The International Centre for Diffraction Data

Volume 2 Issue 2

ICDD Spring Meetings | 2005 Distinguished Fellow Award | 2004-2006 Board of Directors | New ICDD Members
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ICDD Spring Meetings


During the week of 22-26 March 2004, ICDD members from 12 countries gathered at the Newtown Square Headquarters office for the Annual Spring Meetings. Here are some of the week's highlights..

This year's Plenary Session focused on Advanced Instrumentation. Many thanks are extended to our plenary speakers for their contributions:

  • Martijn Fransen, PANalytical, Almelo, The Netherlands: Advanced Optics and Detection Systems, What Do They Offer the Research Community?
  • Bob He, Bruker AXS, Madison, WI: Two-dimensional X-ray Diffractometer: Convention, Components and Configuration
  • Hideo Toraya, Rigaku Corporation, Japan: A High-Performance Silicon Photodiode Detector for Fast X-ray Counting
  • Pierre Villars, Materials Phases Data System (MPDS),Switzerland: New Structural Prototyping System used by the LINUS PAULING FILE and proposed for the Powder Diffraction File (PDF)

Following the plenary, members and guests were treated to a highlights tour of the Philadelphia Museum of Art. Built in 1876, this great art institution is home to some of the most brilliant artistic achievements known throughout the world. The guided tour offered a spectacular look at a sampling of the over 300,000 works of art housed at the museum.


A technical poster session and accompanying reception completed Tuesday's activities. The Best Western Hotel and Conference Center in Concordville hosted ICDD's most successful Spring Meetings' poster session to date. Approximately 30 posters were on display, allowing attendees yet another venue to communicate their studies and exchange information with fellow scientists. Poster abstracts will be published in Powder Diffraction.

Several awards were announced at the Annual Meeting of Members:

  • Shao Fan Lin of the Nankai University, People's Republic of China was recognized for his 17 years as a participant in the ICDD Grant-in-Aid Program as he was named the 2004 Distinguished Grantee Recipient. Dr. Lin has published approximately 700 patterns in the PDF.
  • Following more than 30 years of service to the ICDD, Dr. Robert Snyder, Georgia Institute of Technology, was named as the 2004 Distinguished Fellow. Dr. Snyder served the organization in various capacities: as a member and leader on various committees, subcommittees, task groups, and most recently as Chairman of the Board of Directors. Over the years, he has often been referred to as the "ICDD ambassador to the world". Dr. Snyder's relentless energy and vision served as catalysts in bringing a new dimension to the PDF.

Read more about the spring meetings..


2005 Distinguished Fellow Award - Nominees Solicited Dates to Remember
Nominees are solicited for the 2005 Distinguished Fellow Award. 
Presented annually, the award is open to ICDD Fellows who have given long and meritorious service to the ICDD. The next award will be presented at the Annual Meeting of Members in March 2005. If you are an ICDD Fellow and would like to nominate a candidate for this prestigious honor, complete a Nomination Form by 15 September 2004.

Learn about the submission process.



Session I - Fundamentals
of X-ray Powder Diffraction
7-11 June 2004

Session II - Advanced Methods
in X-ray Powder Diffraction
14-18 June 2004

Denver X-ray Conference
Steamboat Springs, CO, USA
2-6 August 2004


Congratulations to the 2004-2006 Board of Directors
The ICDD is pleased to announce its new Board of Directors who will serve the ICDD for the next 2 years, 2004 through 2006:

Chairman - James Kaduk
Vice Chairman - Paolo Scardi
Treasurer - Julian Messick
Corporate Secretary - Terry Maguire
Executive Director - Timothy Fawcett
Chairman, Technical Committee - Raymond Goehner
Directors-at-Large, Board of Directors - 
Evgeny Antipov, Tom Blanton, Herbert Goebel, Ting Huang, Daniel Louėr
Past Chairman - Camden R. Hubbard


ICDD welcomes its newly-elected members!
1. S.N. Achary, Bhabha Atomic Research Center, Mumbai, India
2. Nicholas Barbi, nSynergies, Inc., Yardley, PA, USA
3. Martha Davidovich, Bristol-Myers Squibb, New Brunswick, NJ, USA
4. Peter DeSanto, NIST, Berwick, PA, USA
5. Mark Dirken, PANalytical, EA Almelo, The Netherlands
6. Camille Jones, NIST, Gaithersburg, MD, USA
7. Walter Kalceff, University of Technology, Sydney, Broadway, Australia
8. Pavel Karen, University of Oslo, Oslo, Norway
9. Philip Lightfoot, University of St. Andrews, St. Andrews Fife, United Kingdom
10. J. David Londono, Dupont Central Research & Development, Wilmington, DE USA
11. Michael Lufaso, NIST, Gaithersburg, MD, USA
12. Thomasin C. Miller, X-ray Optical Systems, Inc., East Greenbush, NY, USA
13. Ellouze Mohamed, Faculte des Sciences de Sfax, Sfax, Tunisia
14. Conal Murray, IBM Watson Research Center, Yorktown Heights, NY, USA
15. Jeffrey Nicolich, PANalytical, Natick, MA, USA
16. Ismail Cevdet Noyan, IBM T. J. Watson Research Center, Yorktown Heights, NY, USA
17. Suminar Pratapa, Institute of Technology, Surabaya, Indonesia
18. Murugan Ramalingam, National University of Singapore, Singapore
19. Lei Shi, University of Science & Technology of China, Hefei Anhui, People's Republic of China
20. Valery Vlasenko, Rostov State University, Rostov-on-Don, Russia
21. Pamela Whitfield, National Research Council Canada, Ottawa, Ontario, Canada
22. Craig Williams, University of Wolverhampton, West Midlands, United Kingdom
23. Donald Windover, NIST, Gaithersburg, MD, USA
24. Zhi Yang, NIST, Gaithersburg, MD, USA
25. Yuegang Zhang, Argonne National Laboratory, Argonne, IL, USA
26. Zeng, Weitao, Jilin University, Changechuni Jilin, People's Republic of China
27. Douglas Smith, Rochester, NY, USA
28. Yucheng Lan, Temple University, Philadelphia, PA USA
29. Zhenhong Mai, Institute of Physics, Chinese Academy of Science, People's Republic of China
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© 2004 The International Centre for Diffraction Data

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