2003 Annual Spring Meeting Schedule
17-21 March 2003
International Centre Headquarters
12 Campus Boulevard
Newtown Square, PA 19073-3273
The International Centre for Diffraction Data invited its members,
friends, and colleagues in the scientific community to our Annual Meeting.
The Annual Meeting was held from March 17th to 21st, 2003 at the ICDD
Corporate Headquarters in Newtown Square, PA. This year, the ICDD introduced some changes in format to our Annual Meeting by sponsoring a
Plenary Session followed by a social event on Tuesday March 18th.
*Note: Meetings scheduled on Tuesday, Wednesday, and Thursday (those in the yellow
areas) are of general interest and recommended for
attendance. We are asking all participants (members and guests) to
register in advance.
Monday: Task Groups and Board of Directors' (BoD) Committees
Meetings
Tuesday: Technical Regional Co-chair meeting
Technical Regional Co-chairs' and Technical
Subcommittee Chair Meeting
This meeting will serve as a planning meeting for global technical
activities in the 2003-2004 fiscal year. Activities include technical
workshops, grant-in-aid workshops, and cooperative meetings with other
technical organizations. (Approximately 1 hour)
Plenary Session:
Organized by T. Fawcett, ICDD, Newtown Square, PA
Microgenerators, powerful high efficient optics, and
multidimensional detectors have revolutionized the speed and
accuracy of X-ray and electron diffraction analyses. Strategic
alliances and new database formats have combined to explode the
size, depth, and data mining capability of materials databases.
Intelligent software has been created to link these developments and
to give users an unprecedented ability to identify and characterize
materials.
Leading experts in phase identification will discuss the new
possibilities available today, and their expectations for the
future.
Next Generation Developments in PDF-4 Design: Search,
Search-Indexing and Data-Mining
John Faber, Justin Blanton, Monika Kottenhahn, Fangling Needham,
Yuming Si, Joseph Sunzeri, and Charles Weth, ICDD
Newtown Square, PA
Phase Identification at the Push of a Button: A Dream Come
True?
Martijn Fransen, PANalytical
The Netherlands
Phase Identification Using Electron Backscatter Diffraction
and Crystallographic Databases
Joseph Michael, Sandia National Laboratories
Albuquerque, NM
Phase Identification Using Electron Back Scattering Patterns
David Dingley, TSL-EDAX
United Kingdom
The Benjamin Franklin Tour of Historic Philadelphia
Tuesday, March 18, 2003, 2:00-5:00 p.m. Sponsored by ICDD.
ICDD members and their spouses, families and guests are invited to take
a step back in time as we retrace the steps of one of the great scientists
Benjamin Franklin! This three-hour walking tour of historic Philadelphia
will give you a feel for the life and times of Ben as you walk the same
streets where he once walked. Ben has even promised to make a guest
appearance during our journey through time. Won't you join us? Please
register to reserve a spot on the tour and shuttle.
1:00 p.m. - Shuttle to pick up tour participants at Best Western
Concordville Hotel
1:30 p.m. - Shuttle departs from ICDD
2:00-5:00 p.m. - Philadelphia Tour
6:00 p.m. - Shuttle drop-off at ICDD
6:30 p.m. - Shuttle drop-off at hotel
Poster Session and Reception
Following the tour, the ICDD will sponsor a poster session and reception
on Tuesday, 18 March 2003, at 7:30 pm at the Concordville Inn Restaurant,
adjacent to the host hotel, the Best Western Concordville Hotel and
Conference Center. The ICDD is soliciting
electronic abstracts for poster presentations for this event. Here's an opportunity to display and
communicate your studies and research results. Posters relating to all
aspects of X-ray analysis are welcome. Jim Kaduk has agreed to serve as
this year's Poster Session Chair. (Thank you, Jim!) Should you have
technical inquiries, please contact Jim at james.kaduk@innovene.com.
The deadline for submitting abstracts is February
15, 2003.
NOVEL OXYGEN-DEFICIENT COBALT-BASED OXIDES WITH PEROVSKITE-LIKE
STRUCTURE (view abstract as Adobe PDF)
S.Ya. Istomin1, O.A. Drozhzhin2, V.A.
Koutcenko1, E.V. Antipov1, G. Svensson3
1Department of Chemistry, Moscow State University, 119899,
Moscow, Russia
E-mail: antipov@icr.chem.msu.ru 2Department of Materials Science, 119899, Moscow, Russia 3Department of Structural Chemistry, Stockholm
University, SE-10691, Stockholm, Sweden
APPLICATIONS OF X-RAY DIFFRACTION IN NEW MATERIALS DEVELOPMENT
FOR USE IN THE IMAGING INDUSTRY (view abstract as Adobe PDF)
T.N. Blanton, Eastman Kodak Company, Rochester, New York 14650-2106,
USA E-mail: thomas.blanton@kodak.com
INCREASING DATA MINING POWER FOR THE ICDD PDF-4 PRODUCTS:
CUSTOMIZABLE SEARCH PREFERENCES TO SELECT THE PROPERTIES DISPLAYED
IN A DATABASE QUERY
(view abstract as Adobe PDF) Jerome Bridge , Justin Blanton and John Faber
International Centre for Diffraction Data (ICDD)
STRUCTURAL DISORDER ALONG THE Li DIFFUSION PATHWAY IN CUBIC
LimN2O4
(view abstract as Adobe PDF)
N. Ishizawa, K. Tateishi, and D. du Boulay
Materials and Structures Laboratory, Tokyo Institute of Technology,
4259 Nagatsuta Midori Yokohama 226-8503, Japan
THE VIRTUAL BLUEBOOK
(view abstract as Adobe PDF)
Howard Jones (Pratt & Whitney, joneshow@pweh.com),
Mike Bennett, Pete Wallace (Dos Arroyos Enterprises), Jeffrey Dann (OSRAM
SYLVANIA), Andy Roberts (Geological Survey of Canada) and Frank
McClune (JCPDS-International Centre for Diffraction Data)
EFFECT OF THERMAL VIBRATIONS ON REFERENCE INTENSITY RATIO
(view abstract as Adobe PDF)
S. Kabekkodu and W.F. McClune
International Centre for Diffraction Data, Newtown Square, PA 19073
CRYSTAL STRUCTURES AND HYDROGEN BONDING IN CELLULOSES Iα, Iβ,
AND II
(view abstract as Adobe PDF)
James A. Kaduk, BP Chemicals, Naperville IL 60566 and
Paul Langan, Biosciences Division, Los Alamos National Laboratory,
Los Alamos NM 87545
SYNTHESIS AND CHARACTERIZATION OF METASTABLE Zr-Al OXIDES
(view abstract as Adobe PDF) G. Kimmel1, J. Zabicky2, E. Goncharov2,
P. Ari-Gur1, J. W. Richardson3 1 Western Michigan University - USA
2Ben-Gurion University of the Negev - Israel 3Argonne National Laboratory - USA.
E.mail: gkimmel@wmich.edu
A POWDER DIFFRACTION STUDY OF LEAD CHLORIDE OXALATE: AB INITIO
STRUCTURE DETERMINATION AND THERMAL BEHAVIOR
(view abstract as Adobe PDF) Chaouki Boudaren*, Michèle Louër, Jean-Paul Auffrédic and Daniel
Louër (E-mail: dlouer@icdd.com)
LCSIM (UMR CNRS 6511), Institut de Chimie, Université de Rennes,
France
*Permanent address: Département de Chimie, Université Mentouri,
Constantine, Algeria
TEMPERATURE CALIBRATION FOR HIGH TEMPERATURE DIFFRACTION
(view abstract as Adobe PDF)
S.T. Misture, Chair of Task Group
ICDD High Pressure/Temperature Subcommittee Task Group
New York State College of Ceramics at Alfred University
DATA QUALITY AND RIETVELD REFINEMENT OF POWDER DATA FROM
MULTILAYER OPTICS
(view abstract as Adobe PDF)
Scott T. Misture, Task Group Chair
ICDD X-Ray Optics Task Group
NYS College of Ceramics at Alfred University, Alfred, NY 14802
PDF-4/Organics 2003 Database/Software
(view abstract as Adobe PDF)
International Centre for Diffraction Data
F. Needham, J. Faber, T. Fawcett, J. Blanton, M. Kottenhahn, J.
Sunzeri, C. Weth
INFLUENCE OF RADIATION EFFECT ON THE MEASUREMENT RELATIVE
INTENSITY IN X - RAY EMISSION SPECTROMETRY
(view abstract as Adobe PDF)
Vjera Novosel - Radovic, Nikol Radovic*, Milka Balen
Željezara Sisak, 44000 Sisak, Croatia; *Faculty of Geodesy
University of Zagreb,
10000 Zagreb, Croatia
INTENSITY VS. RESOLUTION AND PEAK SHAPE IN X-RAY DIFFRACTION;
SINGLE AND DOUBLE GOEBEL MIRROR CONFIGURATIONS COMPARED TO STANDARD
PARAFOCUSING OPTICS
(view abstract as Adobe PDF)
Eric J. Peterson, William L. Hults, and James A. Valdez, Los Alamos
National Laboratory Los Alamos, NM 87545
Holger Cordes and J. Brian Litteer, Bruker-AXS, Madison, WI
53711-5373
RAPID ANALYSIS OF TERNARY PHASE DIAGRAMS USING SYNCHROTRON
RADIATION
(view abstract as Adobe PDF)
E.D. Specht (E-mail: spechted@ornl.gov)
1, A. Rar 1,2, G.M. Pharr 1,2, E.P
George 1,2, P. Zschack 3, H. Hong 3,
and J. Ilavsky 4
1Metals and Ceramics Division, Oak Ridge National Laboratory,
Oak Ridge, Tennessee 2 Dept. of Materials Science and Engineering, University
of Tennessee, Knoxville, Tennessee 3 Frederick Seitz Materials Research Laboratory,
University of Illinois at Urbana-Champaign 4 National Institute of Standards and Technology
Gaithersburg, MD, 20899
DEVELOPING AN ASTM STANDARD TEST FOR QUANTITATIVE X-RAY POWDER
DIFFRACTION ANALYSIS OF PORTLAND CEMENTS AND CLINKER
Paul Stutzman
Building and Fire Research Laboratory
National Institute of Standards and Technology
PHASE EVOLUTION OF Ba2YCu3O6+x
IN THE Ba-Y-Cu-F-O-OH SYSTEM
(view abstract as Adobe PDF)
W. Wong-Ng, I. Levin, M.D. Vaudin, L.P. Cook, J.P. Cline, Ceramics
Division, NIST,
Gaithersburg, MD 20899; and R. Feenstra, Condensed Matter Sciences
Division, Oak
Ridge National Laboratory, Oak Ridge, TN 37831.
SYNTHESIS AND CRYSTAL STRUCTURES OF Bi2Ln4O9
MONOCLINIC PHASES
(view abstract as Adobe PDF)
Yucheng Lan†, Xiaolong Chen ‡
† Department of Physics, Temple University, PA 19122
(E-mail: ylan@astro.temple.edu)
‡ Institute of Physics, Chinese Academy of Sciences, Beijing
100080, People's Republic of China
NEW TEXTBOOK: FUNDAMENTALS OF POWDER DIFFRACTION AND
STRUCTURAL CHARACTERIZATION OF MATERIALS
(view abstract as Adobe PDF)
Vitalij K. Pecharsky1 and Peter Y. Zavalij2
(E-mail: zavalij@binghamton.edu)
1 Department of Materials Science and Engineering and
Ames Laboratory of
the US Department of Energy, Iowa State University, Ames, IA
50011-3020 2 Department of Chemistry and Institute for Materials
Research,
State University of New York at Binghamton, Binghamton, NY
13902-6000
Poster Guidelines
Poster boards are 40 inches high, 60 inches wide, and about 1/4 inch thick,
comprised of foam board. Pins and Velcro will be available to attach your
poster to the foam boards. Authors are asked to post their presentations
approximately 15 minutes prior to the start of the session (~7:15 pm).
GUIDELINES FOR PREPARING ABSTRACTS
Abstracts will be published as-received on the ICDD web page, with
possible links to, or duplicate copies on affiliated web sites (e.g. IXAS),
and also published in the journal of Powder Diffraction. If you do not
want your abstract so published, please note your request in your e-mail
message when you submit your abstract.
Abstracts must not exceed one page in length and must include the title,
author(s), affiliation(s), and the text. To provide uniformity, it is
recommended that abstracts be prepared according to the following
guidelines:
Abstract Format
Paper Size: 8.5 x 11 inches; A4 paper must be formatted for 8.5 x 11
inches
Size: Entire abstract, including title, author(s), affiliation(s),
and text, must fit into a maximum area of 15 cm (5.9") wide by 20
cm (7.9") high. Please allow a top margin of 3.8 cm (1.5")
and 2.54 cm (1") margins on all other sides
Font: Times or Times New Roman, 12 point
Title: bold, centered, all uppercase (except where lowercase letters
are needed for clarity)
Leave one blank line between the title and the author(s)
Author(s) and affiliation(s): mixed upper and lowercase, centered;
if there is more than one author, underline the presenting author's
name. Please include the e-mail address of the presenting author.
Leave two blank lines before beginning text
Text:
text should appear flush left; do not indent
use line spacing sufficiently large enough to allow the abstract to
be read easily, including subscripts, superscripts and Greek letters
a blank line is recommended (space permitting) between new
paragraphs
Please note:
All graphics must be embedded in the Word document.
If special symbols or Greek letters are used, please limit the fonts
to those that are available with the standard distribution of
Microsoft Word. Nonstandard fonts may lead to errors in transmission.
Submission
Abstracts should be sent via e-mail as attached files, created in
Microsoft Word (6.0 through 2000).
Wednesday: New Member Orientation Meeting, Technical Meetings
New Member Orientation Meeting
All new members and first-time attendees should plan to attend this
meeting. Dr. Cam Hubbard, ICDD's Chariman of the Board, and Dr. Tim Fawcett, ICDD's Executive Director will welcome attendees
and present an overview of the ICDD and events held during the meeting
week. Learn how to become involved in ICDD activities. Non-members can
also learn about the membership application process.
Technical Meetings
Materials:
Ceramics Subcommittee - Evgeny Antipov, Chairman
Metals and Alloys Subcommittee - Howard Jones, Chairman
Minerals Subcommittee - Andrew M. McDonald, Chairman
Organic and Pharmaceutical Subcommittee - Gregory A. Stephenson, Chairman
Characterization Methods and Tools:
Electron Diffraction Subcommittee - Alwyn Eades, Chairman
Non-Ambient Diffraction Subcommittee - Charles T. Prewitt, Chairman
X-ray Diffraction Methods Subcommittee - Scott T. Misture, Chairman
X-ray Fluorescence Subcommittee - George Havrilla, Chairman
ICDD Activities:
Education Subcommittee - Susan L. Quick, Chairman
PDF Editorial Staff Subcommittee: ICDD Editor-in-Chief - W. Frank McClune,
Chairman
Thursday: Technical Meetings, Technical Committee Meeting, and
Annual Meeting of Members
Technical Meetings
(continued from Wednesday, see above)
Technical Committee Meeting
The Technical Committee meeting reviews motions and action items from the
numerous technical subcommittees and task groups. Since task groups meet
at different times during the year and some of the subcommittees meet in
concurrent sessions on Tuesday, this meeting provides a summary of key
items to all attendees. In addition, guest speakers are invited to present
topics of current interest. Last year's presentations focused on
pharmaceutical analysis and new inorganic materials research in Russia.
Regional Technical Co-chairs review activities in their region of the
globe (eight regions) and present recommendations for future activities.
Annual Meeting of Members
All members come together for a formal gathering at this meeting to hear
remarks from the Chairman, a review of the Board of Directors' (BoD) and
Headquarters' activities, reports of selected BoD Committees, including
the Technical and Finance Committees, as well as reports of Task Groups.
Corporate activities are also discussed along with any new business items
brought forth by members. An agenda of the meeting will be available in
January.
Friday: Board of Directors' Meetings
These meetings are generally closed to the public.
