The International Centre for Diffraction Data

Press Release 072304/141

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Press Release 072304/141 - ICDD Announces HANAWALT AWARD
 

ROBERT L. SNYDER TO RECEIVE THE J.D. HANAWALT AWARD

The International Centre for Diffraction Data takes pleasure in announcing that Dr. Robert L. Snyder, of Georgia Institute of Technology, Atlanta, Georgia, U.S.A. has been selected to receive the 2004 J.D. Hanawalt Award for excellence in the field of X-ray powder diffraction.

Dr. Snyder will present the Hanawalt Award Lecture entitled, “The Evolution of Total Pattern Analysis” at the 53rd Annual Denver X-ray Conference in Steamboat Springs, Colorado, U.S.A., 4 August 2004. The presentation of the award will precede the lecture.

The J.D. Hanawalt Award is presented every three years for important, recent contributions to the field of X-ray powder diffraction and phase identification published within the last several years. The award consists of a commemorative plaque, an honorarium, and travel funds to attend the meeting at which the award and lecture will be presented.

Previous recipients of this prestigious award include: Raymond P. Goehner and Joseph R. Michael, 2001; Herbert Göbel, 1998; Daniel Louër, 1992; William Parrish, 1986; and Ludo K. Frevel, 1983.


 

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