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ICDD Newsletter Volume 9 Issue 5
ICDD 2011 Educational Programs

The ICDD Educational Programs are well underway for the 2011 year, with clinics and conferences drawing in significant international attendance. The 2011 Educational Programs kicked off in May with a weeklong Practical X-ray Fluorescence Clinic. Also in May, the 10th Annual Pharmaceutical Powder X-ray Diffraction Symposium was held in Lyon, France. In June, ICDD offered Fundamentals and Advanced Methods in X-ray Powder Diffraction Clinics. In August, the 60th Annual Denver X-ray Conference took place in Colorado Springs, CO.

ICDD Clinics

DXC CAkeEach of ICDD’s hands-on clinics was held at headquarters in Newtown Square, PA, which included Practical X-ray Fluorescence, 2 – 6 May; Fundamentals of X-ray Powder Diffraction, 6 – 10 June; and Advanced Methods in X-ray Diffraction, 13 – 17 June. The clinic instructors, all of whom have years of experience in their respective fields, provided attendees with an environment to help develop theoretical and practical skills. The clinics also gave attendees a platform for networking with others working in a similar field. Overall, clinic attendance was both domestic and international, with attendees traveling from countries such as Saudi Arabia, Mexico, Colombia and Israel. Our instructors received outstanding feedback from the attendees’ course evaluations, commensurate with their dedication and the low teacher-to-student ratio.

Read more about the ICDD Clinics.


The 10th Pharmaceutical Powder X-ray Diffraction Symposium

The 10th Pharmaceutical Powder X-ray Diffraction Symposium (PPXRD-10) was successfully completed at the Radisson BLU Hotel in Lyon, France from the 16th to the 19th of May 2011. A wide spectrum of planned events was carried out for the symposium. In addition to the vendor exhibits and a poster session, there was a one-day workshop on pharmaceutical amorphous materials on the 16th, followed by two and one-half days of technical presentations.  On May 19th, attendees had the chance to participate in a half-day excursion to the European Synchrotron Radiation Facility in Grenoble, France. Attendees came from thirteen different countries – Belgium, Czech Republic, France, Germany, Israel, Italy, Japan, Latvia, Mexico, the Netherlands, Sweden, United Kingdom, and United States.


Read more about PPXRD 10.

60th Annual Denver X-ray Conference

DXC CAkeThe 60th Annual Denver X-ray Conference (DXC) was held in Colorado Springs, Colorado, home of the Garden of the Gods, Cave of the Winds, and the Royal Gorge Bridge. The event was hosted at the Crowne Plaza Colorado Springs hotel from 1-5 August 2011. The meeting attracted nearly 330 attendees and 130 exhibit staff. This year marked the 60th anniversary of the conference, and to celebrate, ICDD held an anniversary reception on Wednesday evening, offered a t-shirt giveaway, and recounted conference history via a timeline.

Conference week began with 16 half-day tutorial workshops for DXC, held on Monday and Tuesday. Sixteen half-day oral sessions were held Wednesday, Thursday and Friday morning. The Plenary Session, Foods & Drugs, took place on Wednesday morning and was organized by Timothy Fawcett, International Centre for Diffraction Data and Mary Ann Zaitz, IBM.

(Paul Predecki receives Jenkins Award from Tim Fawcett)

At the Plenary Session, the 2011 Jenkins Award was presented to Dr. Paul K. Predecki, University of Denver. He received the honor for his contributions to the development of X-ray methods for a wide variety of materials, and his generosity in teaching and inspiring others in X-ray materials analysis both at the University of Denver and through organization and management of the Denver X-ray Conference. His contributions include methods for residual stress measurement, X-ray depth profiling, and determining plastic deformation in metals, ceramics, biomaterials, polymers and their composites.

The 2011 Barrett Award was also presented during the Plenary Session to Dr. Juan Rodriques-Carvajal, Institute Laue-Langevin, Grenoble, France to honor his exceptional contributions to the field of X-ray diffraction. In particular, he was cited for his work on characterization of the structural and magnetic properties of strongly correlated oxides using diffraction techniques and for writing and freely disseminating FULLPROF, the most widely used Rietveld refinement program for analysis of crystallographic and magnetic structures. Dr. Rodriques-Carvajal was unable to travel to the meeting, so the award was accepted on his behalf by Anne Bonnin, ESRF, Grenoble, France.

(Cev Noyan presents Vallerie Ann Innis-Samson with the Jerome B. Cohen Award)

The 2011 Jerome B. Cohen Student Award was given to Vallerie Ann Innis-Samson, University of Tsukuba, Ibaraki, Japan, for her work, X-ray Reflection Tomography: A New Tool for Surface Imaging. The award recognizes the outstanding achievements of student research in the field of X-ray analysis.

After the awards were presented, the Plenary Session included talks on chocolate, whiskey, wine and drugs. The four speakers, Alejandro Marangoni, Peter Palmer, Peter Wobrauschek and Greg Stephenson blended the materials science analysis and history of these materials, and showed how they affect our daily lives.

To read more about DXC 2011, check out the complete summary.

Upcoming Educational Events

ICDD will conclude its educational events for 2011 with two specialized workshops. New for 2011, ICDD is offering a three-day Handheld XRF Workshop. The workshop will focus on theory and basic physics; use of live equipment; hands-on laboratory analyses; advantages & limitations of a handheld unit;  and choosing the best instrumentation & accessories for a particular application. Such applications include metal sorting; RoHS WEEE; lead in paint; forensics; cultural heritage; environmental analysis; and mineral, mining & soil exploration. It is scheduled for 11 – 13 October 2011, and it’s not too late to register.

Read more about the Handheld XRF workshop.

ICDD also offers Basic Rietveld Refinement & Indexing, 17 – 19 October 2011 and Advanced Rietveld, 20 – 21 October 2011. Those who attend the Rietveld workshops will have the unique opportunity to learn the principles of Rietveld analysis and gain hands-on experience with Rietveld problem-solving techniques. Register for Rietveld workshops today.

Learn more about the Rietveld workshops.




Handheld XRF Workshop
11-13 October 2011

Rietveld Refinement & Indexing 1 & 2
17-21 October 2011

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