2012 Educational Events Newsletter – Part Two
The International Centre for Diffraction Data has successfully concluded another year of Educational Events. The second half of the 2012 Educational Program included the 61st Annual Denver X-ray Conference which occurred 6 – 10 August, and the Rietveld Refinement & Indexing Workshop. The Basic Rietveld Workshop was 1 – 3 October, followed by the Advanced Rietveld Workshop on 4 – 5 October. If you missed the summary of the first half of the 2012 Educational Program, please read the previous newsletter.
The 61st Annual Denver X-ray Conference (DXC) was held in Denver, Colorado at the Denver Marriott Tech Center Hotel, from 6 – 10 August 2012. The meeting attracted close to 300 registered attendees and well over 100 exhibit staff, all gathering to discuss applications, state-of-the-art techniques and future developments in X-ray analysis. Twenty-eight percent of the attendees were from outside the United States representing the following countries: Australia, Austria, Belarus, Belgium, Canada, China, Cyprus, Czech Republic, Denmark, France, Germany, Hungary, India, Italy, Japan, Korea, Malaysia, Poland, Portugal, Sweden, Switzerland, The Netherlands, United Kingdom and Venezuela.
ICDD's Marketing Assistant, Ben Hish; Senior Software Engineer, Justin Blanton; and Executive Director, Tim Fawcett at the ICDD booth (left to right).
Sixteen half-day tutorial workshops were held on Monday and Tuesday, with participation from 43 instructors. Nearly two-hundred presentations were made during the oral and poster sessions at DXC. Fifteen half-day oral sessions were held Wednesday afternoon, Thursday, and Friday morning.
Poster sessions were held on Monday and Tuesday evening in conjunction with evening receptions. XRD posters were displayed on Monday and XRF posters were shown on Tuesday. Each evening offered authors a full two hours to show their work and network with their peers.
Best XRD Poster winners Tamas Ungar (left) and Gabor Csiszar (right).
Tim Elam (left) congratulates Best XRF Poster winner, Shintaro Hirano.
The Plenary Session, New Frontiers in X-ray Analysis – Dedicated to the life and work of Robert L. Snyder, was held Wednesday morning, and was organized by Scott Misture, NYS College of Ceramics at Alfred University, Alfred, NY. Three invited talks were given during the plenary session: “Diffraction Analysis and Atomistic Modeling of the Real Structure of Nanocrystalline Materials,” Paolo Scardi, University of Trento, Trento, Italy; “Milestones That Gave Momentum to XRPD,” Herbert E. Goebel, LabXA, Munich, Germany; “New Dimensions in X-ray Microscopy,” Janos Kirz, Lawrence Berkeley National Lab, Berkeley, CA, USA.
Scott Misture, Plenary Session chair, shares fond memories of Bob Snyder.
The Plenary Session was a bittersweet event. For many of us, this was our first DXC without our fearless leader, Bob Snyder. A slide show of Bob ran throughout the plenary and conference week, and various posters were displayed with pictures of Bob attending the DXC throughout the years. The Plenary talks celebrated the many contributions that Bob made to the X-ray community as a scientist, mentor and friend. Bob’s wife, Sheila, continued the tradition of attending the conference, and was welcomed warmly by the attendees.
In memory, Bob Snyder at the 2004 DXC.
At the Plenary Session, the 2012 Birks Award was bestowed posthumously to John Criss. John’s wife, Judy, was present to accept the award, and gave a beautiful acceptance speech in which she shared the history between John and Laverne Birks, his mentor.
Judy Criss (left) accepts the Birks Award from Mary Ann Zaitz (right).
The 2012 Jerome B. Cohen Student Award was given to Magnus Menzel, University of Hamburg, Hamburg, Germany, for his work, “Confocal μ-XRF XANES Analysis of the Cathode Electrolyte Interface of Lithium-ion Batteries”. When the work was submitted, the Denver X-ray Conference Organizing Committee was so impressed, they asked Magnus to present the work as an invited talk during the Micro XRF session.
Magnus Menzel (left) receives the Jerome B. Cohen Student Award
from Cev Noyan (right).
For complete details of the Denver Conference, read the 2012 Conference Summary.
Rietveld Refinement & Indexing Workshop
Finally, our Educational Programs concluded with the Rietveld Refinement & Indexing Workshop, which was held at ICDD headquarters in Newtown Square, PA. Those who attended the Rietveld Workshop had a unique opportunity to learn the principles of Rietveld analysis and to develop their problem-solving techniques.
The knowledgeable faculty consisted of: Cyrus Crowder, ICDD; John Faber, Emeritus, ICDD; Timothy Fawcett, ICDD; Stacy Gates, ICDD; Amy Gindhart, ICDD; Soorya Kabekkodu, ICDD; James Kaduk, Poly Crystallography, Inc.; and Olivier Gourdon, ICDD.
Rietveld Refinement & Indexing Workshop faculty and attendees
Two tuition waivers were granted to Victor Emmanuel Alvarez Montaňo, University of Sonora, Hermosillo, Mexico, and Vedran (Nick) Vukotic, University of Windsor, Windsor, Ontario, Canada.
The format of the course consisted of lectures, as well as hands-on workshops in the computer lab. On Monday evening, the week kicked off with a Welcome Reception at the host hotel, The Best Western, Concordville, PA. Also, optional study sessions were held at the hotel in the evenings during the week.
Tuition waiver recipients Vedran (Nick) Vukotic (left) and Victor Emmanuel Alvarez Montaňo (right)
The workshop drew both domestic and international attendees, from countries such as Australia, Canada, Mexico, Switzerland, as well as throughout the United States. Our instructors received outstanding feedback from the attendees’ course evaluations; ICDD continues to listen to what attendees’ desire in our courses and implement their suggestions into our Educational Programs.
Faculty member Amy Gindhart leads one of the Rietveld presentations.
Learn more about the ICDD Educational Events - www.icdd.com/education/
See the schedule for 2013 Educational Program of Events
See the Tentative Schedule for the 2013 DXC
See the latest news on PPXRD-12