PDF-4 Support Software

SIeve+ 2008 - Purchase

SIeve+ 2008
SIeve+, ICDD’s search indexing software for the PDF-4 product line, provides rapid searching and identification of materials using highly automated Hanawalt, Fink and Long-8 searches. While SIeve+ contains much of the functionality of ICDD’s printed index and search manuals, it takes advantage of the dynamic computing power of modern PCs to rapidly perform permuted searches on hundreds of thousands of data entries. This enables permutations with Fink and Long-8 algorithms that are impractical with print due to their enormous size. SIeve+ features an automatic rotation of the 3 strongest lines (Hanawalt) or the 8 longest of the strongest lines (Fink) or the 8 longest lines (Long 8) to look for matches that exhibit the best Goodness of Match (GOM). Historically, these rotation operations were anticipated and integrated into paper manual search-index method protocols. In SIeve+ 2008, automatic rotations can be switched on/off in Preferences. The paper manual search schema always offers a litmus test for searching, namely that all the lines in the unknown pattern are compared against all the lines in the reference pattern(s). To address this comparison, we have implemented a “Pattern GOM” that includes this comparison. The SIeve+ display allows a comparison between the standard GOM and the Pattern GOM. Extensive digitized data plotting functions allow comparisons between experimental data and SIeve+ search/match results.

SIeve+ works with files containing a list of peaks (d-spacing/2-theta and intensity pairs) or files containing full experimental data (2-theta and intensity). A flexible text importer can read a wide variety of input files. SIeve+ is linked with Global searches and Search Preferences from DDView+ allowing users to custom define a SIeve+ input filter based on any of the 48 search method classes or combinations thereof. The results of SIeve+ can also be integrated into search criteria in DDView+.

Total Pattern Analysis Capabilities using an Integral Index for SIeve+

The Integral Index method has also been incorporated into SIeve+ as a tool for database users. This method is a total pattern analysis technique, based on a similarity index that compares diffraction patterns to a reference. In SIeve+, the input experimental data is compared to the reference pattern and an Integral Index is calculated for all candidate reference materials, based on their default digital patterns.

SIeve+, a plug-in to DDView+, is licensed for an additional cost. It activates for a free 30-day trial period or until the product is registered.

Featuring

• New display fields: “Quality Mark”, “Status”, and “Has Atomic Coordinates”
• Total Pattern Analysis: Integral Index
• Increased speed and interactive SIeve+ Pattern GOM calculations
• Improved SIeve+ filtering with DDView+: apply refined searches to matches results
• Import full experimental data for SIeve+
• Import full data, preview, remove background, plot, smooth, show peaks, import peaks into SIeve+, Integral Index calculated for imported data
• Automatic SIeve+ data import for known file types
• Customizable SIeve+ search lines

Multiyear Licenses are available. Please contact the ICDD's Customer Service Department for further information.