Contact: H. McDonnell
International Centre for Diffraction Data
Phone: (610) 325-9814
Fax: (610) 325-9823
12 Campus Boulevard
Newtown Square, PA 19073
Contact Info

ICDD Press Release

ICDD 2009 Fellow Awards

July 7, 2009

John A. Anzelmo
John A. Anzelmo of Anzelmo and Associates, Inc., Madison, Wisconsin, was recently named an ICDD Fellow for his leadership in ICDD’s Educational Programs. Now the XRF Education Program Director, John began teaching at the XRF Clinics held at the State University of New York (SUNY) in Albany in the 80’s, and continued in this role as the clinics were transferred to ICDD in 1991.

John has provided leadership in the development of the clinic curriculum and customized course instruction. He launched the specialized, annual workshop, “Specimen Preparation for XRF”, the first hands-on training program of its kind, back in 2006. John’s many years of experience have provided him with a wealth of theoretical and practical knowledge, which he generously shares through his interactions with students, via lectures, workshops, or one-on-one networking discussions.

John’s commitment to education is not limited to ICDD activities. He serves as a frequent instructor and speaker at the Annual Denver X-ray Conference, where he also contributes his expertise as a member of the conference’s Organizing Committee.


Larry Arias
Manager XRF – US Applications, Larry Arias of Bruker AXS, Inc., Madison, Wisconsin, was also named an ICDD Fellow. Larry has also played an active role in the ICDD XRF Education Programs; through this award, he is recognized for his many years of leadership and dedication.

Larry began teaching the XRF Clinics when they were held at the State University of New York (SUNY) in Albany, and again later when they were moved to ICDD. In the early years at ICDD, the XRF Clinic was held in two sessions, in which Larry participated. Through his guidance and assistance, the two sessions were later blended into a single course, “Practical X-ray Fluorescence.” Larry was also instrumental in the development of ICDD’s specialized, laboratory-based, and almost entirely hands-on workshop, “Specimen Preparation for XRF.”  In this course, unparallelled in applied XRF, students learn how to prepare samples in several different ways, and directly see how the preparation methods affect the results.

With over 30 years of experience in the XRF field, Larry has been exposed to a broad range of analytical challenges in XRF. From his vast knowledge base and commitment to education, Larry continues to successfully train spectroscopists through ICDD’s educational venues, as well as those of Bruker AXS.


Mark Rodriguez
Mark Rodriguez, a Principal Member of the Materials Characterization Department of Sandia National Laboratories in Albuquerque, New Mexico, was awarded the title of ICDD Fellow at the Annual Meeting of Members. Mark was honored for his efforts in XRD Education, namely the XRD Clinic, “Fundamentals of X-ray Powder Diffraction." Mark joined the Clinic faculty team back in 2000 and has significantly contributed to the course content in both quality and execution.

Mark possesses a unique ability to engage students by incorporating everyday items, such as candy, party whistles, cat toys, film clips, etc. into his lectures and workshops to illustrate diffraction concepts. The end result is a deeper understanding of complex concepts, along with a fun, memorable experience! As a tremendous asset to our teaching team, Mark interacts well with students and colleagues alike.
Mark often participates as an instructor and speaker at the Denver X-ray Conference. He currently serves on the Board of Directors as a Director-at-large.

RELEASE #070709/182

This press release is being delivered to keep you up-to-date on the ICDD organization. As a representative for ICDD, we would appreciate your assistance in sharing this press release with colleagues and societies with which you are affiliated. Thank you for your assistance in promoting ICDD.

If you wish to change or remove your email address, please contact mcdonnell@icdd.com

View this email online

ICDD and PDF are registered in the U.S. Patent and Trademark Office.
The ICDD logo, Powder Diffraction File and Denver X-ray Conference are trademarks of the JCPDS—International Centre for Diffraction Data.

www.icdd.com - www.dxcicdd.com