Honoring Jerome (Jerry) B. Cohen
(1932 – 1999)
Known for his legendary contributions to Northwestern University, Jerry Cohen spent the majority of his career pursuing his true passion – teaching students. He served as Professor of Materials Science and Engineering, and Dean of the Robert R. McCormick School of Engineering and Applied Science. He helped initiate the development of the Advanced Photon Source (APS) at Argonne National Laboratory Synchrotron Radiation Research Facility, and solicited major funding to develop one of its leading experimental research stations. Jerry held several patents, including one for a rapid portable X-ray device for measuring residual stresses in structural metals in the field. He was the author of more than 300 publications and four books. His book “Residual Stress: Measurement by Diffraction and Interpretation,” co-authored by Cev Noyan, is still the classic, fundamental textbook in the field.
This award was instituted in the name of Professor Jerome B. Cohen, one of the leaders in the field of X-ray analysis, and in the training of students in this art. The award is intended to recognize the outstanding achievements of student research in this field. All students, graduate or undergraduate, who are working in the field of X-ray analysis, can submit a technical paper describing their work. The following criteria applies:
- The research must be original, of high quality, and must be primarily the work of the student.
- Papers submitted to the Cohen Award must be presented at the conference in either oral or poster session. Thus, all first-author students must submit an abstract and also attend the conference.
- The winner must be able to attend the Plenary session of the conference on Wednesday morning for the announcement of the award.
- Papers must be submitted along with a 2018-Cohen-Award-Cert-Form.
- Please follow the same format guidelines as manuscripts submitted for the conference proceedings, Advances in X-ray Analysis. The Guidelines for the Preparation of Manuscripts are available online. Students competing for the award are required to submit their manuscript to Advances in X-ray Analysis, and include a signed Publishing Agreement, also available online.
- Papers must be submitted electronically, as an e-mail attachment, created as either a Microsoft®Word (Word XP – 2010) document or as a PDF file (Portable Document File). Please e-mail the file to email@example.com. If you do not receive confirmation that the manuscript was received within one week of your submission, contact the ICDD Conference Services Department by email or phone: firstname.lastname@example.org; 610-325-9814.
Deadline – 1 June 2018
Assessments will be made based on the quality and content of the submitted paper. A committee of researchers in the field will select the winner.
The award, consisting of a certificate and a gift of $1,000 will be announced and presented to the winning student at the Plenary Session of the Denver X-ray Conference.
Students must submit their paper in electronic form, along with a certification form, in final publication form, to email@example.com by 1 June the year of the award.
- 2017 - Howard Joress
- 2015 - Peter Metz
- 2014 - none awarded
- 2013 - none awarded
- 2012 - Magnus Menzel
- 2011 - Vallerie Ann Innis-Samson
- 2010 - none awarded
- 2009 - none awarded
- 2008 - Sterling Cornaby
- 2007 - none awarded
- 2006 - Hanfei Yan
- 2005 - none awarded
- 2004 - none awarded
- 2003 - Yukio Takahashi
- 2002 - Jay C. Hanan
- 2001 - none awarded
- 2000 - Sven Vogel
2017 -Cohen Award Recipient
Cornell University, for his work, A Polycapillary–Based Method of Monochromatic Time-Resolved X-ray Reflectivity.
2015 – Cohen Award Recipient
Alfred University, Alfred, NY for his manuscript, “X-ray and Neutron Total Scattering Analysis of Hy∙(Bi0.2Ca0.55Sr0.25)(Ag0.25Na0.75)Nb3O10∙xH2O Perovskite Nanosheet Booklets with Stacking Disorder”.
2014 – none awarded
2013 – none awarded
2012 – Cohen Award Recipient
Institut für Anorganische und Angewandte Chemie, Universität Hamburg, Hamburg, Germany, for his work, “CONFOCAL μ-XRF XANES ANALYSIS OF CATHODE ELECTROYTE INTERFACE OF LITHIUM-ION BATTERIES”.
2011 – Cohen Award Recipient
Vallerie Ann Innis-Samson
University of Tsukuba, Ibaraki, Japan, for her work entitled, “X-RAY REFLECTION TOMOGRAPHY: A NEW TOOL FOR SURFACE IMAGING”.
2010 – none awarded
2009 – none awarded
2008 – Cohen Award Recipient
Cornell University, Ithaca, New York for work entitled, “BIFOCAL MINIATURE TOROIDAL SHAPED X-RAY MIRRORS”
2007 – none awarded
2006 – Cohen Award Recipient
Columbia University, New York, NY, and Argonne National Laboratory, Argonne, IL for his work “DYNAMICAL ARTIFACTS IN X-RAY DIFFRACTION FROM SINGLE CRYSTALS”
2006 – Cohen Award Recipient
The University of Tennessee, Knoxville, TN and Oak Ridge National Laboratory, Oak Ridge, TN for his work “IN-SITU TIME-RESOLVED NEUTRON DIFFRACTION MEASUREMENT OF TRANSIENT MATERIAL STATES DURING A THERMO-MECHANICAL PROCESS BASED ON QUASI-STEADY STATE PRINCIPLE”.
2005 – none awarded
2004 – none awarded
2003 – Cohen Award Recipient
Department of Materials Science, Graduate School of Engineering, Tohoku University, Sendai, Japan for his paper: “DEVELOPMENT AND APPLICATION OF LABORATORY X-RAY FLUORESCENCE HOLOGRAPHY EQUIPMENT”
2002 – Cohen Award Recipient
Jay C. Hanan
California Institute of Technology, Pasadena, Ca, for his work entitled “X-RAY STRESS ANALYSIS OF DAMAGE EVOLUTION IN Ti-SiC UNIDIRECTIONAL FIBER COMPOSITES”
2001 – none awarded
2000 – Cohen Award Recipient
Kiel University, Kiel, Germany, for his work entitled, “NON-DESTRUCTIVE IN-SITU REAL TIME MEASUREMENTS OF STRUCTURAL PHASE TRANSITIONS USING NEUTRON TRANSMISSION”