This award was instituted in the name of Professor Jerome B. Cohen, one of the leaders in the field of X-ray analysis, and in the training of students in this art. The award is intended to recognize the outstanding achievements of student research in this field. All students, graduate or undergraduate, who are working in the field of X-ray analysis, can submit a technical paper describing their work. The following criteria applies:

• The research must be original, of high quality, and must be primarily the work of the student.
• All papers submitted to the Cohen Award must be presented at the conference in either oral or poster sessions. Thus, all first-author students must attend the conference.
• The recipient selected will be announced at the Plenary Session of the conference. Therefore, all applicants are requested to attend the Plenary Session.

Selection Process 
Assessments will be made based on the quality and content of the submitted paper. A committee of researchers in the field will select the winner.

Award Presentation 
The award, consisting of a certificate and a gift of $1,000 will be announced and presented to the winning student at the Plenary Session of the Denver X-ray Conference.

Submission Process
Students must submit their paper in electronic form, along with a certification form, in final publication form, to flaherty@icdd.com by 1 July  the year of the award.

Recipients:

The 2000 Student Award:
Sven Vogel of the Kiel University, Kiel, Germany, for his work entitled, “NON-DESTRUCTIVE IN-SITU REAL TIME MEASUREMENTS OF STRUCTURAL PHASE TRANSITIONS USING NEUTRON TRANSMISSION”

The 2001 Student Award: none awarded

The 2002 Student Award:
Jay C. Hanan of the California Institute of Technology, Pasadena, Ca, for his work entitled "X-RAY STRESS ANALYSIS OF DAMAGE EVOLUTION IN Ti-SiC UNIDIRECTIONAL FIBER COMPOSITES"

The 2003 Student Award:
Yukio Takahashi of Department of Materials Science, Graduate School of Engineering, Tohoku University, Sendai, Japan for his paper: "DEVELOPMENT AND APPLICATION OF LABORATORY X-RAY FLUORESCENCE HOLOGRAPHY EQUIPMENT"

The 2006 Student Award: 2 awards
Hanfei Yan, Columbia University, New York, NY, and Argonne National Laboratory, Argonne, IL for his work “DYNAMICAL ARTIFACTS IN X-RAY DIFFRACTION FROM SINGLE CRYSTALS”

Wanchuck Woo, The University of Tennessee, Knoxville, TN and Oak Ridge National Laboratory, Oak Ridge, TN for his work “IN-SITU TIME-RESOLVED NEUTRON DIFFRACTION MEASUREMENT OF TRANSIENT MATERIAL STATES DURING A THERMO-MECHANICAL PROCESS BASED ON QUASI-STEADY STATE PRINCIPLE”.

The 2007 Student Award: none awarded

The 2008 Student Award: 1 award
Sterling Cornaby, Cornell University, Ithaca, New York for work entitled, "BIFOCAL MINIATURE TOROIDAL SHAPED X-RAY MIRRORS"

The 2009 Student Award: none awarded