ICDD History - 70 Years of a Scientific Organization
From the discovery of X-rays by Roentgen in 1895 followed by Bragg's law in 1913, the field of X-ray diffraction was founded. Following the publication of two landmark papers in the late 1930s on the archiving and use of powder data for materials analysis by The Dow Chemical Company scientists, the need for a central collection of diffraction patterns from known materials became apparent. The Joint Committee for Chemical Analysis by Powder Diffraction Methods was founded in 1941. They produced a primary reference of X-ray powder diffraction data, which became known as the Powder Diffraction File (PDF). This effort was initially supported by Committee E-4 of the American Society for Testing and Materials (ASTM). Over the next two decades, other professional bodies added their support, culminating in 1969 with the establishment of the Joint Committee on Powder Diffraction Standards (JCPDS). The JCPDS was incorporated to continue the mission of maintaining the PDF. In 1978, the name of the organization was changed to the International Centre for Diffraction Data in order to highlight the global commitment of this scientific endeavor.
As we celebrate our 70th anniversary, we reflect on our founder's visions to serve as an organization dedicated to materials
analysis and education. From handwritten entries to data cards, keypunch cards, magnetic tape, CDs and DVDs, and now access via the Web, our dynamic organization continues to evolve along with the community that it serves. We will continue to be the world center for quality diffraction and related data. We will continue to promote the application of materials characterization methods in science and technology by providing forums for the exchange of ideas and information.
Identification of Crystalline Materials - Classification and Use of X-ray Diffraction Patterns - J.D. Hanawalt and H.W. Rinn, The Dow Chemical Company, Midland, Michagan; Powder Diffraction Journal Vol 1 Issue 1 (1986)
Manual Search/Match Methods for Powder Diffraction in 1986 - J.D. Hanawalt, Prof. Emeritus, The University of Michagan; Powder Diffraction Journal Vol 1 Issue 1 (1986)
Chemical Analysis by X-ray Diffraction - Classification and Use of X-ray Diffraction Patterns - J.D. Hanawalt, H.W. Rinn, and L.K. Frevel, The Dow Chemical Company, Midland, Michagan; Powder Diffraction Journal Vol 1 Issue 1 (1986)
ICDD Timeline (coming soon)