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ICDD Newsletter Volume 12 Issue 1

Highlights of the 2013 Denver X-ray Conference

The 62nd Annual Denver X-ray Conference (DXC) was held in Westminster, Colorado at the Westin Hotel on 5-9 August 2013. The meeting attracted close to 300 registered attendees and well over 100 exhibit staff, all gathering to discuss applications, state-of-the-art techniques and future developments in X-ray, electron, and neutron analysis.

Sixteen half-day tutorial workshops were held on Monday and Tuesday, with participation from thirty-five instructors. Various subjects were covered to satisfy the needs of both the beginner and advanced attendee.

Nearly two-hundred presentations were made during the oral and poster sessions at DXC. Poster sessions were held on Monday and Tuesday evening in conjunction with evening receptions. Thirteen half-day oral sessions were held Wednesday afternoon, Thursday, and Friday morning.

Tim Elam, Chair of the DXC Organizing Committee

The Plenary Session, the 100th Anniversary of X-ray Spectroscopy, was held on Wednesday morning and chaired by George J. Havrilla of Los Alamos National Laboratory, Los Alamos, NM. John A. Anzelmo of Anzelmo & Associates, Inc., Madison, WI, USA, gave the first invited talk, “WDX: From Roentgen to Moseley to Bragg to Sherman to Jenkins” highlighting the foundation for X-ray Spectroscopy and major developments of the method.

Plenary Speaker John Anzelmo

The second invited talk was given by Michael Mantler of the Rigaku Corporation, Purkersdorf, Austria. Dr. Mantler spoke on, “The Electronic Age - EDX and Other Modern Techniques to the Present and Beyond.” His talk focused on current uses of X-ray Spectroscopy and how the practice will develop in the future.

Plenary Speaker, Michael Mantler

In addition, Robert B. Von Dreele, Argonne National Laboratory, Lemont, IL, USA, presented the Hanawalt Award Lecture on “Protein Polycrystallography.” The presentation was given as part of the work that earned him ICDD’s 2013 Hanawalt Award.

Robert Von Dreele, Hanawalt Award recipient

Three awards were presented during the Plenary session. The 2013 Barrett Award was presented to Vaclav Petricek of the Institute of Physics, Academy of Sciences of the Czech  Republic, Praha, Czech Republic.

Vaclav Petricek (right) receives the Barrett Award from James Kaduk (left)

The 2013 Jenkins Award was presented to Rene Van Grieken of the University of Antwerp, Antwerp, Belgium.

Rene Van Grieken (left) receives the Jenkins Award from Tim Elam (right)

The 2013 Hanawalt Award was presented to Robert B. Von Dreele of Argonne National Laboratory, Lemont, IL, USA.

The Robert L. Snyder Student Travel Awards offer travel support to enable graduate and undergraduate students to attend the Denver X-ray Conference. Six students received an award based on the relevancy and strength of their DXC presentation:

  • Waleed Abuhani, Universidad Michoacána of San Nicholás de Hidalgo, Morelia, Michoacán, Mexico
    Characterizing Fundamental Parameters Based Analysis for Soil-Ceramic Matrices in Polarized Energy Dispersive X-ray Fluorescence Spectrometry (pEDXRF)
  • Magnus Menzel, University of Hamburg, Hamburg, Germany
    Absorption of the Primary Beam in Sr-TXRF Analysis: Experimental Visualization Using a Color X-ray Camera  
  • Nadine Rademacher, Goethe University, Frankfurt am Main, Germany     
    High Pressure Investigations of Liquid and Polymerized CO up to 20 GPa Using Pair Distribution Function Analysis
  • Sofiane Louidi, Université of 20 Août 1955, Skikda, Algeria
    Structural Study of Nanostructured Cr-Co Based Alloys by X-ray Diffraction Line Profile Analysis
  • Sudheer Bandla, Oklahoma State University, Tulsa, OK, USA
    Orientation, Crystallinity, and Mechanical Properties of Biaxially Stretched Polyethylene Terephthalate Films using X-ray Diffraction 
  • Jiawanjun Shi, Alfred University, Alfred, NY, USA
    Crystal Structure and Photocatalytic Studies of 2, 3, 4, and 5-Layer Aurivillius Oxides

Poster awards were named on Monday and Tuesday evening at the end of the XRD and XRF poster sessions. The following posters won awards:

XRD Best Poster Awards:

  • An In-Situ XRD and H2-D2 Exchange Study on Ni-Based Amorphous and Crystalline Membranes -
    A. Adibhatla, W. Chien, D. Chandra, University of Nevada, Reno, NV, USA
    M.D. Dolan, CSIRO Energy Technology, Pullenvale, Queensland, Australia
  • Simulating X-ray Diffraction Profiles of Nanomaterials -
    H. Öztürk, I.C. Noyan, Columbia University, New York, NY, USA
    H. Yan, NSLS II, Brookhaven National Laboratory, Upton, NY, USA
  • X-ray Diffraction Characterization of a Distorted Debye-Scherrer Film Strip – The Effect of Deacetylation on Cellulose Triacetate and an Improved Structural Model for Cellulose II -
    T.N. Blanton, International Centre for Diffraction Data, Newtown Square, PA, USA
    J.A. Kaduk, Illinois Institute of Technology, Chicago, IL, USA
    Q. Johnson, Materials Data Incorporated, Livermore, CA, USA

XRD Best Poster Award Winners

XRF Best Poster Awards

  • Investigation on the Ni Oxidation State in LiNi0.5Mn1.5O4 Li-Ion Battery Cathodes at Different Cycle States: Pristine, Discharged, After Quick Charging and Slow Charging -
    U.E.A. Fittschen, M. Menzel, A. Schlifke, M. Froeba, University of Hamburg, Hamburg, Germany
    U. Boesenberg, DESY Deutsches Elektronen Synchrotron, Hamburg, Germany
    M. Falk, J. Janeck, Chemistry Department, University of Giessen, Giessen, Germany
  • Forensic Investigations with Different Confocal Micro-XRF Spectrometers -
    S. Smolek, C. Streli, P. Wobrauschek, Vienna Univ. of Technology, Atominstitut, Vienna, Austria
    T. Nakazawa, K. Nakano, K. Tsuji, Osaka City University, Sumiyoshi, Osaka, Japan
  • Fast Elemental Imaging by Wavelength Dispersive X-ray Fluorescence Imaging Spectrometer -
    T. Ohmori, S. Emoto, Osaka City University, Osaka, Japan
    S. Kato, M. Doi, T. Shoji, Rigaku Co., Takatsuki, Osaka, Japan
    K. Tsuji, Osaka City University, Osaka, Japan

XRF Best Poster Award Winners

Thirty-eight companies exhibited at the conference, displaying various products and services for X-ray diffraction and X-ray fluorescence. International countries represented were Canada, Germany, Japan and the United Kingdom.

Complete exhibit details including contact information and a description of products and services can still be viewed on the Denver X-ray Conference web site:

The Denver X-ray Conference Organizing Committee would like to give special thanks to the vendors who sponsored events at the conference. Chemplex Industries, Inc. very generously hosted the XRF Poster Session; Claisse, Corporation Scientifique, hosted a wonderful celebration during the Plenary session in honor of the 100th Anniversary of X-ray Spectroscopy; and ICDD sponsored the XRD poster session. The poster sessions and Plenary session were enhanced by the food and libations offered by our gracious sponsors and we thank them for their continued generosity and support of the DXC.

Chemplex Industries, sponsors of the XRF Poster Session

Claisse Corporation Scientifique, sponsors of the Plenary Session Celebration

Save the date for 2014! The 63rd Annual DXC will be held 28 July - 1 August 2014 at Big Sky Resort, Big Sky, Montana, USA. This is the first time the conference will be held in Big Sky, and we’re looking forward to showing our attendees a new and beautiful area of the country. There are links on the DXC website to help you familiarize yourself with the area and see the many attractions and activities that Big Sky has to offer to attendees and their families.

Stay connected with DXC and ICDD by following us on Twitter, Facebook, Google+ and LinkedIn. Visit our web site or contact our Conference Coordinator, Denise Zulli. We are here to help you with any questions or concerns you may have, and hope to see everyone this year in Big Sky, Montana.

Web:; E-mail:; Phone: 610-325-9814.


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