PPXRD-4 Summary

Culturally rich Barcelona, Spain was the location for the 4th Pharmaceutical Powder X-ray Diffraction Symposium, 21-24 February 2005. This is the first year that the ICDD hosted PPXRD in Europe, which proved to be quite successful. Attracting 62 attendees representing 20 countries, PPXRD will now be held every second year in Europe.

The symposium week began with an optional workshop entitled, “Indexing Powder Patterns and Rietveld Structural Refinement.” The 21 workshop participants experienced invaluable hands-on software demonstrations by the talented Dr. Daniel Louër, University of Rennes, Rennes, France and Dr. John Faber and Dr. Fangling Needham, International Centre for Diffraction Data, Newtown Square, PA, U.S.A. The programs used during the workshop are FullProf_Suite for the Indexing workshop and GSAS for the Rietveld workshop.

22 February 2005 marked the beginning of the two and a half day symposium. During the symposium 17 contributed talks were presented along with eight invited talks and 13 poster presentations. The session topics along with the invited speakers are as follows:

Session: Formulation, Product Development, Drug Delivery and Polymorph & Salt Screening
Invited Talk: An Overview of Methods and Strategies for High-Throughput Polymorph Screening: Crystallisation, Diffractometry and Data Analysis, Christian Lehmann, Max-Planck Institut fuer Kohlenforschung, Muelheim an der Ruhr, Germany

Session: X-rays in Drug Research and Discovery
Invited Talk: X-ray Diffraction Applied to Drug Development-An Overview, Franck Leveiller, AstraZeneca R&D, Lund, Sweden

Session: XRPD Structural Techniques
Invited Talks:: Watching the Action and Getting the Most From Your Data, W.I.F. David, Rutherford Appleton Laboratory, Oxon, U.K. and High-Throughput Structure Determination, High-Quality Structure Refinement, Kenneth Shankland, Rutherford Appleton Laboratory, Oxon, U.K.

Session: Complementary Techniques
Invited Talk:: How High-Resolution X-ray Powder Diffraction Should Help the Construction of Topological p-T Diagrams Leading to the Stability Hierarchy of Polymorphs, René Céolin, Université René Descartes, Paris, France

Session: Patent and Regulatory Issues
Invited Talks: A Patent Primer for the Pharmaceutical Scientist, Eyal Barash, Finnegan, Henderson, Farabow, Garrett and Dunner, LLP, Washington, D.C., U.S.A., The European XRPD Standard and its Relevance to the Practitioner, Steve Norval, Measurement Science Group, Redcar, U.K. and Patent and Regulatory Issues-The European Perspective, Trevor Cook, Bird and Bird, London, England

Scientific discussions among the participants continued through the evening at the poster session, reception and exhibition. This informal event, featuring libations and a fabulous array of Tapas, gave participants a chance to speak with the exhibitors present at PPXRD. These exhibitors included Bruker AXS GmbH, G.N.R. Analytical Instruments, International Centre for Diffraction Data, PANalytical and Zinsser Analytic GmbH.

The ICDD wishes to extend a special thank you to PANalytical and X-ray Optical Systems for sponsoring coffee breaks during PPXRD.

The success of PPXRD will continue annually in February of each year rotating between a U.S. location and Europe, so please mark your calendars! PPXRD-5 in 2006 will be held in the Philadelphia/New Jersey corridor.

For more information on past and future PPXRD symposia, please contact Leah Mooney – mooney@icdd.com

To receive a brochure e-mail your mailing address to ppxrd@icdd.com.

PPXRD Thanks the following sponsors:

Click on the thumbnails to see the larger version of images from the PPXRD-4 in Barcelona:


Information on Past PPXRD Symposiums
PPXRD-3, February 23-25, 2004
PPXRD-2, December 9-12, 2002
PPXRD-1 - September 27-29, 1999

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