2D Diffraction

Detectors used in X-ray diffraction (XRD) analysis began with film, the original 2D detector. However, with the advantages of speed, sensitivity, and ease of use, 1D electronic detectors dominated XRD analysis for many years. Today, advances in materials and microelectronics have resulted in fast, affordable 2D detectors that are now commonplace in many laboratories.

The PDF-4 products have the ability to import 2D powder diffraction files into ICDD’s SIeve+ phase analysis software. These 2D powder diffraction patterns are converted to 1D 2θ vs. I diffraction patterns before phase identification is performed. Combining the complete 2D diffraction pattern with targeted search filters available in SIeve+ provides a very powerful analytical tool for phase identification.

Features include:

  • Importing 2D image files (*.jpg, *.gif, *.png, and *.tif-new!)
  • Importing 2D binary files (Bruker, Rigaku, and DECTRIS PILATUS-new!). Support for importing multiple “frame” files simultaneously is also included.
  • Choice of common XRD wavelengths as well as user defined XRD or neutron diffraction wavelengths
  • Selection of pixel size
  • Adjustment of beam center position
  • Adjustment of sample to detector distance
  • Whole pattern or sector integration
  • Automated or user defined processing of converted 1D pattern: background, smoothing, Kα2 stripping, and peak position
  • Phase identification using common or user targeted search filters

 

2D

Import and integrate multiple 2D diffraction frame files

Process the merged 1D diffraction pattern to a peak list for phase ID

 

A new feature in PDF-4 products, allows for importing 2D powder diffraction image files into ICDD’s SIeve+ phase analysis software. Images from 2D powder diffraction data collection are converted to 1D I vs. 2θ diffraction patterns, before phase identification is performed. Combining the complete 2D diffraction pattern with targeted search filters available in SIeve+ provides a very powerful analytical tool for phase identification.

Features include:

  • Importing of .jpg, .gif, or .png image files
  • Choice of common XRD wavelengths as well as user defined XRD, electron diffraction or neutron diffraction wavelengths
  • Selection of pixel size
  • Adjustment of beam center position
  • Adjustment of sample to detector distance
  • Whole pattern or sector integration
  • Automated or user defined processing of converted 1D pattern: background, smoothing, α2 stripping, and peak position
  • Phase identification using common or user targeted search filters