2008 Fellow Award

James Cline

James Cline receives the 2008 ICDD Fellow Award

James Cline of the National Institute of Standards and Technology (NIST) was the most recent addition to the honorary list of ICDD Fellows. Through his work on the establishment of standard reference materials (SRMs), Jim’s contributions have directly impacted the accuracy and precision of diffraction data on a global basis. In fact, the enhanced quality of powder data can be directly associated with the established use of SRMs.

For over 20 years, Jim has been an active participant and a technical leader in the NIST X-ray standards program.  During this time, several well established standards have been re-qualified and additional ones have been added to the NIST portfolio.

Congratulations, Jim!

Read more about the continually growing list of ICDD Fellows.