12 Campus Blvd, Newtown Square, PA 19073, USA
(610) 325-9814
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Cohen Awards

Honoring Jerome (Jerry) B. Cohen
(1932 – 1999)

Known for his legendary contributions to Northwestern University, Jerry Cohen spent the majority of his career pursuing his true passion – teaching students. He served as Professor of Materials Science and Engineering, and Dean of the Robert R. McCormick School of Engineering and Applied Science. He helped initiate the development of the Advanced Photon Source (APS) at Argonne National Laboratory Synchrotron Radiation Research Facility, and solicited major funding to develop one of its leading experimental research stations. Jerry held several patents, including one for a rapid portable X-ray device for measuring residual stresses in structural metals in the field. He was the author of more than 300 publications and four books. His book “Residual Stress: Measurement by Diffraction and Interpretation,” co-authored by Cev Noyan, is still the classic, fundamental textbook in the field.

This award was instituted in the name of Professor Jerome B. Cohen, one of the leaders in the field of X-ray analysis, and in the training of students in this art. The award is intended to recognize the outstanding achievements of student research in this field. All students, graduate or undergraduate, who are working in the field of X-ray analysis, can submit a technical paper describing their work. The following criteria applies:

  • The research must be original, of high quality, and must be primarily the work of the student.
  • Papers submitted to the Cohen Award must be presented at the conference in either oral or poster session. Thus, all first-author students must submit an abstract and also attend the conference.
  • The winner must be able to attend the Plenary session of the conference on Wednesday morning for the announcement of the award.
  • Papers must be submitted along with a 2018-Cohen-Award-Cert-Form.
  • Please follow the same format guidelines as manuscripts submitted for the conference proceedings, Advances in X-ray Analysis. The Guidelines for the Preparation of Manuscripts are available online. Students competing for the award are required to submit their manuscript to Advances in X-ray Analysis, and include a signed Publishing Agreement, also available online.
  • Papers must be submitted electronically, as an e-mail attachment, created as either a Microsoft®Word (Word XP – 2010) document or as a PDF file (Portable Document File). Please e-mail the file to dxc@icdd.com. If you do not receive confirmation that the manuscript was received within one week of your submission, contact the ICDD Conference Services Department by email or phone: dxc@icdd.com; 610-325-9814.

Deadline – 1 June 2018

Selection Process

Assessments will be made based on the quality and content of the submitted paper. A committee of researchers in the field will select the winner.

Award Presentation

The award, consisting of a certificate and a gift of $1,000 will be announced and presented to the winning student at the Plenary Session of the Denver X-ray Conference.

 

Submission Process

Students must submit their paper in electronic form, along with a certification form, in final publication form, to zulli@icdd.com by 1 June the year of the award.

RECIPIENTS
2017 -Cohen Award Recipient
Howard Joress

Cornell University, for his work, A Polycapillary–Based Method of Monochromatic Time-Resolved X-ray Reflectivity.

2015 – Cohen Award Recipient
Peter Metz

Alfred University, Alfred, NY for his manuscript, “X-ray and Neutron Total Scattering Analysis of Hy∙(Bi0.2Ca0.55Sr0.25)(Ag0.25Na0.75)Nb3O10∙xH2O Perovskite Nanosheet Booklets with Stacking Disorder”.

2014 – none awarded

 

2013 – none awarded

 

2012 – Cohen Award Recipient
Magnus Menzel

Institut für Anorganische und Angewandte Chemie, Universität Hamburg, Hamburg, Germany, for his work, “CONFOCAL μ-XRF XANES ANALYSIS OF CATHODE ELECTROYTE INTERFACE OF LITHIUM-ION BATTERIES”.

2011 – Cohen Award Recipient
Vallerie Ann Innis-Samson

University of Tsukuba, Ibaraki, Japan, for her work entitled, “X-RAY REFLECTION TOMOGRAPHY: A NEW TOOL FOR SURFACE IMAGING”.

2010 – none awarded

 

2009 – none awarded

2008 – Cohen Award Recipient
Sterling Cornaby

Cornell University, Ithaca, New York for work entitled, “BIFOCAL MINIATURE TOROIDAL SHAPED X-RAY MIRRORS”

2007 – none awarded

2006 – Cohen Award Recipient
Hanfei Yan

Columbia University, New York, NY, and Argonne National Laboratory, Argonne, IL for his work “DYNAMICAL ARTIFACTS IN X-RAY DIFFRACTION FROM SINGLE CRYSTALS”

2006 – Cohen Award Recipient
Wanchuck Woo

The University of Tennessee, Knoxville, TN and Oak Ridge National Laboratory, Oak Ridge, TN for his work “IN-SITU TIME-RESOLVED NEUTRON DIFFRACTION MEASUREMENT OF TRANSIENT MATERIAL STATES DURING A THERMO-MECHANICAL PROCESS BASED ON QUASI-STEADY STATE PRINCIPLE”.

2005 – none awarded

2004 – none awarded

2003 – Cohen Award Recipient
Yukio Takahashi

Department of Materials Science, Graduate School of Engineering, Tohoku University, Sendai, Japan for his paper: “DEVELOPMENT AND APPLICATION OF LABORATORY X-RAY FLUORESCENCE HOLOGRAPHY EQUIPMENT”

2002 – Cohen Award Recipient
Jay C. Hanan

California Institute of Technology, Pasadena, Ca, for his work entitled “X-RAY STRESS ANALYSIS OF DAMAGE EVOLUTION IN Ti-SiC UNIDIRECTIONAL FIBER COMPOSITES”

2001 – none awarded

2000 – Cohen Award Recipient
Sven Vogel

Kiel University, Kiel, Germany, for his work entitled, “NON-DESTRUCTIVE IN-SITU REAL TIME MEASUREMENTS OF STRUCTURAL PHASE TRANSITIONS USING NEUTRON TRANSMISSION”

**Deceased

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