SIeve+ 2010 - Purchase SIeve + 2010

Integrated data mining & identification

SIeve+, ICDD’s search indexing software for the PDF-4 product line, provides rapid searching and identification of materials using highly automated Hanawalt, Fink and Long 8 searches. SIeve+ takes advantage of the remarkable computing power of modern PCs to rapidly perform searches on hundreds of thousands of data entries.

SIeve+ features automatic rotation of the 3 strongest lines (Hanawalt) or the 8 longest of the strongest lines (Fink) or the 8 longest lines (Long 8) to look for matches that exhibit the best Goodness of Match (GOM). The automatic rotations can be switched on/off in Preferences. For 2010, the GOM can be weighted or unweighted to better equilibrate scoring of matches with entries having larger and smaller numbers of peaks. The “Pattern GOM” compares all lines in the unknown pattern against all lines in the reference pattern(s). The SIeve+ display allows a comparison between the standard GOM and the pattern GOM. Extensive digitized data plotting functions allow comparisons between experimental data and SIeve+ search/ match results.

SIeve+ works with files containing a list of peaks (d-spacing/2-theta and intensity pairs) or files containing full experimental data (2-theta and intensity). A flexible text importer can read a wide variety of input files. SIeve+ is linked with global searches and Search Preferences from DDView+ allowing users to custom define their own PDF subfile for SIeve+ based on any of the 53 search method classes or combinations thereof. The results of SIeve+ can also be integrated into search criteria in DDView+.

For 2010, the use of common and userdefined subfile filters in SIeve+ has been facilitated by a simple selection box that appears once input data have been prepared for searching. Common subfile filters include Primary Patterns, Mineral Related Patterns, and Common Phases. In addition, the user can create any number of filters based on DDView+’s extensive data mining capabilities. The use of these filters effectively focuses the search/match power of SIeve+ on relevant PDF entries based on supplemental or categorical knowledge of the specimen being analyzed. The user even has the ability to change these filters, whether they be elemental, structural, or categorical in nature, after the major phases have been identified to facilitate minor and trace phase searches on the residual pattern.

As with any automated search/match program, the user has the final word on the correctness of a potential match. With SIeve+, the user may accept one or more of the initial proposed matches based on the GOM score, the line-by-line fit and/or graphical fit to the raw input data, and the user’s knowledge of the sample origin. Once accepted, SIeve+ automatically subtracts this phase(s) from the input data and searches the database again for identification of additional phases in the residual pattern. With well-resolved data, identification of >10 phases in a multicomponent mixture may be reasonably accomplished.

Total Pattern Analysis Capabilities using an Integral Index for SIeve+

The Integral Index method has also been incorporated into SIeve+ as a tool for database users. This method is based on a similarity index that compares diffraction patterns to a reference pattern. In SIeve+, an Integral Index is calculated for all candidate reference materials, based on their default digital patterns.

SIeve+ can be licensed for an additional cost. It activates for a free 30-day trial period or until the product is registered.

Featuring:

• Dynamic graphical overlay of identified phases
• Copy/paste operations from other programs (i.e., Microsoft® Excel®) for SIeve+ data entry
• Total Pattern Analysis: Integral Index
• User specified formatting for SIeve+ results table is now saved for future sessions
• Improved user interactions for selecting SIeve+ match candidates
• Improved database pre-screening with DDView+ searches providing more focused matching with SIeve+
• Import full experimental data for SIeve+
• Full pattern preview, background removal, smoothing, Kα₂ profile stripping, and peak finding
• Automatic SIeve+ data import for known file types

Multiyear Licenses are available. Please contact the ICDD's Customer Service Department for further information.

Purchase SIeve + 2010