icdd  
 The International Centre for Diffraction Data

Volume 8 Issue 2

2010 Award Recipients

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ICDD Award Recipient News

 
Award recipients for 2010 were recently named during The Annual Meeting of Members held on Thursday, 18 March at the ICDD Spring Meetings week.



Jim Kaduk (L), Tom Blanton (R)

This year, the Board of Directors recognized James Kaduk, Naperville, IL, as the 2010 Distinguished Fellow. This award is given to a member who has given long and meritorious service to the ICDD.

Both the ICDD and the X-ray diffraction community have benefitted from Dr. Kaduk’s long and distinguished career in this field.  Known internationally for his leadership in structural analysis from powder diffraction and allied quantum and computational techniques, Dr. Kaduk has generously shared his knowledge and expertise over the last several decades, through his volunteer efforts within the ICDD. He has served in numerous leadership roles, as Chairman to various Committee and Subcommittees, to Chairman of the Board of Directors.  Dr. Kaduk also shared the vision and implementation, along with several other ICDD leaders, of transforming the direction of the organization by interlinking the Powder Diffraction File™ with other scientific databases. The current state of the PDF® has been greatly influenced by Dr. Kaduk’s vital contributions.


Daniel Louër (L), Tom Blanton (R)

The ICDD was happy to recognize Daniel Louër, the 2009 Distinguished Fellow, during the meetings this year, because he was unable to attend the previous year.

Dr. Louër’s scientific work has centered on the determination of the crystal structures of metaloxalates. He is among the pioneers in ab initio structure determination using powder data, demonstrating that this important aspect of powder diffraction was practical.  Dr. Louër’s development of line profile analysis to study the defect structure of ceramic materials has accelerated the drive to total pattern analysis. His renowned indexing program, DICVOL, continues as one of the benchmark methods for assigning unit cells to powder diffraction data.

Within the ICDD, Dr. Louër has been an active member for many, many years, serving in various capacities. He participated in the ICDD Grant-in-Aid Program, consistently submitting high-quality diffraction data for the PDF®. He participated in ICDD round robins, chaired committees, and served as a member of the Board of Directors. He continues today to serve as a committee chairman.

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(Left to Right) Tom Blanton, Takashi Ida; Matteo Leoni, Tom Blanton; Lizhi Liu, Tom Blanton

Another award given by the ICDD Board of Directors is the ICDD Fellow, which recognizes individuals who have devoted their time and talent beyond what is normally expected of a member. To receive this award, a member must have served at least two years in one of the following positions: Board Director, Technical Regional Co-chair, Committee Chair or Technical Subcommittee Chair. This year, the ICDD was pleased to award five ICDD Fellows: Takashi Ida, Regional Co-chair for the Eastern Pacific Rim; Matteo Leoni, Regional Co-chair for the European Community; Lizhi Liu, Polymers Subcommittee Chair; Roman Shpanchenko, Membership Committee Chair and ICDD advocate in the Russian region; Scott Speakman, Micro and Meso Subcommitte Chair. The Board of Directors will also award an ICDD Fellow to someone who has been a leader in noteworthy ICDD activity. This year, Mary Ann Zaitz was named an ICDD Fellow for her outstanding leadership in teaching for over 20 years at our XRF Clinic, Practical X-ray Fluorescence and the Denver X-ray Conference.

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(Left to Right) Roman Shpanchenko; Scott Speakman, Tom Blanton; Mary Ann Zaitz

   
Roy Garvey, Shao-Fan Lin and Harry Thielke were this year’s recipients for the McMurdie Award. Through this award, all three gentlemen were commended for their continuous contributions to the content and quality of the Organic Powder Diffraction File™. The award is named in honor of Howard McMurdie and is given every two years to recognize distinguished work, which improves the Powder Diffraction File™ (PDF)® in its purpose of identifying and characterizing materials. Dr. Garvey received his award at the Annual Meeting, while Dr. Lin will receive his award at a future meeting in China. Mr. Thielke’s award was given posthumously to recognize his lifetime of contributions.
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Roy Garvey (L), Tom Blanton (R)
   
This year, the ICDD awarded Bogdan Lazoryak, of Moscow State University, the 2010 Distinguished Grantee Award. This award was instituted to recognize the ongoing efforts of exceptional Grant-in-Aid recipients, whose work for the ICDD goes beyond the measurement of high quality powder patterns. The award is presented triennially. A Grant-in-Aid recipient since 1993, Dr. Lazoryak has contributed over 490 patterns to the PDF, with 98% of those being of “star” quality.
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Bogdan Lazoryak (L), Tom Blanton (R)
   

Finally, the ICDD was pleased to announce the recipients of the 2010 Hanawalt Award: Simon Billinge, Columbia University, NY, and Takeshi Egami, University of Tennessee at Knoxville, TN. Recognized for their groundbreaking results in the interpretation of diffuse scattering in terms of pair distribution functions, both gentlemen will receive their award at the Plenary Session of the 2010 Denver X-ray Conference (DXC).  A special session has been created within the DXC Program, Nanostructure Studies Using the Atomic Pair Distribution Function, where Drs. Billinge and Egami will present their works as the lead presentations.

Congratulations to all the 2010 award recipients!

 

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