 PPXRD-4 Summary
Culturally rich Barcelona, Spain was the location for the 4th
Pharmaceutical Powder X-ray Diffraction Symposium, 21-24 February 2005. This
is the first year that the ICDD hosted PPXRD in Europe, which proved to be
quite successful. Attracting 62 attendees representing 20 countries, PPXRD
will now be held every second year in Europe.
The symposium week
began with an optional workshop entitled, “Indexing
Powder Patterns and Rietveld Structural Refinement.” The 21 workshop
participants experienced invaluable hands-on software demonstrations by the
talented Dr. Daniel Louër, University of Rennes, Rennes, France and
Dr. John Faber and Dr. Fangling Needham, International Centre for Diffraction
Data, Newtown Square, PA, U.S.A. The programs used during the workshop are
FullProf_Suite for the Indexing workshop and GSAS for the Rietveld workshop.
22 February 2005 marked the beginning of the two and a half day symposium.
During the symposium 17 contributed talks were presented along with eight
invited talks and 13 poster presentations. The session topics along with
the invited speakers are as follows:
Session: Formulation, Product
Development, Drug Delivery and Polymorph & Salt
Screening
Invited Talk: An Overview of Methods and Strategies
for High-Throughput Polymorph Screening: Crystallisation, Diffractometry and
Data Analysis, Christian Lehmann,
Max-Planck Institut fuer Kohlenforschung, Muelheim an der Ruhr, Germany
Session: X-rays in Drug Research and Discovery
Invited Talk: X-ray Diffraction Applied
to Drug Development-An Overview, Franck
Leveiller, AstraZeneca R&D, Lund, Sweden
Session: XRPD Structural Techniques
Invited Talks:: Watching the Action and
Getting the Most From Your Data, W.I.F. David, Rutherford Appleton Laboratory,
Oxon, U.K. and High-Throughput Structure
Determination, High-Quality Structure Refinement, Kenneth Shankland, Rutherford
Appleton Laboratory, Oxon, U.K.
Session: Complementary Techniques
Invited Talk:: How High-Resolution X-ray
Powder Diffraction Should Help the Construction of Topological p-T Diagrams
Leading to the Stability Hierarchy
of Polymorphs, René Céolin, Université René Descartes,
Paris, France
Session: Patent and Regulatory Issues
Invited Talks: A Patent Primer for the
Pharmaceutical Scientist, Eyal Barash, Finnegan, Henderson, Farabow, Garrett and Dunner,
LLP, Washington, D.C.,
U.S.A., The European XRPD Standard and its Relevance to the Practitioner,
Steve Norval, Measurement Science Group, Redcar, U.K. and Patent and Regulatory
Issues-The European Perspective, Trevor Cook, Bird and Bird, London, England
Scientific
discussions among the participants continued through the evening at the
poster session, reception and exhibition. This informal event, featuring
libations and a fabulous array of Tapas, gave participants a chance to
speak with the exhibitors present at PPXRD. These exhibitors included Bruker
AXS GmbH, G.N.R. Analytical Instruments, International Centre for Diffraction
Data, PANalytical and Zinsser Analytic GmbH.
The ICDD wishes to extend
a special thank you to PANalytical and X-ray Optical Systems for sponsoring
coffee breaks during PPXRD.
The success of PPXRD
will continue annually in February of each year rotating between a U.S.
location and Europe, so please mark your calendars! PPXRD-5 in 2006 will
be held in the Philadelphia/New Jersey corridor.
For more information
on past and future PPXRD symposia, please contact Leah Mooney – mooney@icdd.com
To receive a brochure e-mail your mailing address to ppxrd@icdd.com. |
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PPXRD Thanks the following sponsors:
Click on the thumbnails to see the larger version of images from the PPXRD-4
in Barcelona:
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