Plenary Speaker Bios:

 

 

Suchomel

Amy Gindhart
International Centre for Diffraction Data
Newtown Square, PA, U.S.A.

Ms. Gindhart is a Senior Scientific Editor, Project Leader of Data Entry and Processing, and the ISO Quality Management Representative at the International Centre for Diffraction Data. Some of her current responsibilities include production of the PDF-4+ products as well as an Instructor at the Rietveld Refinement and Indexing Workshop at the ICDD.

Her Master’s Thesis was on the negative thermal expansion of AA’W312 (A,A’=Mg2+,Zr4+;Mg2+;Hf4+) compounds with respect to temperature and pressure phase transitions. She carried out the experiments between the University of Toledo, Cornell High Energy Synchrotron Source, and the National Institute of Standards and Technology’s Center for Neutron Research. She also has done previous research on the analyzation of conformative effects of E. Coli GMP Synthetase using MALDI-TOF Mass Spectroscopy.

Amy received her Bachelor’s of Science degree in Chemistry from Lebanon Valley College, Annville, PA and went on to receive her Master’s Degree in Chemistry/X-ray Crystallography from The University of Toledo, Toledo, OH. She received several accolades during her graduate career including the Pauling Poster Prize and the Margaret C. Etter Student Lecturer Award both from the American Crystallographic Association among other presentation awards.

Suchomel

Bob B. He

Dr. Bob He is the Director of Innovation and Business Development XRD2 at Bruker AXS, and concurrently served as a Distinguished Visiting Professor at the Indian Institute of Technology at Kharagpur. He was an Assistant Professor in Materials Science and Engineering at Xi'an Jiaotong University, China, from 1981-1986. He worked on X-ray diffractometry and methods development since 1986, and earned his Ph.D. in Materials Science from Virginia Tech in 1992.

Dr. He has delivered many presentations as an invited speaker, plenary speaker, and instructor in two-dimensional X-ray diffraction at universities, conferences, national labs and industrial technical centers. He has obtained sixteen U.S. patents and two R&D 100 Awards for the related instruments, and published over thirty papers and a textbook on two-dimensional X-ray diffraction. Dr. He contributed a chapter on stress measurement by 2D detector to the European Standard on Residual Stress. By invitation, he has recently contributed a chapter on 2D powder diffraction to the International Tables for Crystallography, Volume H.

Suchomel

Brian Toby

Brian Toby is the section head for scientific software and a Senior Scientist at the X-ray Science Division within the Advanced Photon Source (APS) of Argonne National Laboratory. Previously, he served as a group leader and initially deployed the high resolution and high-throughput robot-enabled powder diffractometer, 11-BM. He designed and implemented the mail-in access system, which has allowed 11-BM to become the highest publishing beamline at the APS.

Over the past three decades, Brian has worked with powder diffraction crystallography while employed in one academic lab, two industrial labs and two government labs, primarily working with synchrotron and neutron instrumentation. He is a Fellow of the International Centre for Diffraction Data, where he has chaired several subcommittees and a task force; he is active within the American Crystallographic Association and has been a member of two International Union of Crystallography commissions. He has also served as vice-chair and chair of the US National Committee for Crystallography.

His research interests include structure refinement determination techniques, informatics for powder diffraction, and crystallographic studies of metal oxides and zeolitic materials. Brian has coauthored over 130 refereed papers with >7000 citations (h-index 35). He has written several popular crystallographic software packages, CMPR, CIFTOOLS (pdCIFplot) and EXPGUI, and is also the principle author of the powder diffraction implementation of the crystallographic information file, pdCIF. In 1989, he developed, with Takeshi Egami, the first code to fit local structure in real-space for crystalline materials using pair-distribution functions.

In 2005, he received a Bronze Medal from the U.S. Department of Commerce for his software work.  In 2006, Brian and Jim Kaduk launched a new section dedicated to crystallographic instruction within the journal Powder Diffraction. In 2011, Brian joined Robert Von Dreele in the creation of a new universal crystallographic computation package, GSAS-II.

Suchomel

Jacco van de Streek

Jacco van de Streek received a PhD in computational solid-state chemistry from the Radboud University Nijmegen in the Netherlands in 2001. After his PhD, he moved to the UK to join Sam Motherwell’s Research Group at the Cambridge Crystallographic Data Centre, contributing to e.g. DASH and Mercury. During his postdoc at the University of Frankfurt, Jacco solved over 20 crystal structures of organic pigments from powder diffraction data. Following his one-year postdocship, he started at the German company Avant-garde Materials Simulation that developed the crystal-structure prediction software that was successful in the 2007 Crystal Structure Prediction Blind Test.

He now works at the University of Copenhagen as an Associate Professor and is Group Leader of the Computational Pharmaceutical Materials Science Group funded by a five-year grant from the Villum Foundation. Jacco has co-authored more than 60 papers, which have attracted more than 5,000 citations, and has given over 25 oral presentations at international conferences.

Suchomel

Kai Zhong
International Centre for Diffraction Data
Newtown Square, PA, U.S.A.

Dr. Zhong received his M.S. in Material Science at Zhejiang University in 2008, and obtained his Ph.D. in Chemical Engineering at the University of Maryland (UMD) in 2012. He investigated the phase transformation of AgCu particles during the spray pyrolysis process by using X-ray diffraction. The results have led to several publications and have been presented in American Chemical Society (ACS) Meetings. From 2012 to 2013, he served at the X-ray Crystallographic Center in UMD where he was involved with collecting data and giving tutorials to college students using XRD.
Dr. Zhong joined the ICDD in 2013 as a Senior Scientist. He is now working on the Pharmaceutical Top 200 project. An Argonne-IIT-ICDD cooperative project aimed at collecting diffraction and structure information of top listed commercial pharmaceuticals. As a result of this project, 75 patterns have been submitted to the Powder Diffraction File (PDF) database and 23 new crystal structures have been solved. Additionally, he has also been working on new features development of PDF data analysis software. With contributions from the entire development team, new features, such as electron diffraction indexing, displacement correction, and supercell/subcell search, have been integrated with the recent PDF product.

 

 

 

 

 

 

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