ICDD Newletter - Volume 2 Issue 2 - 2004

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ICDD Spring Meetings

	During the week of 22-26 March 2004, ICDD members from 12 countries gathered at the Newtown Square Headquarters office for the Annual Spring Meetings. Here are some of the week's highlights.. PLENARY SESSION This year's Plenary Session focused on Advanced Instrumentation. Many thanks are extended to our plenary speakers for their contributions: Martijn Fransen, PANalytical, Almelo, The Netherlands: Advanced Optics and Detection Systems, What Do They Offer the Research Community? Bob He, Bruker AXS, Madison, WI: Two-dimensional X-ray Diffractometer: Convention, Components and Configuration Hideo Toraya, Rigaku Corporation, Japan: A High-Performance Silicon Photodiode Detector for Fast X-Ray Counting Pierre Villars, Materials Phases Data System (MPDS),Switzerland: New Structural Prototyping System used by the LINUS PAULING FILE and proposed for the Powder Diffraction File (PDF) TOUR Following the plenary, members and guests were treated to a highlights tour of the Philadelphia Museum of Art. Built in 1876, this great art institution is home to some of the most brilliant artistic achievements known throughout the world. The guided tour offered a spectacular look at a sampling of the over 300,000 works of art housed at the museum.
	POSTER SESSION A technical poster session and accompanying reception completed Tuesday's activities. The Best Western Hotel and Conference Center in Concordville hosted ICDD's most successful Spring Meetings' poster session to date. Approximately 30 posters were on display, allowing attendees yet another venue to communicate their studies and exchange information with fellow scientists. Poster abstracts will be published in Powder Diffraction. AWARDS Several awards were announced at the Annual Meeting of Members: Shao Fan Lin of the Nankai University, People's Republic of China was recognized for his 17 years as a participant in the ICDD Grant-in-Aid Program as he was named the 2004 Distinguished Grantee Recipient. Dr. Lin has published approximately 700 patterns in the PDF. Following more than 30 years of service to the ICDD, Dr. Robert Snyder, Georgia Institute of Technology, was named as the 2004 Distinguished Fellow. Dr. Snyder served the organization in various capacities: as a member and leader on various committees, subcommittees, task groups, and most recently as Chairman of the Board of Directors. Over the years, he has often been referred to as the "ICDD ambassador to the world". Dr. Snyder's relentless energy and vision served as catalysts in bringing a new dimension to the PDF. Read more about the spring meetings..
2005 Distinguished Fellow Award - Nominees Solicited		Dates to Remember

Nominees are solicited for the 2005 Distinguished Fellow Award. Presented annually, the award is open to ICDD Fellows who have given long and meritorious service to the ICDD. The next award will be presented at the Annual Meeting of Members in March 2005. If you are an ICDD Fellow and would like to nominate a candidate for this prestigious honor, complete a Nomination Form by 15 September 2004. Learn about the submission process.		ICDD XRD I Clinic Headquarters Session I - Fundamentals of X-ray Powder Diffraction 7-11 June 2004 ICDD XRD II Clinic Headquarters Session II - Advanced Methods in X-ray Powder Diffraction 14-18 June 2004 Denver X-Ray Conference Steamboat Springs, CO, USA 2-6 August 2004
Congratulations to the 2004-2006 Board of Directors

The ICDD is pleased to announce its new Board of Directors who will serve the ICDD for the next 2 years, 2004 through 2006: Chairman - James Kaduk Vice Chairman - Paolo Scardi Treasurer - Julian Messick Corporate Secretary - Terry Maguire Executive Director - Timothy Fawcett Chairman, Technical Committee - Raymond Goehner Directors-at-Large, Board of Directors - Evgeny Antipov, Tom Blanton, Herbert Goebel, Ting Huang, Daniel Louër Past Chairman - Camden R. Hubbard
ICDD welcomes its newly-elected members!

1. S.N. Achary, Bhabha Atomic Research Center, Mumbai, India 2. Nicholas Barbi, nSynergies, Inc., Yardley, PA, USA 3. Martha Davidovich, Bristol-Myers Squibb, New Brunswick, NJ, USA 4. Peter DeSanto, NIST, Berwick, PA, USA 5. Mark Dirken, PANalytical, EA Almelo, The Netherlands 6. Camille Jones, NIST, Gaithersburg, MD, USA 7. Walter Kalceff, University of Technology, Sydney, Broadway, Australia 8. Pavel Karen, University of Oslo, Oslo, Norway 9. Philip Lightfoot, University of St. Andrews, St. Andrews Fife, United Kingdom 10. J. David Londono, Dupont Central Research & Development, Wilmington, DE USA 11. Michael Lufaso, NIST, Gaithersburg, MD, USA 12. Thomasin C. Miller, X-ray Optical Systems, Inc., East Greenbush, NY, USA 13. Ellouze Mohamed, Faculte des Sciences de Sfax, Sfax, Tunisia 14. Conal Murray, IBM Watson Research Center, Yorktown Heights, NY, USA 15. Jeffrey Nicolich, PANalytical, Natick, MA, USA 16. Ismail Cevdet Noyan, IBM T. J. Watson Research Center, Yorktown Heights, NY, USA 17. Suminar Pratapa, Institute of Technology, Surabaya, Indonesia 18. Murugan Ramalingam, National University of Singapore, Singapore 19. Lei Shi, University of Science & Technology of China, Hefei Anhui, People's Republic of China 20. Valery Vlasenko, Rostov State University, Rostov-on-Don, Russia 21. Pamela Whitfield, National Research Council Canada, Ottawa, Ontario, Canada 22. Craig Williams, University of Wolverhampton, West Midlands, United Kingdom 23. Donald Windover, NIST, Gaithersburg, MD, USA 24. Zhi Yang, NIST, Gaithersburg, MD, USA 25. Yuegang Zhang, Argonne National Laboratory, Argonne, IL, USA 26. Zeng, Weitao, Jilin University, Changechuni Jilin, People's Republic of China 27. Douglas Smith, Rochester, NY, USA 28. Yucheng Lan, Temple University, Philadelphia, PA USA 29. Zhenhong Mai, Institute of Physics, Chinese Academy of Science, People's Republic of China

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The International Centre for Diffraction Data	Volume 2 Issue 2
ICDD Spring Meetings \| 2005 Distinguished Fellow Award \| 2004-2006 Board of Directors \| New ICDD Members