2003 March Meeting

2003 Annual Spring Meeting Schedule
17-21 March 2003
International Centre Headquarters
12 Campus Boulevard
Newtown Square, PA 19073-3273

 

The International Centre for Diffraction Data invited its members, friends, and colleagues in the scientific community to our Annual Meeting. The Annual Meeting was held from March 17th to 21st, 2003 at the ICDD Corporate Headquarters in Newtown Square, PA. This year, the ICDD introduced some changes in format to our Annual Meeting by sponsoring a Plenary Session followed by a social event on Tuesday March 18th.

 

Message from ICDD's Executive Director - Tim Fawcett

2003 Annual Spring Meeting Summary

2003 Annual Spring Meeting Schedule

Travel and Accommodations Information

 

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"Advances in Automated Phase Identification"

Ben Franklin's Tour

Poster Session

Guidelines for Abstracts

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Mark your calendar! Plan your budget! You won't want to miss this opportunity to…

  • Hear the latest and greatest in automated phase identification at our plenary
  • Network with peers in all fields of materials characterization
  • Benefit from the advice of others working in similar environments
  • Provide input to make the PDF more useful to you in your analyses
  • Visit historic Philadelphia, with a guest appearance by none other than… Ben Franklin!

  

MONDAY, 17 MARCH 2003

Time Committee/Subcommittee Chairman/BoD Liaison Meeting Place
8:00 - 5:00 p.m Zeolite Task Group   to be determined
8:00 - 5:00 p.m. Metals and Alloys Task Group   Executive Conf. Rm.
2 hours Ceramic Subcommittee Task Group E. Antipov Conf. Rm. C
afternoon-TBA X-ray Optics Task Group S. Misture Conf. Rm. D
10:00 -11:00 a.m. Scholarship Committee C.E. Crowder Conf. Rm. C
11:00 -12:00 noon Grant-in Aid Committee T.N. Blanton Conf. Rm. C
12:00 - 1:00 p.m.  Lunch   Lounge
1:00 - 2:30 p.m. Marketing Subcommittee B. O'Connor Conf. Rm. A
2:30 - 4:30 p.m. Finance Committee J. Messick Conf. Rm. A
4:30 - 5:30 p.m. Awards Committee R. Snyder Conf. Rm. D
4:30 - 5:30 p.m. Membership Committee Meeting W. Wong-Ng Conf. Rm. C

 

TUESDAY, 18 MARCH 2003  - note

Time Committee/Subcommittee Chairman/BoD Liaison Meeting Place
8:00 - 9:00 a.m. Technical Regional Co-Chair and
Technical Subcommittee Chair Meeting
J. Kaduk Conf. Rm. C
9:00 -12:00 noon 3
(see more on Plenary)
  Conf. Rm. A
12:00 - 1:00 p.m. Lunch   Lounge/Rm.D/Patio
1:00 - 6:30 p.m. Benjamin Franklin Tour of Historic Philadelphia   Philadelphia
7:30 - 9:30 p.m. Technical Poster Session and Dinner J. Kaduk Concordville Inn

 

WEDNESDAY, 19 MARCH 2003 - note

Time Committee/Subcommittee Chairman/BoD Liaison Meeting Place
8:00 - 9:00 a.m. Awards Committee R. Snyder Conf. Rm. C
9:00 -10:00 a.m. Welcome New Members T. Fawcett/C.R. Hubbard Conf. Rm. D
10:00 -11:00 a.m. Ceramics Subcommittee E. Antipov/E. Antipov Conf. Rm. A
11:00 -12:00 noon Metals & Alloys Subcommittee H. Jones/C.R. Hubbard Conf. Rm. A
11:00 -12:00 noon Organic & Pharmaceutical Subcommittee G. Stephenson/D.F. Rendle Conf. Rm. D
12:00 - 1:00 p.m. Lunch   Lounge/Rm.D/Patio
1:00 - 2:00 p.m. X-ray Diffraction Methods Subcommittee S. Misture/C.R. Hubbard Conf. Rm. A
2:00 - 3:00 p.m. Minerals Subcommittee A. McDonald/R.L. Snyder Conf. Rm. A
2:00 - 3:00 p.m. Non-Ambient Diffraction Subcommittee C. Prewitt/D. Louer Conf. Rm. D
3:00 - 4:00 p.m. X-ray Fluorescence Subcommittee G. Havrilla/B.O'Connor Conf. Rm. A
4:00 - 5:00 p.m. P.D.F. Editorial Staff Sub. W.F. McClune/J. Messick Conf. Rm. D

 

THURSDAY, 20 MARCH 2003 - note

Time Committee/Subcommittee Chairman/BoD Liaison Meeting Place
9:00 -10:00 a.m. Education Subcommittee S. Quick/B. O'Connor Conf. Rm. A
9:00 -10:00 a.m. Electron Diffraction Subcommittee A. Eades/R. Goehner Conf. Rm. D
10:00 -12:30 p.m. Technical Committee J.A. Kaduk Conf. Rm. A
12:30 - 1:30 p.m.  Lunch   Lounge/Rm.D/Patio
1:30 - 3:30 p.m. Annual Meeting of Members C.R. Hubbard Conf. Rm. A
3:30 -6:00 p.m. Board of Directors C.R. Hubbard Conf. Rm. C.
7:00 p.m. Board of Directors Dinner C.R. Hubbard TBA

 

FRIDAY, 21 MARCH 2003

Time Committee/Subcommittee Chairman/BoD Liaison Meeting Place
8:00- 5:00 p.m. Board of Directors C.R. Hubbard Conf. Rm. C.

*Note: Meetings scheduled on Tuesday, Wednesday, and Thursday (those in the yellow areas) are of general interest and recommended for attendance. We are asking all participants (members and guests) to register in advance.

Travel and Accommodations Information

Monday: Task Groups and Board of Directors' (BoD) Committees Meetings

Tuesday: Technical Regional Co-chair meeting

Technical Regional Co-chairs' and Technical Subcommittee Chair Meeting
This meeting will serve as a planning meeting for global technical activities in the 2003-2004 fiscal year. Activities include technical workshops, grant-in-aid workshops, and cooperative meetings with other technical organizations. (Approximately 1 hour)

Plenary Session: 
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Organized by T. Fawcett, ICDD, Newtown Square, PA

Microgenerators, powerful high efficient optics, and multidimensional detectors have revolutionized the speed and accuracy of X-ray and electron diffraction analyses. Strategic alliances and new database formats have combined to explode the size, depth, and data mining capability of materials databases. Intelligent software has been created to link these developments and to give users an unprecedented ability to identify and characterize materials.

Leading experts in phase identification will discuss the new possibilities available today, and their expectations for the future.

Next Generation Developments in PDF-4 Design: Search, Search-Indexing and Data-Mining
John Faber, Justin Blanton, Monika Kottenhahn, Fangling Needham, Yuming Si, Joseph Sunzeri, and Charles Weth, ICDD
Newtown Square, PA

Phase Identification at the Push of a Button: A Dream Come True?
Martijn Fransen, PANalytical
The Netherlands

Phase Identification Using Electron Backscatter Diffraction and Crystallographic Databases
Joseph Michael, Sandia National Laboratories
Albuquerque, NM

DIFFRACplus Search/Match 
(view abstract as Adobe PDF)
Julien Nusinovici, Socabim
Paris, France

Phase Identification Using Electron Back Scattering Patterns
David Dingley, TSL-EDAX
United Kingdom

The Benjamin Franklin Tour of Historic Philadelphia
Tuesday, March 18, 2003, 2:00-5:00 p.m. Sponsored by ICDD.

ICDD members and their spouses, families and guests are invited to take a step back in time as we retrace the steps of one of the great scientists Benjamin Franklin! This three-hour walking tour of historic Philadelphia will give you a feel for the life and times of Ben as you walk the same streets where he once walked. Ben has even promised to make a guest appearance during our journey through time. Won't you join us? Please register to reserve a spot on the tour and shuttle.

1:00 p.m. - Shuttle to pick up tour participants at Best Western Concordville Hotel
1:30 p.m. - Shuttle departs from ICDD
2:00-5:00 p.m. - Philadelphia Tour
6:00 p.m. - Shuttle drop-off at ICDD
6:30 p.m. - Shuttle drop-off at hotel

Poster Session and Reception
Following the tour, the ICDD will sponsor a poster session and reception on Tuesday, 18 March 2003, at 7:30 pm at the Concordville Inn Restaurant, adjacent to the host hotel, the Best Western Concordville Hotel and Conference Center. The ICDD is soliciting electronic abstracts for poster presentations for this event. Here's an opportunity to display and communicate your studies and research results. Posters relating to all aspects of X-ray analysis are welcome. Jim Kaduk has agreed to serve as this year's Poster Session Chair. (Thank you, Jim!) Should you have technical inquiries, please contact Jim at Kaduk@polycrystallography.com. The deadline for submitting abstracts is February 15, 2003.

Recently Submitted Abstracts:

Download Free Adobe Reader Plug-In

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NOVEL OXYGEN-DEFICIENT COBALT-BASED OXIDES WITH PEROVSKITE-LIKE STRUCTURE
(view abstract as Adobe PDF)
S.Ya. Istomin1, O.A. Drozhzhin2, V.A. Koutcenko1, E.V. Antipov1, G. Svensson3
1
Department of Chemistry, Moscow State University, 119899, Moscow, Russia 
E-mail: antipov@icr.chem.msu.ru
2Department of Materials Science, 119899, Moscow, Russia
3Department of Structural Chemistry, Stockholm University, SE-10691, Stockholm, Sweden

APPLICATIONS OF X-RAY DIFFRACTION IN NEW MATERIALS DEVELOPMENT FOR USE IN THE IMAGING INDUSTRY
(view abstract as Adobe PDF)
T.N. Blanton, Eastman Kodak Company, Rochester, New York 14650-2106, USA
E-mail: tblanton@icdd.com

INCREASING DATA MINING POWER FOR THE ICDD PDF-4 PRODUCTS: CUSTOMIZABLE SEARCH PREFERENCES TO SELECT THE PROPERTIES DISPLAYED IN A DATABASE QUERY
(view abstract as Adobe PDF)
Jerome Bridge , Justin Blanton and John Faber
International Centre for Diffraction Data (ICDD)

STRUCTURAL DISORDER ALONG THE Li DIFFUSION PATHWAY IN CUBIC LimN2O4
(view abstract as Adobe PDF)
N. Ishizawa, K. Tateishi, and D. du Boulay
Materials and Structures Laboratory, Tokyo Institute of Technology, 4259 Nagatsuta Midori Yokohama 226-8503, Japan

THE VIRTUAL BLUEBOOK
(view abstract as Adobe PDF)
Howard Jones (Pratt & Whitney, joneshow@pweh.com), Mike Bennett, Pete Wallace (Dos Arroyos Enterprises), Jeffrey Dann (OSRAM SYLVANIA), Andy Roberts (Geological Survey of Canada) and Frank McClune (JCPDS-International Centre for Diffraction Data)

EFFECT OF THERMAL VIBRATIONS ON REFERENCE INTENSITY RATIO
(view abstract as Adobe PDF)
S. Kabekkodu and W.F. McClune
International Centre for Diffraction Data, Newtown Square, PA 19073

CRYSTAL STRUCTURES AND HYDROGEN BONDING IN CELLULOSES Iα, Iβ, AND II
(view abstract as Adobe PDF)
James A. Kaduk, BP Chemicals, Naperville IL 60566 and
Paul Langan, Biosciences Division, Los Alamos National Laboratory, Los Alamos NM 87545

SYNTHESIS AND CHARACTERIZATION OF METASTABLE Zr-Al OXIDES
(view abstract as Adobe PDF)
G. Kimmel1, J. Zabicky2, E. Goncharov2, P. Ari-Gur1, J. W. Richardson3
1 Western Michigan University - USA
2
Ben-Gurion University of the Negev - Israel
3Argonne National Laboratory - USA.
E.mail: gkimmel@wmich.edu

A POWDER DIFFRACTION STUDY OF LEAD CHLORIDE OXALATE: AB INITIO STRUCTURE DETERMINATION AND THERMAL BEHAVIOR
(view abstract as Adobe PDF)
Chaouki Boudaren*, Michèle Louër, Jean-Paul Auffrédic and Daniel Louër (E-mail: dlouer@icdd.com)
LCSIM (UMR CNRS 6511), Institut de Chimie, Université de Rennes, France
*Permanent address: Département de Chimie, Université Mentouri, Constantine, Algeria

TEMPERATURE CALIBRATION FOR HIGH TEMPERATURE DIFFRACTION
(view abstract as Adobe PDF)
S.T. Misture, Chair of Task Group
ICDD High Pressure/Temperature Subcommittee Task Group
New York State College of Ceramics at Alfred University

DATA QUALITY AND RIETVELD REFINEMENT OF POWDER DATA FROM MULTILAYER OPTICS
(view abstract as Adobe PDF)
Scott T. Misture, Task Group Chair
ICDD X-ray Optics Task Group
NYS College of Ceramics at Alfred University, Alfred, NY 14802

PDF-4/Organics 2003 Database/Software
(view abstract as Adobe PDF)
International Centre for Diffraction Data
F. Needham, J. Faber, T. Fawcett, J. Blanton, M. Kottenhahn, J. Sunzeri, C. Weth

INFLUENCE OF RADIATION EFFECT ON THE MEASUREMENT RELATIVE INTENSITY IN X - RAY EMISSION SPECTROMETRY 
(view abstract as Adobe PDF)
Vjera Novosel - Radovic, Nikol Radovic*, Milka Balen
Željezara Sisak, 44000 Sisak, Croatia; *Faculty of Geodesy University of Zagreb,
10000 Zagreb, Croatia

INTENSITY VS. RESOLUTION AND PEAK SHAPE IN X-RAY DIFFRACTION; SINGLE AND DOUBLE GOEBEL MIRROR CONFIGURATIONS COMPARED TO STANDARD PARAFOCUSING OPTICS
(view abstract as Adobe PDF)
Eric J. Peterson, William L. Hults, and James A. Valdez, Los Alamos National Laboratory Los Alamos, NM 87545
Holger Cordes and J. Brian Litteer, Bruker-AXS, Madison, WI 53711-5373

RAPID ANALYSIS OF TERNARY PHASE DIAGRAMS USING SYNCHROTRON RADIATION
(view abstract as Adobe PDF)
E.D. Specht (E-mail: spechted@ornl.gov) 1, A. Rar 1,2, G.M. Pharr 1,2, E.P George 1,2, P. Zschack 3, H. Hong 3, and J. Ilavsky 4
1
Metals and Ceramics Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee
2 Dept. of Materials Science and Engineering, University of Tennessee, Knoxville, Tennessee
3 Frederick Seitz Materials Research Laboratory, University of Illinois at Urbana-Champaign
4 National Institute of Standards and Technology Gaithersburg, MD, 20899

DEVELOPING AN ASTM STANDARD TEST FOR QUANTITATIVE X-RAY POWDER DIFFRACTION ANALYSIS OF PORTLAND CEMENTS AND CLINKER
Paul Stutzman
Building and Fire Research Laboratory
National Institute of Standards and Technology

PHASE EVOLUTION OF Ba2YCu3O6+x IN THE Ba-Y-Cu-F-O-OH SYSTEM
(view abstract as Adobe PDF)
W. Wong-Ng, I. Levin, M.D. Vaudin, L.P. Cook, J.P. Cline, Ceramics Division, NIST,
Gaithersburg, MD 20899; and R. Feenstra, Condensed Matter Sciences Division, Oak
Ridge National Laboratory, Oak Ridge, TN 37831.

SYNTHESIS AND CRYSTAL STRUCTURES OF Bi2Ln4O9 MONOCLINIC PHASES
(view abstract as Adobe PDF)
Yucheng Lan†, Xiaolong Chen ‡
† Department of Physics, Temple University, PA 19122
(E-mail: ylan@astro.temple.edu)
‡ Institute of Physics, Chinese Academy of Sciences, Beijing 100080, People's Republic of China

NEW TEXTBOOK: FUNDAMENTALS OF POWDER DIFFRACTION AND STRUCTURAL CHARACTERIZATION OF MATERIALS
(view abstract as Adobe PDF)
Vitalij K. Pecharsky1  and Peter Y. Zavalij2 (E-mail: zavalij@binghamton.edu)
1  Department of Materials Science and Engineering and Ames Laboratory of
the US Department of Energy, Iowa State University, Ames, IA 50011-3020
2 Department of Chemistry and Institute for Materials Research,
State University of New York at Binghamton, Binghamton, NY 13902-6000

Poster Guidelines
Poster boards are 40 inches high, 60 inches wide, and about 1/4 inch thick, comprised of foam board. Pins and Velcro will be available to attach your poster to the foam boards. Authors are asked to post their presentations approximately 15 minutes prior to the start of the session (~7:15 pm).

GUIDELINES FOR PREPARING ABSTRACTS
Abstracts will be published as-received on the ICDD web page, with possible links to, or duplicate copies on affiliated web sites (e.g. IXAS), and also published in the journal of Powder Diffraction. If you do not want your abstract so published, please note your request in your e-mail message when you submit your abstract.

Abstracts must not exceed one page in length and must include the title, author(s), affiliation(s), and the text. To provide uniformity, it is recommended that abstracts be prepared according to the following guidelines:

Abstract Format

  • Paper Size: 8.5 x 11 inches; A4 paper must be formatted for 8.5 x 11 inches
  • Size: Entire abstract, including title, author(s), affiliation(s), and text, must fit into a maximum area of 15 cm (5.9") wide by 20 cm (7.9") high. Please allow a top margin of 3.8 cm (1.5") and 2.54 cm (1") margins on all other sides
  • Font: Times or Times New Roman, 12 point
  • Title: bold, centered, all uppercase (except where lowercase letters are needed for clarity)
  • Leave one blank line between the title and the author(s)
  • Author(s) and affiliation(s): mixed upper and lowercase, centered; if there is more than one author, underline the presenting author's name. Please include the e-mail address of the presenting author.
  • Leave two blank lines before beginning text
  • Text:
    • text should appear flush left; do not indent
    • use line spacing sufficiently large enough to allow the abstract to be read easily, including subscripts, superscripts and Greek letters
    • a blank line is recommended (space permitting) between new paragraphs

Please note:

  • All graphics must be embedded in the Word document.
  • If special symbols or Greek letters are used, please limit the fonts to those that are available with the standard distribution of Microsoft Word. Nonstandard fonts may lead to errors in transmission.

Submission
Abstracts should be sent via e-mail as attached files, created in Microsoft Word (6.0 through 2000).

Wednesday: New Member Orientation Meeting, Technical Meetings

New Member Orientation Meeting
All new members and first-time attendees should plan to attend this meeting. Dr. Cam Hubbard, ICDD's Chariman of the Board, and Dr. Tim Fawcett, ICDD's Executive Director will welcome attendees and present an overview of the ICDD and events held during the meeting week. Learn how to become involved in ICDD activities. Non-members can also learn about the membership application process.

Technical Meetings

Materials:
Ceramics Subcommittee - Evgeny Antipov, Chairman
Metals and Alloys Subcommittee - Howard Jones, Chairman
Minerals Subcommittee - Andrew M. McDonald, Chairman
Organic and Pharmaceutical Subcommittee - Gregory A. Stephenson, Chairman
Characterization Methods and Tools:
Electron Diffraction Subcommittee - Alwyn Eades, Chairman
Non-Ambient Diffraction Subcommittee - Charles T. Prewitt, Chairman
X-ray Diffraction Methods Subcommittee - Scott T. Misture, Chairman
X-ray Fluorescence Subcommittee - George Havrilla, Chairman
ICDD Activities:
Education Subcommittee - Susan L. Quick, Chairman
PDF Editorial Staff Subcommittee: ICDD Editor-in-Chief - W. Frank McClune, Chairman

Thursday: Technical Meetings, Technical Committee Meeting, and Annual Meeting of Members

Technical Meetings
(continued from Wednesday, see above)

Technical Committee Meeting
The Technical Committee meeting reviews motions and action items from the numerous technical subcommittees and task groups. Since task groups meet at different times during the year and some of the subcommittees meet in concurrent sessions on Tuesday, this meeting provides a summary of key items to all attendees. In addition, guest speakers are invited to present topics of current interest. Last year's presentations focused on pharmaceutical analysis and new inorganic materials research in Russia. Regional Technical Co-chairs review activities in their region of the globe (eight regions) and present recommendations for future activities.

Annual Meeting of Members
All members come together for a formal gathering at this meeting to hear remarks from the Chairman, a review of the Board of Directors' (BoD) and Headquarters' activities, reports of selected BoD Committees, including the Technical and Finance Committees, as well as reports of Task Groups. Corporate activities are also discussed along with any new business items brought forth by members. An agenda of the meeting will be available in January.

Friday: Board of Directors' Meetings

These meetings are generally closed to the public.

  Travel and Accommodations Information