(PDF-4+ 2015, PDF-4/Minerals 2015, PDF-4/Organics 2016)
Often in materials characterization, diverse forms of diffraction are used to complement one another. Research scientists often use electron diffraction as a method for obtaining diffraction intensities from nano-scale quantities of a material when X-ray scattering is limited. Given the complimentary character of the two techniques, ICDD has developed various options and tools that enable users to specify a diffraction type (X-ray or electron) when using the PDF-4+ reference database and its search/match capabilities.
The suite of electron diffraction tools currently includes:
Users' experimental spot pattern (white spots) and graphical overlay of ED simulation of phase match from PDF-4+ (red spots). (Each simulation is interactive allowing dynamic updates to patterns by simply adjusting parameters such as zone axes, camera length, and electron voltage.)
New Capabilities: Auto-indexing of zone axis in electron diffraction spot patterns
In 2014, ICDD implemented an ability to identify the zone axis in a users' electron spot pattern. This new tool extracts spot positions (hkl's) from the users' ED spot pattern, and performs automated indexing to determine the zone axis. New in Release 2015: The d-spacings and intensities of identified spots can now be listed in table format after the scale is specified. The table can then be saved as a ASCII format file. The user may also import data and generate graphical overlays for comparisons between possible phase matches.