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ICDD >
ICDD Profile > 2005
Annual Spring Meeting Schedule > Technical Meeting
Agenda - Register
International
Centre for Diffraction Data
TECHNICAL COMMITTEE AGENDA
Thursday, 17 March 2005
10:00-12:30 p.m.
Conference Room A
Ray Goehner, Chairman
1. Call to Order and Opening Remarks - R. Goehner
2. Roll Call and Attendance
3. Additions and/or Deletions to the Agenda - R. Goehner
4. Approval of the Minutes - R. Goehner
5. Introduction of Guests - J. Kaduk
6. Reports/Presentations of Technical Regional Co-Chairs and International
Guests
A. China - X. Chen
B. Newly Independent States - E. Antipov
C. North America - R. Goehner
7. Subcommittee Reports and Motions
A. Materials - E. Antipov
1) Ceramics - P. Zavalij
2) Metals and Alloys - P. Wallace
3) Minerals - P. Heaney
4) Organic and Pharmaceutical - F. Wireko
5) Polymers - TBD
B. Characterization Methods and Tools - S. Misture
1) Electron Diffraction - J. Michael
2) Non-Ambient Diffraction - A. Payzant
3) X-ray Diffraction Methods - D. Balzar
4) X-ray Fluorescence - G. Havrilla
C. ICDD Activities
1) Education - C. Segre
2) PDF Editorial Staff - F. McClune
8. New Business - R. Goehner
9. Adjournment
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