Board of Director Profile
International Centre for Diffraction Data
International Centre for
Ph.D. - Rutgers
X-ray diffraction and crystallography, Inorganic and analytical chemistry, and advanced materials
|Brief Career History:||
1979-89 - Dow Chemical Co., worked in the X-ray diffraction facility, and then managed various groups in the the Analytical Sciences Analysis Laboratories.
1989-96 - Managed in Dow's Ceramics and Advanced Materials Laboratories in new product development
1996-2001 - Sr. Research Manager managing Dow's Advanced Technologies and Inorganic Coating Group, the Interfacial Sciences Discipline, and most recently, two of Dow's new product development areas which involved a portfolio of projects leading to advanced materials products.
Tim began his career receiving his B.S. in Chemistry at the University of Massachusetts and a Ph.D. degree in Inorganic Chemistry at Rutgers University. At Rutgers he combined x-ray crystallography with various spectroscopy techniques to study amino acids, chromophores of metalloproteins, and cupruretic agents for Wilson's disease. He was hired into the x-ray diffraction laboratory of the Analytical Sciences Department of the Dow Chemical Company in Midland, Michigan. During the next 10 years, he worked in the x-ray diffraction laboratory performing a wide range of analyses of corrosion products, inorganic materials, advanced ceramics, catalysts, pharmaceuticals and polymers. He eventually managed the inorganic analysis laboratories in Analytical Sciences, that included XRD, XRF, NAA, AA, ICP, AES, CHN, IC and electrochemical analyses. He worked with a team of scientists that developed and patented the simultaneous DSC/XRD/MS instrument, which won an IR-100 award in 1987. From 1986 to 1988 he served on the Board of Directors for the ICDD. During the 1990's, Tim managed several new product development groups in advanced materials, electronics, coatings, dispersions, ceramics and automotive components for different business organizations within the Dow Chemical Company. He became an ICDD fellow in 2000 and joined the ICDD as Executive Director in 2001. During his career, Tim has authored 35 publications, been a frequent guest lecturer, and presented several papers and workshops at global X-ray conferences. Several of his publications have been incorporated in the book, Methods & Practices in X-Ray Diffraction, published by the ICDD. As Executive Director he has directed and participated in the dramatic growth of the Powder Diffraction File to ~600,000 entries which is now used by scientists in over 100 countries.