The International Centre for Diffraction Data

Press Release 030806/153

ICDD Introduction | Press Release 030806/153 - Members

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Press Release 030806/153 - Rietveld Refinement & Indexing Workshop

Rietveld Refinement & Indexing Workshop
27-29 September 2006
Sponsored by the International Centre for Diffraction Data
Newtown Square, Pennsylvania, U.S.A.

Learn the principles and techniques of Rietveld analysis at ICDD's specialized three-day workshop. Reinforce your learning experiences with our hands-on data analysis training!

Discover the Rietveld method as a powerful tool for:

  • Extracting structural information from powder patterns
  • Performing quantitative phase analysis
  • Obtaining microstructural information

Our collaborations with the Material Phases Data System and the National Institute of Standards and Technology as well as our own Grant-in-Aid Program have provided atomic coordinates and related parameters to ICDD's new database: PDF-4+. This workshop will focus on the expanded quantitative analysis capabilities of PDF-4+.

Let the experts guide and advise you through the problem solving techniques to maximize the quality of your results!

For more information contact Leah Mooney at +610-325-9814, e-mail: or visit



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