Detectors used in X-ray diffraction (XRD) analysis began with film, the original 2D detector. However, with the advantages of speed, sensitivity, and ease of use, 1D electronic detectors dominated XRD analysis for many years. Today, advances in materials and microelectronics have resulted in fast, affordable 2D detectors that are now commonplace in many laboratories.
A new feature in Release 2015 PDF-4 products, allows for importing 2D powder diffraction image files into ICDD’s SIeve+ phase analysis software. Images from 2D powder diffraction data collection are converted to 1D I vs. 2θ diffraction patterns, before phase identification is performed. Combining the complete 2D diffraction pattern with targeted search filters available in SIeve+ provides a very powerful analytical tool for phase identification.
- Importing of .jpg, .gif, or .png image files
- Choice of common XRD wavelengths as well as user defined XRD, electron diffraction or neutron diffraction wavelengths
- Selection of pixel size
- Adjustment of beam center position
- Adjustment of sample to detector distance
- Whole pattern or sector integration
- Automated or user defined processing of converted 1D pattern: background, smoothing, α2 stripping, and peak position
- Phase identification using common or user targeted search filters