icdd  
 The International Centre for Diffraction Data

Volume 8 Issue 4

Educational Events Newsletter

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Educational Events Newsletter

 

ICDD held many successful educational programs this year, which drew significant international attendance. With representation from 22 countries, our educational programs began in the spring with a weeklong Practical X-ray Fluorescence Clinic. In the summer months, ICDD offered Fundamentals and Advanced Methods in X-ray Powder Diffraction Clinics and held the 59th Annual Denver X-ray Conference. ICDD concluded the year with two specialized workshops in the fall. A three-day workshop for Specimen Preparation for X-ray Fluorescence was offered, followed by a weeklong Rietveld Refinement & Indexing Workshop. Overall, it was a successful year in educating and informing those interested in both X-ray fluorescence spectrometry and X-ray powder diffractometry.


ICDD Clinics

This year, ICDD held three hands-on clinics at their headquarters in Newtown Square, PA. The clinics included Practical X-ray Fluorescence, 3-7 May; Fundamentals of X-ray Powder Diffraction, 7-11 June; and Advanced Methods in X-ray Diffraction, 14-18 June. Attendees were offered an opportunity to gain theoretical knowledge and practical applications with instructors who have extensive knowledge and experience in their respective fields of expertise. The clinics also offered attendees a forum for networking with others working in similar environments.

Read more about ICDD’s Clinics

 

Faculty and Attendees of the Fundamentals of X-ray Powder Diffraction Clinic
Faculty and Attendees of the Fundamentals of X-ray Powder Diffraction Clinic
Faculty and Attendees of the Advanced Methods in X-ray Diffraction Clinic
Faculty and Attendees of the Advanced Methods in X-ray Diffraction Clinic
   
Faculty and Attendees of the Practical X-ray Fluorescence Clinic
Faculty and Attendees of the Practical X-ray Fluorescence Clinic
   

The 59th Annual Denver X-ray Conference

This year’s Denver X-ray Conference (DXC) was held 2-6 August 2010, in Denver, CO at the Denver Marriott Tech Center Hotel. It was a joint conference with the first meeting of the North American Core Shell Spectroscopy Conference (NACSSC). Together, the meetings attracted more than 300 attendees and nearly 160 exhibit staff.

On Monday and Tuesday of conference week, 16 tutorial workshops were held for DXC. On Tuesday morning, NACSSC also held a workshop entitled, Using FEFF to Model Real-World Systems.

On Wednesday, Thursday, and Friday morning, DXC sessions were held; the plenary session, The Greening of X-rays: X-rays and Renewable Energy took place on Wednesday. During the plenary session, several awards were presented. The 2010 Birks Award was presented to Victor Buhrke, Consultant, Portola Valley, CA in honor of his decades of significant contributions to the field of X-ray spectrometry.

Dr. Victor Buhrke and Dr. Robert Snyder
Dr. Victor Buhrke and Dr. Robert Snyder
   

A triennial award, the Hanawalt Award, was also given at this year’s conference to Takeshi Egami, University of Tennessee and Simon Billinge, Columbia University. Drs. Egami and Billinge were honored for their brilliant work in developing and extending the technique of Pair Distribution Function analysis of non-Bragg structures as exemplified in their book, "Underneath the Bragg Peaks".

Also, a tribute was made in memory of Gordon S. Smith who recently passed away.

NACSSC also held sessions, which began on Tuesday afternoon with the Stern Symposium, honoring Edward A. Stern. The joint meeting was so successful that NACSSC will hold their 2nd Annual meeting in conjunction with the 2011 DXC in Colorado Springs, CO.

For details on both conferences, read the complete summary of DXC & NACSSC 2010.

Dr. Simon BIllinge, Dr. Thomas Blanton, Dr. Takeshi Egami
Dr. Simon BIllinge, Dr. Thomas Blanton, Dr. Takeshi Egami

 

   

Specialized Workshops

ICDD also offered two specialized workshops – Specimen Preparation for X-ray Fluorescence and Rietveld Refinement & Indexing. Students attending Specimen Prep were offered the opportunity to perfect their specimen preparation techniques under the guidance of our expert faculty. Those who attended the Rietveld Workshop had a unique opportunity to learn the principles of Rietveld analysis and to gain hands-on experience with Rietveld problem-solving techniques.

Learn more about ICDD’s specialized workshops

 

Students at the Specimen Preparation for X-ray Fluorescence Workshop
Students at the Specimen Preparation for X-ray Fluorescence Workshop
Dr. Joel Reid lecturing at the Rietveld Refinement & Indexing Workshop
Dr. Joel Reid lecturing at the Rietveld Refinement & Indexing Workshop
   

 

 

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