Sponsored by:

 

Media Partners:

Monday, 19 February

Optional Workshop
Exercises in Quantitative Phase Identification

Tuesday, 20 February

Time Type Title of Paper Speaker & Affiliation
9.00-9.30   WELCOMING REMARKS & INTRODUCTIONS John Faber, International Centre for Diffraction Data, Newtown Square, Pennsylvania, USA
  XRPD Structural Techniques (Acquisition and Use of XRPD Data, Indexing, Structure Determination, Rietveld Refinement)
Session Chair: A. Kern, Bruker AXS GmbH, Karlsruhe, Germany
9.30-10.30 Invited QUANTITATIVE PHASE ANALYSIS OF PHARMACEUTICAL COMPOUNDS BY THE WHOLE-PATTERN DECOMPOSITION METHODS Didier Clénet, Sanofi-Aventis, Vitry-sur-Seine, France
10.30-11.00 Contributed DO 'STANDARD' DIRECT METHODS STILL HAVE A ROLE TO PLAY IN XRPD STRUCTURE DETERMINATION OF MOLECULAR SOLIDS? Kenneth Shankland, CCLRC, Rutherford Appleton Lab, Chilton, Oxon, UK
11.00-11.30 Break    
11.30-12.00 Contributed RE-EXAMINING STRUCTURE AND CRYSTALLINITY IN CELLULOSE Timothy Fawcett, International Centre for Diffraction Data, Newtown Square, PA, USA
12.00-12.30 Contributed STRUCTURE ANALYSIS FROM POWDER DIFFRACTION DATA SUPPORTED BY TOTAL ENERGY CALCULATIONS Max Petersen, Accelrys, Inc., San Diego, CA, USA
  Powder Diffraction Using Synchrotron Sources for Pharmaceutical Problems
Chair: P. Stephens, Stony Brook University, Stony Brook, NY, USA
12.30-13.30 Invited POWDER DIFFRACTION USING SYNCHROTRON SOURCES FOR PHARMACEUTICAL PROBLEMS Peter Stephens, Stony Brook University, Stony Brook, NY, USA
13.30-15.00 Lunch    


Afternoon Complementary Techniques
Session Chair: R. Suryanarayanan, University of Minnesota, College of Pharmacy, Minneapolis, MN, USA
Time Type Title of Paper Speaker & Affiliation
15.00-16.00 Invited COMBINED XRD AND RAMAN COMBINATORIAL SCREENING Arnt Kern, Bruker AXS, Karlsruhe, Germany
16.00-16.30 Break    
16.30-17.00 Contributed X-RAY DIFFRACTION AND COMPLEMENTARY ANALYTICAL TECHNIQUES INCLUDING MICROSCOPY, RAMAN, AND SMALL ANGLE X-RAY SCATTERING Linda Sauer, University of Minnesota, Minneapolis, MN, USA
17.00-17.30 Contributed HOW TO COMBINE PXRD, RAMAN AND OTHER 1-D DATA IN HIGH THROUGHPUT POLYMORPH/SALT/CO-CRYSTAL STUDIES Christopher Gilmore, University of Glasgow, Glasgow, Scotland, UK


Evening (18.30-21.00)                                                    Poster Session
Title of Paper Speaker & Affiliation
USAGE OF AN ADVANCED FULLPAT METHOD TO QUANTIFY AMORPHOUS MATERIAL Detlef Beckers, PANalytical, Almelo, The Netherlands
WHEN KEEN OBSERVATION SAVES YOU MONEY Zvicka Deutsch, Ben Gurion University of the Negev, Be'er Sheva, Israel
VALIDATING CRYSTAL STRUCTURES SOLVED FROM POWDER DIFFRACTION DATA USING THE dSNAP SOFTWARE Christopher Gilmore, University of Glasgow, Glasgow, Scotland, UK
POWDER X-RAY DIFFRACTION IN THE RANGE 2 THETA < 15° (lambda = 0.154nm) Thomas Holz, AXO DRESDEN GmbH, Heidenau, Germany
XRPD FOR NONDESTRUCTIVE CHARACTERIZATION OF SOLID DOSAGE FORMS Vladimir Kogan, DANNALAB & PANalytical, Almelo, The Netherlands
X-RAY POWDER DIFFRACTION PATTERN OF IMIPENEM MONOHYDRATE Fangling Needham, International Centre for Diffraction Data, Newtown Square, PA, USA
SOLID STATE CHARACTERIZATION OF A POTENTIALLY ACTIVE BENZOTHIAZOL DERIVATIVE Marco Pallagrosi, Industria Farmaceutica Serono S.p.A., Guidonia Montecelio (RM), Italy
CRYSTAL STRUCTURE DETERMINATION FROM POWDER X-RAY DIFFRACTION DATA Liesbeth Theunissen, Johnson and Johnson Pharmaceutical Research and Development, Beerse, Belgium


Wednesday, 21 February

Morning Formulation, Product Development, Drug Delivery and Polymorph and Salt Screening
Session Chair: G. Stephenson, Eli Lilly & Company, Indianapolis, IN, USA
Time Type Title of Paper Speaker & Affiliation
9.00-10.00 Invited PRACTICAL IMPLICATIONS OF SOLID STATE ATTRIBUTES DURING DRUG DISCOVERY AND DEVELOPMENT Srini Venkatesh, Bausch & Lomb, Rochester, NY, USA
10.00-11.00 Invited USE OF X-RAY POWDER DIFFRACTOMETRY IN DRUG DISCOVERY, PREFORMULATION AND DRUG PRODUCT CHARACTERIZATION Raj Suryanarayanan, University of Minnesota, Minneapolis, MN, USA
11.00-11.30 Break    
11.30-12.00 Contributed X-RAY POWDER DIFFRACTION AT THE HEART OF PHYSICAL FORM DISCOVERY IN CPOSS Alastair Florence, University of Strathclyde, Glasgow, UK
12.00-12.30 Contributed TBD TBD
12.30-13.00 Contributed HIGH RESOLUTION, HIGH THROUGHPUT X-RAY POWDER DIFFRACTION (HR HT XRPD) EXPERIMENTS AND DATA ANALYSIS Detlef Beckers, PANalytical, Almelo, The Netherlands
13.00-13.30 Contributed QUANTITATIVE ANALYSIS OF MIXTURES USING HIGH THROUGHPUT INSTRUMENTATION WITHOUT THE USE OF STANDARDS Christopher Gilmore, University of Glasgow, Glasgow, Scotland, UK
13.30-13.30- 15.00 Lunch    


Afternoon Patent and Regulatory Issues
Chair: P.Varlashkin, GlaxoSmithKline, Durham, NC, USA
Time Type Title of Paper Speaker & Affiliation
15.00-16.00 Invited TRENDS IN SOLID FORM PATENTS: COCRYSTAL IP OPPORTUNITIES AND CHALLENGES Eyal Barash, Aptuit Consulting, West Lafayette, IN, USA
16.00-16.30 Break    
16.30-17.00   An Invitation to Participate in an XRD Round Robin John Faber, International Centre for Diffraction Data, Newtown Square, Pennsylvania, USA


Thursday, 22 February

Morning New Frontiers for XRD in Pharmaceutical R&D
Session Chair: J. Han, Novartis Institutes for Biomedical Research, Inc., Cambridge, MA, USA
Time Type Title of Paper Speaker & Affiliation
8.30-9.30 Invited CHARACTERIZATION OF INTACT PHARMACEUTICAL FILM-COATED TABLETS BY MICRODIFFRACTOMETRY Hiroyuki Yamada, Mitsubishi Pharma Co., Kamisu, Ibaraki, Japan
9.30-10.30 Invited THE ROLE OF PXRD IN QbD AND PAT Shawn Yin, Bristol-Myers Squibb Co., New Brunswick, NJ, USA
10.30-10.45 Break    
10.45-11.15 Contributed CHARACTERIZATION OF INSULIN MICROCRYSTALS IN PHARMACEUTICAL SUSPENSIONS Mathias Norrman, Novo Nordisk, Bagsvaerd, Denmark
11.15-11.45 Contributed GEOMETRY AND CONFIGURATION OF XRD SYSTEMS FOR PHARMACEUTICAL Bob He, Bruker AXS, Madison, WI, USA
11.45-12.15 Contributed NON-AMBIENT CONDITIONS X-RAY POWDER DIFFRACTION IN PHARMACEUTICAL INDUSTRY Olaf Grassmann, F. Hoffmann-La Roche, Basel, Switzerland
12.15   Q&A/Closing Remarks  


Stay Informed
For the latest symposium information:
Visit www.icdd.com/ppxrd or Phone: +610-325-9814
Fax: +610-325-9823
E-mail: ppxrd@icdd.com

To receive a brochure, e-mail your mailing address to ppxrd@icdd.com

Information on Past PPXRD Symposiums
PPXRD-5 February 14-16, 2006
PPXRD-4, February 21-24, 2005
PPXRD-3, February 23-25, 2004
PPXRD-2, December 9-12, 2002
PPXRD-1 - September 27-29, 1999

PPXRD-5 | Program | Register | Details | Abstracts | Exhibitors | Contact

 

.

     

Home | Profile | Products | Membership | Education | Resources | DXC | ToC | Contact | Search

 © 1997 - 2017 by JCPDS - International Centre for Diffraction Data®
of this page and all contents. All Rights Reserved. 
Please send any queries, comments, or suggestions to: webmaster@icdd.com

International Centre for Diffraction Data
12 Campus Boulevard
Newtown Square, PA 19073-3273 USA
PHONE: 610-325-9814
FAX: 610-325-9823
info@icdd.com