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ICDD > ICDD Profile > What's New - PDF-4 Integrated Data Analysis Software Available! A stated goal of the ICDD Technical Committee is to direct future developments of the PDF databases toward full pattern analysis. An first step was to create fully digitized patterns from the PDF and to place the data into a relational database format, both of which occurred with this years release of PDF-4 Full File. The second step is to work with software developers to link the database with sophisticated data analysis programs. The ICDD continues to work with developers and distributors worldwide to make this goal a reality. X'Pert HighScore - The following is a March 2003 press release from PANalytical: Invest in the future of Phase Analysis with X'Pert HighScore: Almelo, The Netherlands, March 2003. PANalytical is now shipping a new release of their well-known software module X'Pert HighScore. This new version neatly complements the latest developments from ICDD, the world center for quality diffraction data. A dramatically increased number of reference data (up to 300,000) required a new database design and, after more than 50 years, a new numbering scheme. X'Pert HighScore works with both existing (PDF2) and new (PDF4-RDB) database formats and also supports 9-digit entry numbers, offering unrivalled phase identification together with ultra-fast access and display of individual reference patterns. PANalytical's search-match algorithm beats any full pattern approach by optimally combining peak and profile data in a unique way. The fully integrated algorithm dynamically updates the scores for candidates and identified phases, closely monitoring progress of the analysis and all other changes made by the operator. Matching reference patterns to the XRD scan is not just a pushbutton task but an ongoing process, which mimics the way a diffractionist decides on the presence or absence of a phase. Unlike any other software package it actually identifies the phases in a mixture and does not only produce a list of likely candidates. Designed for Windows 2000/XP®, X'Pert HighScore also runs under Windows NT/ME/98®. Its fully configurable user interface follows the standard set by Microsoft Office applications, including clipboard support for text and graphics, a multiple undo/redo feature, print preview, floating toolbars and shortcut menus. Graphical information and tables are interconnected and shown simultaneously. The integrated link to Microsoft Word generates prints and sophisticated reports according to standard template files, allowing users to print reports directly in their own company house style including logos and fonts. Measurement files from almost all suppliers are processed, including PANalytical's open data platform XRDML based on the universal XML standard. PANalytical is the world's leading supplier of analytical
instrumentation and software for X-ray diffraction (XRD) and X-ray
fluorescence spectrometry (XRF), with more than half a century of
experience. The materials characterization equipment is used for
scientific research and development, for industrial process control
applications and for semiconductor metrology. The product portfolio includes a broad range of XRD and XRF systems and software widely used for the analysis of amongst others cement, metals and steel, plastics, polymers and petrol, industrial minerals, glass, catalysts, semiconductors, thin films and advanced materials, pharmaceutical solids, recycled materials and environmental samples. Visit our website at www.panalytical.com for more information about our activities. The companies of Spectris plc develop and market precision
instrumentation and controls, which help customers to improve product
quality and performance, increase productivity and reduce downtime and
waste. Applications range from ultraviolet curing of printed CD coatings
to sound level measurement and particle contamination detection. With
sales of € 840m in 2001, Spectris employs 5,000 people worldwide in its
17 business units and is listed on the London Stock Exchange.
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