ICDD Awards - Hanawalt Award 2016

Dr. Paolo Scardi

The Hanawalt Award is presented every three years for an important, recent contribution to the field
of powder diffraction.

Hanawalt Award Recipient Paolo Scardi with ICDD Director, David Rafaja
Photo credit: Dr. Mojmir Meduna, Masaryk University Brno, Czech Republic.

Dr. Scardi's award and accompanying lecture were given at the XTOP 2016 – 13th Biennial Conference on High-Resolution X-Ray Diffraction and Imaging, in Brno, Czech Republic. He concentrated on Whole Powder Pattern Modelling of Nanocrystalline and Plastically Deformed Materials during his presentation at XTOP 2016.

Dr. Scardi received his B.A. in Physics at the University of Napoli in 1984. Since 1986, he has been a faculty member at the University of Trento, Italy, where he became Full Professor in 2002. Dr. Scardi is currently head of the Ph.D. school in Civil, Environmental & Mechanical Engineering (formerly Materials Science & Engineering), where he teaches X-ray diffraction applied to engineering problems. Line Profile Analysis has always been a main scientific interest of Dr. Scardi. Early ideas on the whole powder pattern modelling approach, date back to his first years as Assistant Professor, along with the collaboration of several students, among them, Professor Matteo Leoni, co-winner of this award. Research interests span across several themes of materials science and technology, including nanostructured materials, thin films and coatings, residual stress, texture and plastic deformation of materials, with special attention to understand the role of microstructure in developing and modifying material properties and behavior. Since the beginning of his career, Dr. Scardi has been in charge of the local X-ray Powder Diffraction laboratory, an activity he still follows today; his work includes measurement studies at synchrotron radiation facilities, dating back to the early 1990s. Recent work focuses increasingly on atomistic modelling, e.g. by molecular dynamics, to support the interpretation of X-ray spectroscopy results, and use of the Debye Scattering Equation to analyze nanostructured systems.

Read more about the continually growing list of ICDD Hanawalt Award Winners.