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PDf-4

PDF-4 Support Software

DDView+ 2007

ICDD’s data mining and viewing software, DDView+, is integrated into your PDF-4 product. DDView+ provides display, search and data filtering capabilities for the PDF-4 format of the Powder Diffraction File.

DDView/SIeve is licensed for 60 months.  At the end of the licensing period, the product license can be extended for an additional 60 months, free of charge, providing that the licensed user has the same organization name and address (i.e. the registered user). License extensions will be processed using ICDD’s license extension procedure. (www.icdd.com/licenses)

Data Mining

Powered by a Java™ interface, various search methods and field selections can be combined to produce a nearly limitless hoice of data mining options. DDView+ provides the ability to search bibliographic, diffraction, physical property, and crystal data. The program contains 48 different search methods to filter the database contents with custom display of a selection of 66separate data fields.

Data Simulation Module

Powerful interactive graphics have been interfaced allowing users to transform diffraction data from the historic stick pat-terns of d’s and I’s into a fully digitized pattern using on-the-fly calculation technology. You have the ability to input experimental and instrumental factors into the reference patterns enabling you to simulate a reference pattern as if it was run on your instrument.

This versatile module features simulations for:

  • X-ray diffraction data
  • Synchrotron diffraction data
  • Neutron diffraction data
  • Electron diffraction data
  • Electron backscatter diffraction patterns
  • Electron diffraction spot patterns

DDView+ Features

SIeve+ 2007 - Purchase

SIeve+ provides rapid searching and identification of materialsusing highly automated Hanawalt, Fink and Long-8 searches. While SIeve+ contains much of the functionality of ICDD's printed index and search manuals, its strengths take advantage of the dynamic computing power of modern PCs to rapidly per-form permuted searches on hundreds of thousands of dataentries. SIeve+ features an automatic rotation of the 3strongest lines (Hanawalt) or the 8 longest of the strongest lines (Fink) or the 8 longest lines (Long 8) to look for matches that exhibit the best Goodness of Match (GOM). Historically, these rotation operations were anticipated and integrated into paper manual search-index method protocols. In SIeve+ 2007, the rotations can be switched on/off in Preferences. The paper manual search schema always offers a litmus test for searching, namely that all the lines in the unknown pattern must be matched against all the lines in the reference pattern(s). To address this comparison, we have implemented a "Pattern GOM" that provides this comparison. The SIeve+ display allows a comparison between the standard GOM and the Pattern GOM.Extensive digitized data plotting functions allow comparisons between experimental data and SIeve+ search match results.

SIeve+ works with files containing d-spacing/2-theta and intensity pairs or files containing full experimental data (2-theta and intensity). A flexible text importer can read a wide variety of input files; any number of d/I pairs can be imported. SIeve+ is linked with Global searches and Search Preferences from DDView+. This means that a user can custom define a SIeve+ input filter based on any of the 48 search method classes or combinations thereof. The results of SIeve+ can also be integrated into search criteria in DDView+.

Total Pattern Analysis Capabilities using an Integral Index for SIeve+

The Integral Index method has also been incorporated into SIeve+ as a tool for database users. This method is a total pattern analysis technique, based on a similarity index that compares diffraction patterns to a reference. In SIeve+, the input experimental data is compared to the reference pattern and an Integral Index is calculated for all candidate reference materials, based on their default digital patterns.

SIeve+, a plug-in to DDView+, is licensed for an additional cost. It activates for a free 30-day trial period or until the product is registered.

New in 2007

  • Faster searches
  • Total Pattern Analysis: Integral Index calculates andassigns a numeric index value comparing experimentaldata to result form diffraction patterns
  • Increased speed and interactive SIeve Pattern GOM calculations
  • Improved SIeve filtering with DDView
    • Enables user to choose DDView search & refine,then apply search to matches results
  • SIeve search methods are more detailed
  • Display additional SIeve rotational information
  • Import full experimental data for SIeve
    • Import full data, preview, remove background, plot,show peaks, import peaks into SIeve, Integral Indexcalculated for imported data
  • Automatic SIeve data import for known file types
  • Customizable SIeve search lines

Multiyear Licenses are available. Please contact the ICDD's Customer Service Department for further information.

DDView/SIeve is licensed for 60 months.  At the end of the licensing period, the product license can be extended for an additional 60 months, free of charge, providing that the licensed user has the same organization name and address (i.e. the registered user). License extensions will be processed using ICDD’s license extension procedure. (www.icdd.com/licenses)