ICDDICDD Profile > 2004 March Meetings > 2004 Annual Spring Meeting Summary

 ICDD Spring Meetings
During the week of 22-26 March 2004, ICDD members gathered at the Newtown Square Headquarters office for their spring meetings. This annual event provided forums for scientists, representing a wide range of disciplines, to discuss the business and technical aspects of the ICDD and the Powder Diffraction File. Members, many of who represent leaders in the XRD & XRF fields, also benefited from interactions with peers working in various fields of materials characterization, often in environments similar to their own.
ICDD's committees, subcommittees, task groups and directors met in accordance with the following schedule.

This year's Plenary Session focused on Advanced Instrumentation. Many thanks are extended to our plenary speakers for their contributions:

  • Martijn Fransen, PANalytical, Almelo, The Netherlands: Advanced Optics and Detection Systems, What Do They Offer the Research Community?
  • Bob He, Bruker AXS, Madison, WI: Two-dimensional X-ray Diffractometer: Convention, Components and Configuration
  • Hideo Toraya, Rigaku Corporation, Japan: A High-Performance Silicon Photodiode Detector for Fast X-ray Counting
  • Pierre Villars, Materials Phases Data System (MPDS), Switzerland: New Structural Prototyping System used by the LINUS PAULING FILE and proposed for the Powder Diffraction File (PDF)

Following the plenary, members and guests were treated to a highlights tour of the Philadelphia Museum of Art. Built in 1876, this great art institution is home to some of the most brilliant artistic achievements known throughout the world. The guided tour offered a spectacular look at a sampling of the over 300,000 works of art housed at the museum.

A technical poster session and accompanying reception completed Tuesday's activities. The Best Western Hotel and Conference Center in Concordville hosted ICDD's most successful Spring Meetings' poster session to date. Approximately 30 posters were on display, allowing attendees yet another venue to communicate their studies and exchange information with fellow scientists. Watch for the publication of the poster abstracts in the June issue of Powder Diffraction.

The Technical Committee Meeting served as a summary of all subcommittee activities and brought forth all motions requiring Board of Directors' approval. The Regional Co-chairs also provided a summary of ICDD related activities in their area of the world. Those reporting included: Shao Fan Lin, China; Masatoma Yashima (for Nobuo Ishizawa), Eastern Pacific Rim; David Rafaja, European Community; David Taylor, United Kingdom; James A. Kaduk, North America; Evgeny Antipov, Newly Independent States; Brian H. O'Connor, Indian Ocean Rim, and J. Miguel Delgado, South America. Minutes of the individual subcommittee meetings will be posted on this site, as they become available.

Camden Hubbard chaired the Annual Meeting of Members and provided a summary of the Board of Directors' and headquarters' activities. Tim Fawcett, Executive Director, reported on ICDD's strategic plans; Donna Barry, standing in for Treasurer, Julian Messick, gave a review of the financial status of the organization; Awards, Grant-in-Aid, Membership, and Technical Committees, as well as the IXAS group, also reported. Terry Maguire, Corporate Secretary, officially announced the results of the 2004 election of officers and directors. Cam Hubbard took this opportunity to recognize several members who were named as award recipients.

Several awards were announced at the Annual Meeting of Members:

  • Shao Fan Lin of the Nankai University, People's Republic of China was recognized for his 17 years as a participant in the ICDD Grant-in-Aid Program as he was named the 2004 Distinguished Grantee recipient. Prof. Lin has published approximately 700 patterns in the PDF. During the meeting, Prof. Lin presented a lecture on his research work as reflected in his grant submissions, and the ICDD activities in China from his perspective as the Technical Regional Co-chair for that global area. Designed to provide high-quality reference XRD patterns to the PDF, ICDD's Grant-in-Aid Program is open to all qualified investigators in the X-ray diffraction field. The Program currently supports 55 grant recipients located in 23 countries. - more about Dr. Lin
  • Following more than 30 years of service to the ICDD, Dr. Robert Snyder, Georgia Institute of Technology, was named as the 2004 Distinguished Fellow. Dr. Snyder served the organization in various capacities: as a member and leader on various committees, subcommittees, task groups, and most recently as Chairman of the Board of Directors. Over the years, he was often referred to as the "ICDD ambassador to the world". Dr. Snyder's relentless energy and vision served as catalysts in bringing a new dimension to the PDF. In pursuing the goal of total pattern analysis, he acted as the key visionary in the value of establishing agreements with major database organizations, which have led to the increased size of the PDF, as well as the added-value that these agreements brought to the File. - more about Dr. Snyder
  • The following two awards will be presented at the Plenary Session of the 53rd Annual Denver X-ray Conference (DXC), being held in Steamboat Springs, Colorado, on 4 August 2004:
    • The 2004 McMurdie Award will be presented to Winnie Wong-Ng. Dr. Wong-Ng has made extensive and valuable contributions to the Powder Diffraction File, mainly through her editorial work and her contributions of reference patterns of high Tc-related phases to the File.
    • To recognize his unique and extremely valuable contributions to the scope and breadth of the PDF, Robert Snyder will be named the 2004 Hanawalt Award recipient. Under Dr. Snyder's vision and leadership, collaborative agreements were established with Fachsinformationzentrum in Karlsruhe, Cambridge Crystallographic Data Centre, and Materials Phases Data System, leading to the tremendous growth of the PDF. Further, these agreements have positioned the PDF to evolve as the major tool for full pattern analysis in the decades to come.

2004 marked an election year for the ICDD. The membership elected several new directors, who joined those serving existing terms, to lead the organization over the next 2 years. Congratulations to the 2004-2006 Board of Directors:

Chairman - James Kaduk
Vice Chairman - Paolo Scardi
Treasurer - Julian Messick
Corporate Secretary - Terry Maguire
Executive Director - Timothy Fawcett
Chairman, Technical Committee - Raymond Goehner
Directors-at-Large, Board of Directors - Evgeny Antipov, Tom Blanton, Herbert Goebel, Ting Huang, Daniel Lour
Past Chairman - Camden R. Hubbard

The retiring members of the Board, Brian O'Connor, David Rendle, Robert Snyder, and David Taylor, were recognized for generously sharing their time and talents with the organization during their tenure.

ICDD also thanked the members who served on the election ballot but were not elected: J. Miguel Delgado, Nobuo Ishizawa, Scott Misture, and Dave Taylor.

As the new Board of Directors assumed office, one of its initial tasks was to re-structure the committees and subcommittees. Click here to view the new Technical Subcommittee rosters. ICDD is grateful to the Committee and Subcommittee Chairs, whose terms were completed in March, for their cooperative and successful efforts. The volunteer efforts and dedication of our active members is crucial to our success in effectively serving the scientific community.

Following recommendation from the Membership Committee and BoD approval, twenty-eight applicants were elected to membership, adding to the existing 311 active members. ICDD welcomes its newest members, and looks forward to their contributions:

  1. S.N. Achary, Bhabha Atomic Research Center, Mumbai, India
  2. Nicholas Barbi, nSynergies, Inc., Yardley, PA, USA
  3. Martha Davidovich, Bristol-Myers Squibb, New Brunswick, NJ, USA
  4. Peter DeSanto, NIST, Berwick, PA ,USA
  5. Mark Dirken, PANalytical, EA Almelo, The Netherlands
  6. Camille Jones, NIST, Gaithersburg, MD, USA
  7. Walter Kalceff, University of Technology, Sydney, Broadway, Australia
  8. Pavel Karen, University of Oslo, Oslo, Norway
  9. Philip Lightfoot, University of St. Andrews, St. Andrews Fife, United Kingdom
  10. J. David Londono, Dupont Central Research & Development, Wilmington, DE, USA
  11. Michael Lufaso, NIST, Gaithersburg, MD, USA
  12. Thomasin C. Miller, X-ray Optical Systems, Inc., East Greenbush, NY, USA
  13. Ellouze Mohamed, Faculte des Sciences de Sfax, Sfax, Tunisia
  14. Conal Murray, IBM Watson Research Center, Yorktown Heights, NY, USA
  15. Jeffrey Nicolich, PANalytical, Natick, MA, USA
  16. Ismail Cevdet Noyan, IBM T. J. Watson Research Center, Yorktown Heights, NY, USA
  17. Suminar Pratapa, Institute of Technology, Surabaya, Indonesia
  18. Murugan Ramalingam, National University of Singapore, Singapore
  19. Lei Shi, University of Science & Technology of China, Hefei Anhui, People's Republic of China
  20. Valery Vlasenko, Rostov State University, Rostov-on-Don, Russia
  21. Pamela Whitfield, National Research Council Canada, Ottawa, Ontario, Canada
  22. Craig Williams, University of Wolverhampton, West Midlands, United Kingdom
  23. Donald Windover, NIST, Gaithersburg, MD, USA
  24. Zhi Yang, NIST, Gaithersburg, MD, USA
  25. Yuegang Zhang, Argonne National Laboratory, Argonne, IL, USA
  26. Zeng, Weitao, Jilin University, Changechuni Jilin, People's Republic of China
  27. Douglas Smith, Rochester, NY, USA
  28. Yucheng Lan, Temple University, Philadelphia, PA, USA


Members play an essential role in the development of the ICDD, its database products and services, tailoring those products and services to the needs of the global community. Become an ICDD member and contribute your expertise! Click here to apply online.

Mark your calendar and join us for the 2005 ICDD Meetings which will be held 14-18 March 2005.


Home | Profile | Products | Membership | Education | Resources | DXC | ToC | Contact | Search

 © 1997 - 2017 by JCPDS - International Centre for Diffraction Data®
of this page and all contents. All Rights Reserved. 
Please feel free to send any queries, comments, or suggestions to: webmaster@icdd.com

International Centre for Diffraction Data
12 Campus Boulevard
Newtown Square, PA 19073-3273 USA
PHONE: 610-325-9814
FAX: 610-325-9823