ICDD Profile > Spring Meetings 2004 of International Centre for Diffraction Data

The International Centre for Diffraction Data invited its members, friends, and colleagues in the scientific community to our Annual Meeting. The Annual Meeting was held from 22-26 March 2004 at ICDD Corporate Headquarters in Newtown Square, PA. This year, ICDD augmented its typical meetings by adding a Plenary Session on Advanced Instrumentation, a guided tour of the Philadelphia Museum of Art, and followed by an evening Technical Poster Session and reception on Tuesday, 23 March.

Technical Regional Co-chairs' Meeting
This meeting served as a planning meeting for global technical activities in the 2004-2005 fiscal year. Activities included technical workshops, grant-in-aid workshops, and cooperative meetings with other technical organizations.

Highlights Tour of the Philadelphia Museum of Art:
Discover the many unique treasures found within the majestic walls of one of the largest and most important art museums in the United States. This guided tour will offer a spectacular look at a sampling of the over 300,000 works of art sure to meet the varied interests of all in attendance. Built in 1876, this great art institution is home to some of the most brilliant artistic achievements known throughout the world. We invite ICDD members, spouses, families, and guests to join us!

Poster Session and Reception
Following the museum tour, ICDD will sponsor a poster session and reception on Tuesday, 23 March 2004, at 7:30 pm at the Concordville Inn Restaurant (Gold Ballroom), adjacent to the host hotel, the Best Western Concordville Hotel and Conference Center.

ICDD is soliciting poster presentations and their electronic abstract for this event. Here's an opportunity to display and communicate your studies and research results. Posters relating to all aspects of X-ray analysis or work relating to ICDD are welcome. Technical inquiries should be addressed to the Poster Session Team, Jim Kaduk, james.kaduk@innovene.com; Ray Goehner, rpgoehn@sandia.gov; or Scott Misture, misture@alfred.edu. Questions concerning the submission process should be addressed to Eileen Jennings at jennings@icdd.com.

Poster Guidelines
Poster boards are 40 inches high, 60 inches wide, and about 1/4 inch thick, comprised of foam board. Pins and Velcro will be available to attach your poster to the foam boards. Authors are asked to post their presentations approximately 15 minutes prior to the start of the session (~7:15 pm).

GUIDELINES FOR PREPARING ABSTRACTS
Abstracts will be published as-received on the ICDD web page and published in the journal of Powder Diffraction. If you do not want your abstract so published, please note your request in your e-mail message when you submit it. Abstracts must not exceed one page in length and must include the title, author(s), affiliation(s), and the text. To provide uniformity, it is recommended that abstracts be prepared in Microsoft� Word, according to the following guidelines:
Abstract Format

Paper Size: 8.5 x 11 inches; A4 paper must be formatted for 8.5 x 11 inches
Size: Entire abstract, including title, author(s), affiliation(s), and text, must fit into a maximum area of 15 cm (5.9") wide by 20 cm (7.9") high. Please allow a top margin of 3.8 cm (1.5") and 2.54 cm (1") margins on all other sides
Font: Times or Times New Roman, 12 point
Title: bold, centered, all uppercase (except where lowercase letters are needed for clarity)
Leave one blank line between the title and the author(s)
Author(s) and affiliation(s): mixed upper and lowercase, centered; if there is more than one author, underline the presenting author's name
Leave two blank lines before beginning text
Text:
- text should appear flush left; do not indent
- use line spacing sufficiently large enough to allow the abstract to be read easily, including subscripts, superscripts and Greek letters
- a blank line is recommended (space permitting) between new paragraphs

SUBMISSION
Abstracts should be submitted via e-mail, as attached files created in Microsoft� Word, to Eileen Jennings, jennings@icdd.com.

Recently Submitted Abstracts

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Crystal Structure, Polymorphism and Properties of the New Vanadylphosphate Na₄VO(PO₄)₂
(view abstract as Adobe PDF)
R.V. Panin(1), R.V. Shpanchenko(1), A.V. Mironov(1), Yu.A. Velikodny(1), E.V. Antipov(1), J. Hadermann(2)
1 - Department of Chemistry, Moscow State University, 119992 Moscow, Russia
2 - EMAT University of Antwerp (RUCA), Groenenborgerlaan 171, 2020 Antwerp, Belgium

POLYMORPHISM IN ORGANIC LIGHT EMITTING DIODE, OLED, MATERIAL Alq₃
(view abstract as Adobe PDF)
Manju Rajeswaran and Thomas N. Blanton
Eastman Kodak Company, Research & Development Laboratories, Rochester, NY 14650-2106

ANNUAL GROWTH & ENHANCEMENT OF DB
(view abstract as Adobe PDF)
Vesna Bosnic
International Centre for Diffraction Data, Newtown Square, PA

OPTIMIZATION OF ELECTRICAL CONTACTS TO GAN SEMICONDUCTOR USING COMBINATORIAL APPROACH
(view abstract as Adobe PDF)
A.V. Davydov(1), L.A. Bendersky(1), D. Josell(1), W.J. Boettinger(1), P.K. Schenck(2), M.D. Vaudin(2), K.-S. Chang(3) and I. Takeuchi(3)
(1) Metallurgy Division / 2Ceramic Division, NIST, Gaithersburg, MD
(3) Dept. of Materials Science and Engineering, University of Maryland, College Park, MD

NEW DEVELOPMENTS IN PDF-4 FUNCTIONALITY: SEARCH PREFERENCES, SEARCH-INDEXING AND PATTERN MATCHING
(view abstract as Adobe PDF)
J. Faber, J. Blanton, M. Kottenhahn, F. Needham, Y. Si, J. Sunzeri, C. Weth
International Centre for Diffraction Data, Newtown Square, PA

ELEMENTAL CORRELATIONS AND PHASE IDENTIFICATION USING X-RAY FLUORESCENCE AND AUTOMATED SPECTRAL IMAGE ANALYSIS SOFTWARE
(view abstract as Adobe PDF)
George J. Havrilla, Thomasin Miller, Michael Keenan* and Paul Kotula*
Los Alamos National Laboratory, Los Alamos, NM
*Sandia National Laboratory, Albuquerque, NM

CONFOCAL MICRO X-RAY FLUORESCENCE INSTRUMENT FOR RADIOACTIVE MATERIALS CHARACTERIZATION
(view abstract as Adobe PDF)
George J. Havrilla, and Ning Gao
Los Alamos National Laboratory, Los Alamos NM
X-Ray Optical Systems, Albany, NY

QUALITY OF PUBLISHED CRYSTAL STRUCTURES: A DATABASE STUDY
(view abstract as Adobe PDF)
S. Kabekkodu
International Centre for Diffraction Data
Newtown Square, PA 19073

CALCULATED PATTERNS QUALITY MARK: THE TASK GROUP REPORT
(view abstract as Adobe PDF)
S. Kabekkodu, C. Hubbard, J. Kaduk, E. Antipov, M. Bennett, P. Wallace, F. Rotella
Calculated Patterns Quality Mark Task Group, International Centre for Diffraction Data
Newtown Square, PA 19073

CRYSTAL STRUCTURE OF GUAIFENESIN, 3-(2-METHOXYPHENOXY)-1,2-PROPANEDIOL
(view abstract as Adobe PDF)
James A. Kaduk, BP Chemicals, P.O. Box 3011 MC F-9, Naperville IL 60566

INDEXING OF POWDER DIFFRACTION PATTERNS WITH THE DICHOTOMY ALGORITHM: STRATEGY AND PERFORMANCE
(view abstract as Adobe PDF)
A. Boultif * and D. Lou�r
LCSIM, Universit� de Rennes (UMR 6511 CNRS), France

A POWDER DIFFRACTION STUDY OF TWO NITRATE COMPOUNDS OBTAINED BY THERMAL DECOMPOSITION: TEMPERATURE-DEPENDENT X-RAY DIFFRACTION AND AB INITIO STRUCTURE DETERMINATION
(view abstract as Adobe PDF)
T. Bataille, N. Audebrand, A. Boultif * and D. Lou�r
LCSIM, Universit� de Rennes (UMR 6511 CNRS), France

POLYMORPHISM OF Mn-CONTAINING HYDROXYAPATITES; TRANSFORMATION FROM THE HEXAGONAL APATITE TO THE RHOMBOHEDRAL WHITHLOCKITE STRUCTURE.
(view abstract as Adobe PDF)
I. Mayer(1), Y. Schleich(1) and D. Reinen(2).
1 Department Inorganic & Analytical Chemistry, Hebrew University Jerusalem, 91904 Jerusalem, Israel;
2 Fachbereich Chemie, Philipps Universit�t Marburg, Marburg, Germany.

QUALITY MARKS IN THE EXPERIMENTAL POWDER DIFFRACTION FILE�
(view abstract as Adobe PDF)
W. Frank McClune
ICDD, 12 Campus Blvd., Newtown Square, PA 19073, mcclune@icdd.com

TEMERATURE CALIBRATION FOR HIGH-TEMPERATURE X-RAY DIFFRACTION
(view abstract as Adobe PDF)
Michael D. Dolan, Slawomir I. Zdzieszynski and Scott T. Misture
Alfred University, Alfred NY

ANALYSIS OF MANNITOL X-RAY DIFFRACTION PATTERNS
(view abstract as Adobe PDF)
J. Faber, T. Fawcett, J. Kaduk, A. Kern, D. Louer, F. Needham, R. B. Ortega, P. W. Stephens, G. Stephenson, P. G. Varlashkin
International Centre for Diffraction Data, BP Amoco Chemicals, Bruker AXS GmbH Germany, University de Rennes I, France, Rigaku/MSC, State University of New York at Stony Brook, Eli Lilly and Company, GlaxoSmithKline

PDF-4/Organics 2004 APPLICATION
(view abstract as Adobe PDF)
J. Blanton, D. Conte, J. Faber, T. Fawcett, M. Kottenhahn, F. Needham, Y. Si, J. Sunzeri, C. Weth
International Centre for Diffraction Data, Newtown Square, PA

ZEOLITE FORMATION IN THE SYNTHESIS OF ALUMINOSILICATE INORGANIC POLYMERS: COMBINING THE POWER OF THE PDF AND SYNCHROTRON DATA
(view abstract as Adobe PDF)
Matthew Rowles and Brian O�Connor
Materials Research Group, Department of Applied Physics, Curtin University of Technology, GPO Box U1987, Perth, WA 6845. Australia

INFLUENCE OF HETEROGENETY OF A PROTECTIVE MAGNETITE FILM ON THE ACCURACY OF PHASE IDENTIFICATION
(view abstract as Adobe PDF)
Vjera Novosel � Radovic, Drago Bauman, Nikol Radovic*
Steel and Pipe Works, 44105 Sisak, Croatia
*University of Zagreb Faculty of Geodesy, 10000 Zagreb, Croatia

XRD AND HRTEM ON NANOCRYSTALLINE THIN FILMS
(view abstract as Adobe PDF)
David Rafaja, Volker Klemm, Gerhard Schreiber and Dietrich Heger
Institute of Physical Metallurgy, Freiberg University of Mining and Technology
D-09599 Freiberg, Germany

A NOVEL SAMPLE-HANDLING APPROACH FOR XRD ANALYSIS WITH MINIMAL SAMPLE PREPARATION
(view abstract as Adobe PDF)
P. Sarrazin(1), S. Chipera(2), D. Bish(3), D. Blake(4), D. Vaniman(2), C. Bryson(1)
1 - Apparati Inc., 110 Pioneer Way, Suite I, Mountain View, CA94041, (psarrazin@apparati.com),
2 - Los Alamos National Laboratory, MS D469, Los Alamos, NM 87545,
3 - Indiana University, 1001 E 10th St., Bloomington IN 47405,
4 - NASA Ames Research Center, MS 239-4, Moffett Field, CA 94035.

A SPREADSHEET TO TEST IF INSTRUMENT PERFORMANCE SATISFIES ICDD QUALITY CRITERIA.
(view abstract as Adobe PDF)
D.J Taylor. British Crystallographic Association, Industrial Group

STRUCTURE AND ELECTRONIC PROPERTIES OF THE o-MoRuP SUPERCONDUCTOR PREPARED AT HIGH PRESSURE.
(view abstract as Adobe PDF)
W. Wong-Ng, Ceramics Division, National Institute of Standards and Technology;
J.A. Kaduk, BP-Amoco Research Center, Naperville, IL 60566;
W.Y. Ching, Y.N. Xu, Dept. of Physics, University of Missouri-Kanasa City, MO 64110; and
I. Shirotani, Muroran Institute of Technology, 27-1, Mizumoto, Muroran-shi 050-8585, Japan.

POSITIONAL DISORDER AND CONDUCTION PATH IN OXIDE-ION CONDUCTORS
(view abstract as Adobe PDF)
Masatomo Yashima*
Department of Materials Science and Engineering, Interdisciplinary Graduate School of Science and Engineering, Tokyo Institute of Technology, 4259 Nagatsuta-cho, Midori-ku, Yokohama, 226-8502, Japan??
* yashima@materia.titech.ac.jp http://www.materia.titech.ac.jp/~yashima/Yashima-Eng.html

PREPARATION, STRUCTURE AND ELECTROCHEMICAL STUDY ON ε-VOPO₄
(view abstract as Adobe PDF)
Yanning Song, Peter Y. Zavalij, M. Stanley Whittingham
Institute for Materials Research and Department of Chemistry,
State University of New York at Binghamton, Binghamton, NY 13902

*New Member Orientation Meeting
All new members and first-time attendees should plan to attend this meeting. Dr. Tim Fawcett, ICDD's Executive Director will welcome attendees and present an overview of the ICDD and events held during the meeting week. Learn how to become involved in ICDD activities. Non-members can also learn about the membership application process.

Technical Committee Meeting
The Technical Committee meeting reviews motions and action items from the numerous technical subcommittees and task groups. Since task groups meet at different times during the year and some of the subcommittees meet in concurrent sessions on Tuesday, this meeting provides a summary of key items to all attendees. In addition, guest speakers are invited to present topics of current interest. Regional Technical Co-chairs review activities in their region of the globe (eight regions) and present recommendations for future activities.

Annual Meeting of Members
All members come together for a formal gathering at this meeting to hear remarks from the Chairman, a review of the Board of Directors' (BoD) and Headquarters' activities, reports of selected BoD Committees, including the Technical and Finance Committees, as well as reports of Task Groups. The results of the 2004 Election of Directors will be formally announced to the membership at this meeting. Corporate activities are also discussed along with any new business items brought forth by members.