The International Centre for Diffraction Data



         PDF-4+ Users Meetings for 2009

      Sunday, 26 July 2009
    Denver X-ray Conference
    Crowne Plaza Hotel
    Colorado Springs, Colorado
    10:00 a.m.-4:00 p.m.
    Please register online by 17 July

    USERS MEETING FLYER                    

    24-25 September 2009
    XXI Conference on Applied Crystallography
    Kasprowy Hotel
    Zakopane, Poland

    Workshop registration is via the XXI Conference on Applied Crystallography website.



            PDF-4+ Users Meeting Registration Form

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USER INFORMATION

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PLEASE CHOOSE UP THREE TOPICS. WE WILL FOCUS OUR TIME ON THE MOST REQUESTED TOPICS

Getting Started Tutorial
This tutorial will discuss and demonstrate the basic functions of DDView+, thus enabling
the user to distill the huge number of entries in PDF-4+ to a manageable selected subset.
  Selecting search criteria for up to 53 unique search fields
  Viewing/analyzing search results
  Using History and standard formats to optimize your searches
  Using digital patterns for data simulations and analysis

Advanced Features Tutorial
Learn shortcuts that speed the selection and filtering of entries for comparison
with experimental laboratory data and methods to create full-pattern comparisons
between reference data from the PDF-4+ and experimental data.
  Advanced data mining-tools to extract the data you need
  Performing neutron, electron, EBSD, spot pattern simulations
  Using Sieve+--choosing the appropriate search criteria and strategies for identification and problem analysis
  Interfaces-Using PDF-4+ information as input for advanced analyses (whole-pattern fitting, structure analysis, molecular visualization, cluster analysis)

Problem Solving Examples
  Published solutions to difficult problems, using PDF-4+

WHICH ICDD PRODUCTS ARE YOU CURRENTLY USING?

  PDF-2 Release Year PDF-4+ Release Year
  DDView Release Year PDF-4/Oganics Release Year
  ICDD SUITE Release Year SIeve+ Release Year

INTERESTS:PLEASE CHECK ALL THAT APPLY

  XRD Electron Diffraction
  XRF Metals
  Alloys Minerals
  Corrosion Pharmaceutical
  Semiconductors Synchrotron
  Others (please specify)


 

 

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