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ICDD > ICDD
Profile
> 2006
Annual Spring Meeting
Annual Meeting Schedule
Monday: Task Groups and Board
of Directors' (BoD) Committees Meetings
Task Groups
The Schedule - Meetings
of the following Task Groups were held:
- Metals and Alloys Task Group
- Ceramic Task Group
BoD Committees
The Schedule - Meetings
of the following Board of Directors' Committees were held:
- Finance Committee - David Taylor, Chairman
- Marketing Subcommittee,
Robert L. Snyder, Chairman
- Awards Committee – Daniel Louer, Chairman
- Grant-in-Aid Committee – Bill Mayo, Chairman
- Long Range Planning Executive Committee – Cyrus Crowder, Chairman
- Meeting Support Committee – Raymond Goehner, Chairman
- Membership Committee – Ting Huang, Chairman
- Scholarship Committee – Brian O’Connor, Chairman
Tuesday: Technical Regional
Co-Chairs' Meeting, Plenary Session, Social Event
Technical Regional Co-chairs' and Technical Subcommittee Chairs’ Meeting
All Regional Co-chairs and Technical Subcommittee Chairs were invited
to attend this meeting. There was a planning meeting for global
technical activities in the 2006-2007 fiscal year. Activities included
technical workshops, grant-in-aid workshops, and cooperative meetings
with other technical organizations. This meeting also acquainted
and reviewed the procedures and duties of Technical Subcommittee Chairs.

9 a.m. - Noon
ICDD Headquarters Conference Room A
Organized by T. Fawcett, ICDD, Newtown Square, PA
The plenary session featured guest speakers from Venezuela and Japan, Professors José Miguel Delgado and Nobuo Ishizawa. Dr. John Faber, ICDD's Principal Scientist discussed the development of PDF-4+, ICDD's newest product, and future product enhancements. Finally, the plenary highlighted some recent developments in electron backscatter diffraction analysis by Scott Sitzman of HKL Technology, Inc..

(Ishizawa, Sitzman, Delgado, Faber)
Opening Remarks
Tim Fawcett
9:15 a.m. - 9:50 a.m.
Phase Identification, Strain Analysis and Data Subset Analysis
using Electron Backscatter Diffraction (EBSD)
Scott Sitzman, HKL Technology, Inc.
Pasadena, CA, U.S.A.
9:55 a.m. - 10:30 a.m.
New Developments and Capabilities in PDF-4+
John Faber, International Centre for Diffraction Data
Newtown Square, PA, U.S.A.
Break: 10:30-10:45
10:45 a.m. - 11:20 a.m.
Structural Characterization of the Cu2(Se,Te)3-(Ga,In)2(Se,Te)3 Semiconducting Systems
José Miguel Delgado, University de Andes
Merida, Venezuela
11:25 a.m. - 12:00 noon
Diffusion of Lithium Atoms in the Lithium Manganese Spinel
with a Disordered Structure
Nobuo Ishizawa, Nagoya Institute of Technology
Tajimi, Japan
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- 1:00 - 4:30
Participants discovered the world's cultural heritage with a docent-led tour highlighting an impressive collection of archeological and anthropological artifacts at The University of Pennsylvania Museum of Archeology and Anthropology - http://www.museum.upenn.edu/.
 Poster Session and Reception -
6:30 - 8:30 p.m.
Following the bus trip to
the museum, ICDD sponsored a poster session and reception
on Tuesday, 21 March 2006 at the Concordville Inn Restaurant
(Gold Ballroom), adjacent to the host hotel, the Best Western Concordville
Hotel
and Conference Center. Posters relating to all aspects of X-ray analysis were welcome.

(click on photos to see larger version)
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Poster Presentations included:
CHARACTERIZATION OF SILVER IMAGE FORMATION IN A SILVER BEHENATE PHOTOTHERMOGRAPHIC IMAGING ELEMENT USING X-RAY DIFFREACTION TECHNIQUES
Thomas N. Blanton*, Mark Lelental, Craig L. Barnes, Eastman Kodak Company,
Research & Development, 1999 Lake Avenue, Rochester, New York, 14650-2106
* Electronic mail: thomas.blanton@kodak.com, phone: 585-722-3323
BIBLIOGRAPHIC UPDATE FOR 2005
Nicole M. Ernst, M.L.I.S., and Albert C. Rohrman
ICDD, Newtown Square, PA 19073
NEUTRON AND X-RAY DIFFRACTION: COMPLEMENTARY METHODS FOR STRUCTURE SOLUTION
Christina Hoffmann, Spallation Neutron Source, Oak Ridge National Laboratory, P.O.Box 2008, Oak Ridge, TN 37831-6475, USA, phone: (865)567-5127, email:hoffmanncm@sns.gov
ADVANCES IN NEUTRON SOURCES AND SCATTERING FACILITIES AT ORNL
Camden R. Hubbard, Materials Science & Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA 37830-6064
SEMI-AUTOMATION OF STRUCTURE TYPE ASSIGNMENT
Soorya N Kabekkodu, International Centre for Diffraction Data
Newtown Square, PA 19073
A PDF-4 ORGANICS 2006 APPLICATION NOTE CALCIUM TARTRATE TETRAHYDRATE WINE CRYSTALS
James A. Kaduk, Innovene USA LLC, P.O. Box 3011 MC F-9, Naperville IL 60566
POWDER DIFFRACTION FILE SUBFILE DEFINITIONS
The ICDD Editorial Staff, Consulting Editors and Volunteer Editors
POWDER DIFFRACTION FILE SUBFILE CODING
F. McClune, V. Bosnic, and L. Lanno - International Centre for Diffraction Data - Newtown Square, PA
NANOCRYSTAL PHASE IDENTIFICATION BY LATTICE FRINGE FINGERPRINTING IN TRANSMISSION ELECTRON MICROSCOPES
Peter Moeck * , Bjoern Seipel * , Ruben Bjorge - Department of Physics, Portland State University , P.O. Box 751, Portland , OR 97207-0751 , U.S.A. , * Oregon Nanoscience and Microtechnologies Institute, http://www.onami.us
PDF-4/ORGANICS 2006 REFERENCE POWDER PATTERNS AND THEIR PHARMACEUTICAL APPLICATION
F. Needham, J. Faber, T. G. Fawcett
International Centre for Diffraction Data, USA
X-RAY DIFFRACTION AND XAFS STUDY OF NIOBIUM DISPLACEMENT IN
AURIVILLIUS PHASE Bi2.25Ca0.5Na0.25Nb2O9
Valery Vlasenko, Ànatoliy Shuvaev, Irina Pirog, Dmitriy Drannikov, Ivan Zarubin
Institute of Physics, Rostov State University, Stachki ave., 194, 344090 Rostov-on-Don,
Russia
STRUCTURE AND DIELECTRIC PROPERTIES OF Bi4Pb1.5Ti4.5O16.5 AND Bi5Ca0.5GaTi3.5O16.5
A. Shuvaev, V. Vlasenko, I. Zarubin
Research Institute of Physics, Rostov State University, pr. Stachki 194, Rostov-on-Don,
344090 Russia
EXPLORATION AND STRUCTURAL DETERMINATION
OF SEVERAL NEW BORATES
L. Wu, X.Z. Li, W.Y. Wang, M. He, Y. P. Xu, X.L. Chen
Beijing National Laboratory for Condensed Matter Physics, Institute of Physics,
Chinese Academy of Sciences, P.O. Box 603, Beijing 100080, P.R. China
ROUTE TO GAN AND VN ASSISTED BY CARBOTHERMAL REDUCTION PROCESS
H.Z. Zhao, M. Lei, W.Y. Wang, J.K. Jian, X.L. Chen
Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, P.O. Box 603, Beijing 100080, P.R. China
NEGATIVE REFRACTION: AN INTRINSIC PROPERTY OF
UNIAXIAL CRYSTALS
X. L. Chen, Ming He, YinXiao Du, W. Y. Wang, D. F. Zhang
Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, P.O. Box 603, Beijing 100080, P. R. China
X-Ray DIFFRACTION STUDIES OF TWO GERMANIUM Sr8Ga16Ge30 and Cs8Na16Ge136 CLATHRATES: PROMISING CANDIDATES FOR THERMOELECTRIC APPLICATIONS
W. Wong-Ng, J.A. Kaduk 1 , M. Beekman 2 , G.S. Nolas 2 , Z. Yang and Q. Huang, Materials Science and Engineering Laboratory, NIST, Gaithersburg, MD 20899; 1 Innovene USA LLC, Naperville, IL 60566; 2 Physics Department, University of South Florida; Tampa, FL 33620
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Wednesday: New Member Orientation
Meeting, Technical Meetings
New Member Orientation Meeting
All new members and first-time attendees were invited to attend this meeting.
Dr. Tim Fawcett, ICDD's Executive Director welcomed attendees and presented
an overview of the ICDD and events held during the meeting week. Non-members can learned about the
membership application process.
Technical Meetings
The Schedule - Meetings
of the following Technical Subcommittees were held prior to
the Technical Committee Meeting:
Materials Subcommittees
Ceramics Subcommittee - Peter
Zavalij
Metals and Alloys Subcommittee - Peter
Wallace
Minerals Subcommittee - Christina Hoffman
Organic and Pharmaceutical Subcommittee -
Fred Wireko
Polymers Subcommittee - tbd
Characterization Methods and Tools Subcommittees
Electron Diffraction Subcommittee - Joseph Michael
Non-Ambient Diffraction Subcommittee -
Andrew Payzant
Synchrotron Diffraction Methods Subcommittee -
Peter Lee
X-ray Diffraction Methods Subcommittee -
Davor Balzar
X-ray Fluorescence Subcommittee - George
Havrilla
ICDD Activities Subcommittees
Education Subcommittee - Carlo Segre
PDF Editorial Staff Subcommittee -
ICDD Editor-in-Chief - W.
Frank McClune
Thursday: Technical Meetings,
Technical Committee Meeting, and Annual Meeting of Members
Technical Meetings
(continued from Wednesday, see above)
Technical Committee Meeting
The Technical Committee meeting reviewed motions and action items from
the numerous technical subcommittees and task groups. Since task groups
meet at different times during the year and some of the subcommittees
meet in concurrent sessions on Tuesday, this meeting provided a summary
of key items to all attendees. Regional Technical Co-chairs
reviewed activities in their region of the globe (eight regions) and
presented recommendations
for future activities.
Annual Meeting of Members
All members came together for a formal gathering at this meeting to hear
remarks from the Chairman, a review of the Board of Directors' (BoD)
and Headquarters' activities, reports of selected BoD Committees, including
the Technical and Finance Committees, as well as reports of Task Groups.
Corporate activities were also discussed.
Friday: Board of Directors' Meeting
This meeting was closed to the public.
Detailed
Agendas |