The International Centre for Diffraction Data

Press Release 030806/153

ICDD Introduction | Press Release 030806/153 - Members

Dear ICDD Member:
Please find below a News Release from the International Centre for Diffraction Data. This press release is being delivered to keep you up-to-date on the ICDD organization. As a representative for ICDD, we would appreciate your assistance in sharing this press release with colleagues and societies with which you are affiliated. Thank you for your assistance in promoting ICDD. If this email has reached the wrong person, please notify me so I may make the proper corrections. To view this on the web click here.

Helen McDonnell, Marketing Associate (mcdonnell@icdd.com

 
Press Release 030806/153 - Rietveld Refinement & Indexing Workshop
 

Rietveld Refinement & Indexing Workshop
27-29 September 2006
Sponsored by the International Centre for Diffraction Data
Newtown Square, Pennsylvania, U.S.A.

Learn the principles and techniques of Rietveld analysis at ICDD's specialized three-day workshop. Reinforce your learning experiences with our hands-on data analysis training!

Discover the Rietveld method as a powerful tool for:

  • Extracting structural information from powder patterns
  • Performing quantitative phase analysis
  • Obtaining microstructural information

Our collaborations with the Material Phases Data System and the National Institute of Standards and Technology as well as our own Grant-in-Aid Program have provided atomic coordinates and related parameters to ICDD's new database: PDF-4+. This workshop will focus on the expanded quantitative analysis capabilities of PDF-4+.

Let the experts guide and advise you through the problem solving techniques to maximize the quality of your results!

For more information contact Leah Mooney at +610-325-9814, e-mail: clinics@icdd.com or visit www.icdd.com/education


 


 

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