ICDD X-ray Diffraction Clinics
Session I - Fundamentals of X-ray
Powder Diffraction - 2-6 June 2008
Session II - Advanced Methods in X-ray Powder Diffraction
- 9-13 June 2008
History of the Clinic
The ICDD X-ray Clinics are a continuation of the SUNY Clinics which were held at the State
University of New York at Albany for 25 years. In 1990, the International Centre for
Diffraction Data (ICDD) assumed responsibilities for these clinics. ICDD
is a nonprofit,
scientific organization which publishes the Powder Diffraction File™ and
the journal, Powder Diffraction. ICDD is committed to promoting the applications of
materials characterization methods in science and technology by providing educational
programs such as the ICDD Clinics.
Purpose
During the past five decades, the use of X-ray analytical methods has
increased in the
areas of materials characterization and phase identification. The wide range of
applicability of the X-ray powder diffraction method has made it a technique employed in
thousands of laboratories all over the world. Over the years, many techniques and
procedures have been developed that greatly enhance the versatility of the method. The
purpose of the X-ray clinic is to combine theoretical and practical application of powder
diffractometry.
Scope
The clinic is presented in two separate week-long sessions, each of which stands
alone as a complete course. Session I, Fundamentals of X-ray Powder Diffraction,
is directed to
both relative newcomers in the field and to more experienced users wishing
to broaden their understanding of fundamental concepts and established procedures.
The major emphases
of Fundamentals of X-ray Powder Diffraction are the acquisition of reliable
experimental data and qualitative phase identification using manual search
techniques. Session II,
Advanced Methods in X-ray Powder Diffraction, is designed for the experienced
user and focuses on computer-based methods of qualitative and quantitative
phase analysis. In order
to derive the maximum benefit from the Advanced Methods in X-ray Powder Diffraction,
the ICDD Clinic staff strongly recommends that students have previously attended
Session I.
If you have questions regarding the level of experience required for Session II, please contact:
John Faber
ICDD Headquarters
Phone: (610) 325-9814
FAX: (610) 325-9823
E-mail: faber@icdd.com
Many students of the clinic have found it advantageous to attend the two sessions in successive years.
Format
The format of the clinic is a combination of morning lectures and afternoon recitations
and workshops. Ample opportunity for individual student-faculty interaction exists
throughout each week, including small recitation and workshop groups and a session where
students can discuss their applications and problems with the entire faculty.
Course Outline
Session I - Fundamentals
of X-ray Powder Diffraction - 2-6 June 2008
- Production and properties of X-rays: continuous and characteristic radiation, absorption, scatter and diffraction
- Production of monochromatic X-radiation: choice of source conditions, use of beta-filters, proportional detectors and pulse height selection, diffracted-beam monochromators, use of the Si(Li) and Ge(Li) detectors
- Constituents of the diffraction pattern: expected reflections, Miller indices, unexpected reflections, effect of scatter and fluorescence
- Acquisition of good diffraction data: specimen preparation techniques and measurement of powder patterns using diffractometer methods
- The powder diffractometer: optical arrangement, factors affecting instrumental profile width, choice and function of divergence slit, calibration and alignment, detectors, X-ray Optics
- Qualitative phase identification: the Powder Diffraction File™, quality of reference patterns, the Alphabetical Index, the Hanawalt Index, the Fink Index, and specialized subfiles
- Hands-on use of personal computers for demonstration of the latest software
- Data Mining with the PDF
Session II - Advanced Methods in X-ray Powder Diffraction - 9-13 June 2008
- Brief review of fundamentals
- Factors affecting d-spacings of crystals: unit cell, crystal structure, and solid solutions
- Factors affecting accuracy of measured 2theta values: intensity aberrations, specimen displacement, specimen transparency, diffractometer misalignment, and the use of external and internal standards
- Factors affecting diffraction-line intensities: relative and absolute intensities; structure-sensitive properties - atomic scattering and structure factors, polarization effects, and multiplicity; specimen-sensitive effects - orientation, particle size, and particle distribution; measurement-sensitive effects - use of peak heights and peak areas, and choice of scanning conditions
- Use of the Powder Diffraction File (PDF) for qualitative phase analysis - alphabetical searching, Boolean search methods, use of data other than d/I values
- Use of computer methods for qualitative phase identification: peak-hunting methods, advantages and disadvantages of alpha2 stripping, search/match techniques, use of elemental data, types of data searched, error windows and probability searching, and scoring algorithms
- Quantitative analysis: problems associated with specimen preparation, use of Reference Intensity Ratios, binary mixtures, absorption correction methods, and matrix-flushing methods
- Exploration of Powder Indexing Methods
- Data mining with the PDF
- Rietveld method for quantitative analysis
Clinic Faculty
The clinic faculty is selected from academic, industrial and government
institutions under the direction of ICDD Management.
Read Faculty
Bios.
Schedule
Sessions are held Monday from 8:30 a.m. to 4:30 p.m.,
Tuesday through Thursday from 9:00 a.m. to 4:30 p.m., and
Friday from 9:00 a.m. to 12:00 p.m.
Fees & Registration
Registration fees for training courses include classroom and lab materials and catered lunches. Registrations must be received no later than six weeks prior to the start of the course. Payment must be received prior to the course to attend.
Register online here or
fax the registration form to +610-325-9823!
Fundamentals of X-ray Powder Diffraction - $1,830 USD
Advanced Methods in X-ray Powder Diffraction - $1,830 USD
Fundamentals of XRD and Advanced Methods in XRD two-week course - $3,300 USD
Cancellation Policy
ICDD must guarantee payment for meals and materials in
advance.You will receive a 50% refund of the paid registration fee
if your written cancellation is received at ICDD twenty business
days prior to the start of class.With less notice, a colleague may
take your place, or the course materials will be mailed to you.
Location
ICDD Headquarters
12 Campus Boulevard
Newtown Square, Pennsylvania, 19073-3273 U.S.A.
Phone: +610.325.9814
Tuition Waivers*
ICDD offers a limited number of tuition waivers for the XRF, XRDI,
XRDII clinics, and the Rietveld workshop. The tuition waivers were
established to promote the education of the scientific community,
particularly the academic sector, in X-ray materials analysis. Faculty
members and graduate students are encouraged to apply. If you
are currently developing a program in X-ray fluorescence spectrometry
(XRF), X-ray powder diffraction (XRD ) or Rietveld Analysis,
or are interested in incorporating these topics into an established
course, a tuition waiver can provide you with the opportunity to
learn the principles and practices of these disciplines from some of
the experts in the field. Please note that the tuition waivers cover
the tuition only; travel and lodging are the responsibility of the
attendee. To apply for a tuition waiver, please submit a one-page
written request stating your objectives in attending the course,
and/or how you will incorporate these disciplines into your
curriculum to the address listed on the Registration Form. Tuition
waiver applications must be accompanied by a registration form
and received at ICDD by the deadline for registration. All applications
will be reviewed on a competitive basis, and recipients will
be notified no later than four weeks prior to the start of the session.
* Not applicable to Specimen Prep for XRF workshop.
For More Information
Contact Leah Mooney, Education Coordinator, Tel: +610-325-9814, Fax:
+610-325-9823, E-mail: clinics@icdd.com.