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Upcoming Talks by ICDD!

 

18th International Symposium on the Reactivity of Solids (ISRS)
9-13 June 2014, St. Petersburg, Russia

 

Oxide Nanosheets as Water Splitting Catalysts:
a Structural Perspective

ICDD Chairman, Scott Misture from Alfred University

st petersburg
Photo: Victor Griga

 

[conference website]


The European Powder Diffraction Conference (EPDIC) 14
15-18 June 2014, Aarhus, Denmark

 

ICDD Workshop, Materials Characterization Capabilities Using the Powder Diffraction File™, featuring:

 

X-ray Diffraction Analysis of Polymers –
Expanding Materials Characterization Capabilities

T. N. Blanton, ICDD, Newtown Square, PA, USA

 

Crystal Structures of Large Volume
Commercial Pharmaceuticals

J. A. Kaduk, Illinois Institute of Technology,
Chicago, IL, USA

 

New Neutron Diffraction Data Analysis
Capabilities in PDF-4+

T. G. Fawcett, ICDD, Newtown Square, PA, USA

 

The Modulated Structure Subfile and Graphics
T. N. Blanton, ICDD, Newtown Square, PA, USA

 

The Analysis of Nanomaterials by Powder Diffraction
P. Scardi and M. Leoni, U. of Trento, Trento, Italy

epdic
Photo: Stan Shebs

 

[conference website]


Nanostructure Materials (NANO) 2014
13-18 July 2014, Moscow, Russia


The Analysis of Nanomaterials by Powder Diffraction
T.G. Fawcett, S. N. Kabbekodu, J. R. Blanton,
C. E. Crowder, T. N. Blanton, ICDD, Newtown Square, PA, USA

nano
Photo: Alex Zelenko

 

[conference website]


Denver X-ray Conference (DXC) 2014
28 July – 1 August 2014, Big Sky, Montana


dxc

[conference website]

 

Workshops:

 

Two-dimensional Detectors
T. Blanton, ICDD, Newtown Square, PA
B.B. He, Bruker AXS, Inc. Madison, WI
S. Speakman, PANalytical INC., Westborough, MA 
J. Ferrara, Rigaku Americas Corp., The Woodlands, TX

Introduction to Modulated Structures
O. Gourdon, Los Alamos National Laboratory, Los Alamos, NM
S. Kabekkodu, D. Sagnella, ICDD, Newtown Square, PA


Posters:

Characterization of Nafion Proton Exchange Membrane Films
Using Wide Angle X-ray Diffraction

T.N. Blanton, ICDD, Newtown Square, PA
R. Koestner, General Motors Corporation, Pontiac, MI

 

Introduction to the World’s Finest Modulated Structure Database
D.E. Sagnella, O. Gourdon, D. Gout, S. Kabekkodu,
ICDD, Newtown Square, PA

Crystal Structures of Large-Volume Commercial Pharmaceuticals
J.A. Kaduk, Illinois Institute of Technology, Chicago, IL
C.E. Crowder, K. Zhong, T.G. Fawcett,
ICDD, Newtown Square, PA
A.A. Sarjeant, Northwestern University, Evanston, IL
M.R. Suchomel, APS, Argonne National Laboratory, Argonne IL

 

A Powder Diffraction Database for All Radiations      
C.E. Crowder, S. Kabekkodu, J. Blanton, R. Vithayathil, V. Bosnic,
D. Sagnella, K. Zhong, T. Blanton, T. Fawcett, ICDD, Newtown Square, PA

 

Oral Sessions:

New Neutron Diffraction Data Capability in the
ICDD PDF-4+ 2014 Relational Database

J. Faber, Faber Consulting, Thornton, PA
C. Crowder, J. Blanton, S. Kabekkodu, T. Blanton, T. Fawcett,
ICDD, Newtown Square, PA
O. Gourdon, Los Alamos National Laboratory, Los Alamos, NM

 

Simulation Tools and References for the Analysis of Nanomaterials
T.G. Fawcett, S.N. Kabekkodu, J.R. Blanton, C.E. Crowder, T.N. Blanton,
ICDD, Newtown Square, PA


XXIII International Materials Research Congress (IMRC)
17-21 August 2014, Cancun, Mexico

 

Materials Characterization Using
X-ray Powder Diffraction Techniques

T.N. Blanton, T.G. Fawcett, C.E. Crowder, J.R. Blanton, S.N. Kabbekodu, ICDD, Newtown Square, PA, USA

 

Applications of the Powder Diffraction File PDF4+
in the Characterization of Materials

Dr. Thomas Blanton, ICDD, Newtown Square, PA, USA
Dr. José Miguel Delgado, Universidad de los Andes, Venezuela
Dr. Lauro Bucio, Universidad Nacional Autónoma de México

cancun
Photo: Irving Huertas

 

[conference website]


The International Union of Crystallography (IUCr) 23rd Congress
5-12 August 2014, Montreal, Canada

 

Data Validation and Structural Classifications
in Powder Diffraction File

S. Kabekkodu, ICDD, Newtown Square, PA, USA

montreal
Photo: Abdallahh

 

[conference website]


pdf-4PDF-4+ 2013 - Purchase PDF-4+ 2013
Identify and Quantitate

 

The PDF-4+ database is ICDD's most advanced database, designed for both phase identification and quantitative analysis. For quantitative analysis, the database has the following features:
• All 340,653 entries have digital patterns for use in total pattern analysis
• 243,065 entries have I/Ic values for quantitative analysis by Reference Intensity Ratio
• 227,102 entries with atomic coordinates for quantitative analysis by the Rietveld method
• Digital reference patterns for non-crystalline materials

 

quantitative analysis

 

what's new

 

 

 

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