Press Release 072304/141
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| The International Centre for Diffraction Data |
Press Release 072304/141 |
| ICDD Introduction | Press Release 072304/141 - Members | |
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Dear ICDD Member: Please find below a News Release from the International Centre for Diffraction Data as well as an attachment for printing. This press release is being delivered to keep you up-to-date on the ICDD organization. As a representative for ICDD, we would appreciate your assistance in sharing this press release with colleagues and societies with which you are affiliated. Thank you for your assistance in promoting ICDD. If this email has reached the wrong person, please notify me so I may make the proper corrections. To view this on the web click here. Helen McDonnell, Marketing Associate (mcdonnell@icdd.com) |
| Press Release 072304/141 - ICDD Announces HANAWALT AWARD | |
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ROBERT L. SNYDER TO RECEIVE THE J.D. HANAWALT AWARD The International Centre for Diffraction Data takes pleasure in announcing that Dr. Robert L. Snyder, of Georgia Institute of Technology, Atlanta, Georgia, U.S.A. has been selected to receive the 2004 J.D. Hanawalt Award for excellence in the field of X-ray powder diffraction. Dr. Snyder will present the Hanawalt Award Lecture entitled, “The Evolution of Total Pattern Analysis” at the 53rd Annual Denver X-ray Conference in Steamboat Springs, Colorado, U.S.A., 4 August 2004. The presentation of the award will precede the lecture. The J.D. Hanawalt Award is presented every three years for important, recent contributions to the field of X-ray powder diffraction and phase identification published within the last several years. The award consists of a commemorative plaque, an honorarium, and travel funds to attend the meeting at which the award and lecture will be presented. Previous recipients of this prestigious award include: Raymond P. Goehner
and Joseph R. Michael, 2001; Herbert Göbel, 1998; Daniel Louër,
1992; William Parrish, 1986; and Ludo K. Frevel, 1983. |
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