Search, Identify, then Quantitate
SIeve/SIeve+ are designed to work interactively with PDF-2/PDF-4 products for search, identification, and quantitative analysis using the Reference Intensity Ratio (RIR) method. In Release 2013 and later releases, a powerful new feature was added entitled “Smart I/Ic Substitution”. This feature integrates the RIR methodology with ICDD’s Quality Marks and unique quality review system for more accurate quantitative analysis. In general, the Smart I/Ic Substitution will always uses an RIR value from the highest quality, room temperature determination available. It uses ICDD’s cross-referencing system to automatically identify the best quality reference for a specific entry, then uses it in the RIR calculation.

Many new features have been added to SIeve/SIeve+ for Release 2018:

  • Set a custom Kα2 value when importing 1D experimental data, which allows you to strip a custom Kα2 profile
  • Set a 2θ zero correction when importing 1D experimental data
  • Set a scan stop line when importing custom experimental data files (good for multi-bank data)
  • Search settings (Search Algorithm, Search Window, Match Window, and Minimum GOM) are dynamically controlled directly on the SIeve/SIeve+ form
  • Search lines for the current phase are highlighted in the Lines table
  • Add/remove search lines directly on the graph
  • Set an internal standard based on one of many popular NIST Standard Reference Materials (SRM’s)
  • Customize the Matches table using any of the available display fields
  • Optional to show peak markers at top of peaks

New features were also added exclusively to SIeve+ for Release 2018:

  • Option to choose instrument parameters from synchrotron and neutron beamlines when importing 1D experimental data
  • Support for importing and analyzing time-of-flight (TOF) neutron diffraction data
    • TOF CIF’s
    • TOF GSAS files
    • Custom TOF files
  • Support for importing new 2D experimental data file formats:
    • DECTRIS PILATUS detectors (*.cbf)
    • TIFF images (*.tif)
  • Dynamically change the crystallite size for simulated diffraction patterns

The semi-quantitative analysis pie chart is always visible

Custom display fields, always-shown quantitative analysis pie chart, dynamic slider for crystallite size

Analyze time-of-flight (TOF) neutron data

2D Diffraction
Detectors used in X-ray diffraction (XRD) analysis began with film, the original 2D detector. However, with the advantages of speed, sensitivity, and ease of use, 1D electronic detectors dominated XRD analysis for many years. Today, advances in materials and microelectronics have resulted in fast, affordable 2D detectors that are now commonplace in many laboratories.

The PDF-4 products have the ability to import 2D powder diffraction files into ICDD’s SIeve+ phase analysis software. These 2D powder diffraction patterns are converted to 1D 2θ vs. I diffraction patterns before phase identification is performed. Combining the complete 2D diffraction pattern with targeted search filters available in SIeve+ provides a very powerful analytical tool for phase identification.

Features include:

  • Importing 2D image files (*.jpg, *.gif, *.png, and *.tif-new!)
  • Importing 2D binary files (Bruker, Rigaku, and DECTRIS PILATUS-new!). Support for importing multiple “frame” files simultaneously is also included.
  • Choice of common XRD wavelengths as well as user defined XRD or neutron diffraction wavelengths
  • Selection of pixel size
  • Adjustment of beam center position
  • Adjustment of sample to detector distance
  • Whole pattern or sector integration
  • Automated or user defined processing of converted 1D pattern: background, smoothing, Kα2 stripping, and peak position
  • Phase identification using common or user targeted search filters


Import and integrate multiple 2D diffraction frame files

Process the merged 1D diffraction pattern to a peak list for phase ID





SIeve/SIeve+ Technical Bulletin:

This bulletin explains the science and algorithms in the Search and Identification process. It outlines the numerous options available to optimize your results and is a practical user’s guide for use of the software.