PDF-4+ User's Meeting for 2011





 

July User's Meeting


Sunday, 31 July 2011
Denver X-ray Conference 2011
Centennial Room, Crowne Plaza Hotel
Colorado Springs, Colorado
10:00 a.m.-4:00 p.m.
User's Meeting registration is via our registration page below.
Please register online by 22 July.



PDF-4+ User's Meeting Registration Form



*Indicates required field


USER INFORMATION

Title(Dr. Mr. Mrs. Ms.):
First Name: *
Mid.:
Last Name: *
Preferred Badge Name:
Company/Organization: *
Address: *
City: *
State/Province: *
Zip/Postal Code: *
Country/Region: *
Business Phone: *
Fax:
Email: *
Home Phone(in case of emergency):
Business Web Address:


PLEASE CHOOSE UP THREE TOPICS. WE WILL FOCUS OUR TIME ON THE MOST REQUESTED TOPICS

Getting Started Tutorial
This tutorial will discuss and demonstrate the basic functions of PDF-4+ data mining,
thus enabling the user to distill the huge number of entries in PDF-4+ to a manageable
selected subset.
  Selecting search criteria for up to 55 unique search fields
  Viewing/analyzing search results
  Using History and standard formats to optimize your searches
  Using digital patterns for data simulations and analysis

Advanced Features Tutorial
This tutorial focuses on the power of PDF-4+ data mining and SIeve+ for phase
identification,simulation of X-ray, neutron, and electron diffraction patterns,
and retrieval/use of PDF-4+ database information for advanced analyses.
  Advanced data mining-tools to extract the data you need
  Performing neutron, electron, EBSD, spot pattern simulations
  Using Sieve+--choosing the appropriate search criteria and strategies for identification and problem analysis
  Interfaces-Using PDF-4+ information as input for advanced analyses (whole-pattern fitting, structure analysis, molecular visualization, cluster analysis)

Problem Solving Examples
  Published solutions to difficult problems, using PDF-4+

WHICH ICDD PRODUCTS ARE YOU CURRENTLY USING?

  PDF-2 Release Year PDF-4+ Release Year
  DDView Release Year PDF-4/Oganics Release Year
  ICDD SUITE Release Year SIeve+ Release Year

INTERESTS:PLEASE CHECK ALL THAT APPLY

  XRD Electron Diffraction
  XRF Metals
  Alloys Minerals
  Corrosion Pharmaceutical
  Semiconductors Synchrotron
  Others (please specify)