International Centre for Diffraction Data®
ICDD Profile > The Powder Diffraction File

The Powder Diffraction File continues to expand with new patterns being added each year. In the last five years alone, the File has more than tripled in the number of patterns. By 2003, the File will contain close to 300,000 phases. Collaborations with FIZ*, NIST** and CCDC*** have allowed for the addition of calculated patterns generated from entries in the Inorganic Crystal Structure Database from FIZ, metal and alloy entries from NIST, and calculated organic patterns from CCDC. 

Along with the data acquired from the ICDD’s collaborations with FIZ, NIST, and CCDC; other data sources include scientific literature, contributions, and our Grant-in- Aid program (GiA). The GiA program produces high quality X-ray diffraction reference patterns with a concentration on cutting edge materials including solid state materials, minerals, pharmaceuticals, ceramics, and intermetallics. Reviewed for quality and uniqueness, the patterns are edited for correctness and subfile assignment at various stages throughout the editorial process. Our four-tiered editorial process assures that the ICDD maintains the highest standards for accuracy and quality of its database, the Powder Diffraction File. 

Now in our 61st year, the ICDD continues to strive to meet the needs of the scientific community. With enduring dedication to detail and scientific purpose, Release 2002 has passed through our four-tiered editorial process to assure you the highest standards for accuracy and detail.

*FIZ—Fachsinformationzentrum in Karlsruhe maintains the Inorganic Crystal Structure Database (ICSD).

**NIST—National Institute of Standards and Technology

***CCDC—Cambridge Crystallographic Data Centre