Contact: H. McDonnell
Phone: (610) 325-9814
Fax: (610) 325-9823

Contact Info

ICDD Press Release

2012 ICDD Educational Training XRF & XRD

February 1, 2012

Practical XRF & XRD Training by the Industry’s Leading Experts!
Sponsored by the International Centre for Diffraction Data

Practical X-ray Fluorescence Spectrometry  - 30 April - 4 May 2012
Experience a unique blend of WDX & EDX topics from basic theory to practical applications along with cutting-edge equipment demonstrations (TXRF, handheld XRF, fusions, bench-top and floor units).          

Fundamentals of X-ray Powder Diffraction - 4-8 June 2012
Discover methods to improve your analysis skills through theoretical lectures and practical hands-on workshops. 

Advanced Methods in X-ray Powder Diffraction - 11-15 June 2012
Take your XRD skills to the next level with our advanced topics, including an introduction to the Rietveld Refinement Method and methods for quantitative analysis.

Basic Rietveld Refinement & Indexing - 1-3 October 2012
Advanced Rietveld Refinement & Indexing - 4-5 October 2012
Learn the principles and techniques of Rietveld analysis through intensive hands-on data analysis training.

Handheld XRF Workshop - 16-18 October 2012
This 3-day workshop is designed for current users who are seeking best methods and optimized results.  It is also designed to provide basic theory and applications for those interested in understanding the best instrumentation and accessories for a particular application.

Register today at: www.icdd.com/education

Contact: Eileen Jennings, Education Coordinator
E-mail: clinics@icdd.com  / Tel: + 610-325-9814

RELEASE #020112/199

This press release is being delivered to keep you up-to-date on the ICDD organization. As a representative for ICDD, we would appreciate your assistance in sharing this press release with colleagues and societies with which you are affiliated. Thank you for your assistance in promoting ICDD.

If you wish to change or remove your email address, please contact mcdonnell@icdd.com

View this email online

ICDD and PDF are registered in the U.S. Patent and Trademark Office.
The ICDD logo, Powder Diffraction File and Denver X-ray Conference are trademarks of the JCPDS—International Centre for Diffraction Data.

International Centre for Diffraction Data
12 Campus Boulevard
Newtown Square, PA 19073