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(610) 325-9814
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Barrett Awards

Honoring Charles S. Barrett (1902 – 1994)

Charles Barrett was a pioneering X-ray metallurgist who was instrumental in advancing the use of X-ray diffractometry to characterize metals and alloys at the atomic level. He also established a topographic method for evaluations of metals, now known as the Berg-Barrett Method, and authored the classic X-ray diffraction/metallography book entitled “Structure of Metals.” He began his career in 1928 when he joined the Metallurgy Department at the U.S. Naval Research Laboratory. Over his career, he contributed his talents to institutions such as Carnegie Institute of Technology, University of Chicago, University of Denver, University of Birmingham, and Oxford University.

The Denver X-ray Conference Advisory Committee established the Barrett Award in 1986 to recognize outstanding contributions to the field of powder diffraction. Named in honor of Charles S. Barrett for his many years of exceptional work in the field, the award is presented biennially in odd numbered calendar years.

Selection Process

The Barrett Award Committee consists of three members; two of the three members are members of the Denver X-ray Conference Organizing Committee (DXCOC).

Each member of the award committee may select as many as three candidates for the award. Each committee member assigns a point value to each candidate, based on his or her selection as first, second, or third choice. The candidate who receives the highest amount of points will receive the award.

Award Presentation

The Barrett Award is presented at the Plenary Session of the Denver X-ray Conference. It consists of a commemorative plaque, detailing the recipient’s scientific achievements and contributions to the field of powder diffraction, and a gift of $1,000.

Submission Process
  • Electronic: Candidates may be submitted to the Chairman of the DXC Award Committee by completing a DXC Awards Nomination Form. In addition to the nomination form, the candidate’s curriculum vitae must be sent via email to awards@icdd.com or by mail or fax using the contact information below.
  • Hardcopy: Alternatively, candidates may be submitted to the Chairman of the Selection Committee by mailing a letter of support describing the candidate’s major accomplishments relative to the award, signed by the nominator and two others, along with the candidate’s curriculum vitae to:
Chairman, DXC Awards Selection Committee

c/o Terry Maguire
International Centre for Diffraction Data
12 Campus Boulevard
Newtown Square, PA 19073-3273 U.S.A.
Fax: 610.325-9823
E-mail: info@icdd.com

Submission Deadline

Submissions must be made by 1 October for the next year’s award.

PAST RECIPIENTS
2017 Barrett Award Recipient
Daniel Louër (left)
2015 Barrett Award Recipient
Brian Toby (right)
2013 Barrett Award Recipient
Vaclav Petricek (right)
2011 Barrett Award Recipient
Juan Rodriques-Carvajal
2009 Barrett Award Recipient
Robert Von Dreele
2007 Barrett Award Recipient
Sunil K. Sinha
2005 Barrett Award Recipient
Keith Bowen (right)
2005 Barrett Award Recipient
Brian Tanner (left)
2003 Barrett Award Recipient
Hugo Rietveld (right)
2001 Barrett Award Recipient
David E. Cox (right)
1999 Barrett Award Recipient
Howard F. McMurdie (left)
1997 Barrett Award Recipient
James D. Jorgensen (left)
1995 Barrett Award Recipient
Paul Predecki (right)
1993 Barrett Award Recipient
Ron Jenkins (right)
1991 Barrett Award Recipient
Deane K. Smith (left)
1989 Barrett Award Recipient
Jerome B. Cohen (right)
1987 Barrett Award Recipient
William Parrish (left)

**Deceased

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