Board of Director Profile

tom blanton

Thomas (Tom) N. Blanton
Executive Director
Past Chairman (2008-2012)

Affiliation:  

International Centre for Diffraction Data

Address:

International Centre for Diffraction Data
12 Campus Boulevard
Newtown Square, PA U.S.A. 19073-3273

E-mail:

tblanton@icdd.com

Education:

Emory University – Chemistry

Rochester Institute of Technology – Materials Science and Engineering

Research Interests:

Materials characterization using XRD; Materials development using microstructure characterization techniques

Brief Career History:

2013 - present - ICDD
1982 - 2013 - Eastman Kodak Company
Current title - Executive Director/Principal Scientist

 

Tom is the Executive Director and Principal Scientist at ICDD. Before joining ICDD he was a Senior Principal Scientist at Eastman Kodak Company where he worked in industrial applications of X-ray diffraction and X-ray fluorescence for 31 years. He was responsible for the operation of the X-ray Spectroscopy Laboratory, utilizing diffractometers for powder, pole figure, nonambient, high-resolution, reflectivity, and two-dimensional XRD. Materials analyzed included inorganics, organics, solid state devices, thin films, corrosion products, ceramics, pharmaceuticals, polymers, and nanomaterials. Tom was also the Technical Leader in the Specialty Materials Development Laboratory. His area of focus was utilization of XRD for microstructure characterization resulting in new materials development for intellectual property and product development. Tom has 180+ publications including 4 book chapters, 46 U.S. Patents and 57 international patents.

Tom has served as a member of the ICDD Board of Directors for the terms 1992-1998 and 2004-2013, serving as Chairman 2008-2012. He has also received the honor of being named an ICDD Distinguished Fellow. Tom has been an instructor at the SUNY Albany and ICDD XRD Clinics for more than 30 years, and has served as a lecturer at the University of Rochester.