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International Centre for Diffraction Data
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ICDD 2010 Distinguished Fellow, James Kaduk
May 12, 2010
This year, the ICDD Board of Directors recognized James Kaduk, Naperville, IL, as the 2010 Distinguished Fellow. This award is given to a member who has given long and meritorious service to the ICDD.
Both the ICDD and the scientific community have benefitted from Dr. Kaduk’s long and distinguished career in the X-ray analysis field. Known internationally for his leadership in structural analysis from powder diffraction and allied quantum and computational techniques, Dr. Kaduk has generously shared his knowledge and expertise over the last several decades through his volunteer efforts within the ICDD. He has served in numerous leadership roles, as Chairman of various Committees and Subcommittees, to Chairman of the Board of Directors. Dr. Kaduk also shared the vision and implementation, along with several other ICDD leaders, of transforming the direction of the organization by interlinking the Powder Diffraction File™ with other scientific databases. The current state of the PDF® has been greatly influenced by Dr. Kaduk’s vital contributions.
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