ICDD > ICDD Profile > 2005 Annual Spring Meeting Schedule > Technical Meeting Agenda - Register

International Centre for Diffraction Data
TECHNICAL COMMITTEE AGENDA
Thursday, 17 March 2005
10:00-12:30 p.m.
Conference Room A
Ray Goehner, Chairman

1. Call to Order and Opening Remarks - R. Goehner

2. Roll Call and Attendance

3. Additions and/or Deletions to the Agenda - R. Goehner

4. Approval of the Minutes - R. Goehner

5. Introduction of Guests - J. Kaduk

6. Reports/Presentations of Technical Regional Co-Chairs and International Guests

A. China - X. Chen
B. Newly Independent States - E. Antipov
C. North America - R. Goehner

7. Subcommittee Reports and Motions

A. Materials - E. Antipov

1) Ceramics - P. Zavalij
2) Metals and Alloys - P. Wallace
3) Minerals - P. Heaney
4) Organic and Pharmaceutical - F. Wireko
5) Polymers - TBD

B. Characterization Methods and Tools - S. Misture

1) Electron Diffraction - J. Michael
2) Non-Ambient Diffraction - A. Payzant
3) X-ray Diffraction Methods - D. Balzar
4) X-ray Fluorescence - G. Havrilla

C. ICDD Activities

1) Education - C. Segre
2) PDF Editorial Staff - F. McClune

8. New Business - R. Goehner

9. Adjournment

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