square, PA
Dr. John Faber, International Centre for Diffraction Data, Newtown Square, PA
Dr. Soorya Kabekkodu, International Centre for Diffraction Data, Newtown Square, PA
Dr. James Kaduk, INEOS Technologies, Naperville, IL
Dr. Fangling Needham, International Centre for Diffraction Data, Newtown Square, PA
Dr. Joel Reid, International Centre for Diffraction Data, Newtown Square, PA

Workshop Outline
Powder pattern Indexing and Rietveld structural refinement techniques are complementary and are often used to completely describe the structure of a material. Successful indexing of a powder pattern is considered strong evidence for phase purity. Indexing (with derived space group and lattice symmetry determinations) is considered a prelude to determining the crystal structure, and permits phase identification by lattice matching techniques. The Rietveld method is used to refine crystal structures and is perhaps best considered whole- pattern-fitting structure refinement, i.e., we must account not only for the crystal structure but also the instrumental resolution and diffraction physics effects (e.g., crystallite size and strain). The aim is to perform quantitative phase analysis and identification.

This workshop introduces the theory and formalisms of various indexing methods and structural refinement techniques. One unique aspect of this workshop is the extensive use of computer laboratory problem solving and exercises that teach method development in a hands-on environment.

We will use EXPGUI and GSAS for the Rietveld laboratory work; Crysfire (especially Dicvol, Ito and Treor) will be used for indexing exercises.

Lecture Components
Basic Crystallography

• Emphasis on space groups, conventions, etc.

Powder Pattern Indexing

• Data reduction methods for peak finding
• We will use Dicvol 04, Treor and Ito indexing examples
• Crysfire will also be discussed

Rietveld Structural Refinement

• History and motivation for development of this technique
• Qualitative description of various sample and instrument-related functions for profile shape, background, etc.
• The use of least-squares constraints will be explored

LeBail and Pawley Fitting Procedures

• What to do when atomic coordinates are not available
• Discussion on use of these tools for structure determination
• Use in powder pattern indexing
  

Computer Laboratory Components
Exercise problems will include:

• Single phase indexing
• Single phase refinement (all crystalline materials)
• Multiphase refinement (all crystalline materials)
• Nanophase, and small crystallite size content
• Amorphous phase + crystalline phase(s)

Fees & Registration
Registration fees for training courses include classroom and lab materials and catered lunches. Registrations must be received no later than six weeks prior to the start of the course. Payment must be received prior to the course to attend.
Register online here or
fax the registration form to +610-325-9823!

Rietveld Refinement & Indexing - $899 USD

Cancellation Policy
A 50% refund of the paid registration fee will be given if your written cancellation is received at the ICDD 20 business days prior to the start of the class. With less notice, a colleague may take your place, or the course materials will be mailed to you.

Location
ICDD Headquarters
12 Campus Boulevard
Newtown Square, Pennsylvania, 19073-3273 U.S.A.
Phone: +610.325.9814

Tuition Waivers*
ICDD offers a limited number of tuition waivers for the XRF, XRDI, XRDII clinics, and the Rietveld workshop. The tuition waivers were established to promote the education of the scientific community, particularly the academic sector, in X-ray materials analysis. Faculty members and graduate students are encouraged to apply. If you are currently developing a program in X-ray fluorescence spectrometry (XRF), X-ray powder diffraction (XRD ) or Rietveld Analysis, or are interested in incorporating these topics into an established course, a tuition waiver can provide you with the opportunity to learn the principles and practices of these disciplines from some of the experts in the field. Please note that the tuition waivers cover the tuition only; travel and lodging are the responsibility of the attendee. To apply for a tuition waiver, please submit a one-page written request stating your objectives in attending the course, and/or how you will incorporate these disciplines into your curriculum to the address listed on the Registration Form. Tuition waiver applications must be accompanied by a registration form and received at ICDD by the deadline for registration. All applications will be reviewed on a competitive basis, and recipients will be notified no later than four weeks prior to the start of the session.

* Not applicable to Specimen Prep for XRF workshop.

For More Information 
Contact Leah Mooney, Education Coordinator, Tel: +610-325-9814, Fax: +610-325-9823, E-mail: clinics@icdd.com.