The International Centre for Diffraction Data

Press Release 072507/165

ICDD Introduction | Press Release 072507/165 - Members

Dear ICDD Member:
Please find below a News Release from the International Centre for Diffraction Data. This press release is being delivered to keep you up-to-date on the ICDD organization. As a representative for ICDD, we would appreciate your assistance in sharing this press release with colleagues and societies with which you are affiliated. Thank you for your assistance in promoting ICDD. If this email has reached the wrong person, please notify me so I may make the proper corrections. To view this on the web click here.

Helen McDonnell, Marketing Administrator (mcdonnell@icdd.com

 
Press Release 072507/165 - Dr. Cyrus Crowder
 

:The ICDD welcomes new employee Dr. Cyrus Crowder.



Dr. Cyrus Crowder

Dr. Cyrus Crowder - Principal Scientist

Dr. Cyrus Crowder will be joining the ICDD as Principal Scientist in September. Cyrus is retiring from his current position as the Technology Steward for X-ray Diffraction and Tomography at The Dow Chemical Company after 25 years of service. Cyrus has a long association with the ICDD. He became an ICDD member in 1987, was named an ICDD Fellow in 2000, and served on the Board of Directors between 1994 and 1998. As an ICDD member, he has previously chaired the Diffraction Problems Subcommittee, Search/Match Subcommittee, Scholarship Committee, and Long Range Planning Committee.

Cyrus received his B.S. in Chemistry at the University of Missouri-Rolla in 1976 and followed that with two years of teaching high school physical sciences and mathematics in Missouri. He returned to the University of Missouri-Rolla to receive an M.S. degree in Physical Chemistry in 1980 and a Ph.D. in 1982 using neutron diffraction to do structural studies on magnetic intermetallics and their hydrides. Dr. Crowder joined the Dow Chemical Company in 1982, and has been active in the field of X-ray diffraction since that time. He was co-winner of an IR-100 award in 1987 for his work on the development of the combination DSC/XRD instrument and co-winner of the International Zeolite Association Breck Award in 1989 for his determination of the structure of VPI-5, a molecular sieve with the largest known pores at the time. During his career, Cyrus has utilized X-ray powder diffraction technology for various research, production, and customer service applications. Most recently, he has served on Dow's Global Inorganic Analysis Technology Leadership Team as Technology Steward for X-ray diffraction and tomography, and as representative for Dow on the DND-Cat BoD at the APS synchrotron at Argonne National Laboratory. 

Cyrus brings to the ICDD an extensive experience with X-ray, neutron and synchrotron diffraction as applied to a wide variety of industrial applications in catalysts, electronics, pharmaceuticals and polymers. At ICDD, he will utilize these experiences in directing ICDD's Science Department in developing database technology and future products.


 


 

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