Advances in X-ray Analysis Vol. 40

A CALIBRATION PROCEDURE FOR POSITION SENSITIVE DETECTORS USED IN NEUTRON RESIDUAL STRAIN MAPPING Xiaojing Zhu and Camden R. Hubbard
A SIMPLE 2-D MICROFLUORESCENCE UNIT J.Carsello
A SYSTEMATIC EVALUATION OF STRAIN BROADENING FROM STRETCHED ALUMINIUM FOILS USING A CONVOLUTION-FITTING APPROACH TO LINE PROFILE ANALYSIS R. W. Cheary, A. Coelho, W Kalceff and M.Smith
AN ANALYSIS OF SECONDARY ENHANCEMENT EFFECTS IN QUANTITATIVE XRFA Michael Mantler
AN ARTIFICIAL NEURAL NETWORK ANALYSIS OF LOW-RESOLUTION X-RAY FLUORESCENCE SPECTRA Xianguan Long, Ning Huang, Taihua Li, Fuqing He and Xiufeng Peng
AN INVESTIGATION OF METAL THIN FILMS USING X-RAY REFLECTIVITY AND ATOMIC FORCE MICROSCOPY D.M.SOLINA, R.W.CHEARY, F.A.LUPSCHA, and P.D.SWIFT
APPLICATION OF DIFFRACTION PEAK PROFILE ANALYSIS TO STUDY THE FORMATION OF ZINC PRODUCTS IN THE INITIAL CORROSION STAGES. P. Quintana, L. Veleva and L. Banes*
APPLICATIONS OF NEW, HIGH INTENSITY X-RAY OPTICS NORMAL AND THIN FILM DIFFRACTION USING A PARABOLIC, MULTILAYER MIRROR Stephen B. Robie
BRAGG AND BARKLA POLARIZATION IN EDXRF J Heckel, R. Schramm
CHARACTERISATION OF MERCURY-SUBSTITUTED (BI,PB)&CA2CU30X (2223) HIGH-T, PHASE USING SYNCHROTRON RADIATION AND NEUTRON DIFFRACTION DATA D.Y. Li, B.H. O’Connor, A. van Riessen and C.W. MacKinnon, D. J. Cookson, R.F. Garrett and B.A. Hunter,
CHARACTERIZATION OF SI LX GE, LAYERS WITH GRAZING X-RAY R.Treichler, H.Schafer, W.Hiisler, H.Goebel
CHARACTERIZATION OF ANNEALED CU-NI MULTILAYERS USING X-RAY DIFFRACTION J. Chaudhuri and K. Low, A. F. Jankowski
CHEMICAL ACCURACY AND PRECISION LN STRUCTURAL REFINEMENTS FROM POWDER DIFFRACTION DATA James A. Kaduk
COMPARISON OF VARIOUS X-RAY OPTICS FOR ENERGY DISPERSIVE X-RAY FLUORESCENCE ANALYSIS WITH X-RAY TUBES Birgi t Kanngiejer, Burkhard BeckhofJ Wolfgang Malzer,Vladimir A. Arkadiev, Aniour A. Bzhaumikhov, Hans-Eberhard Gorny,
DETECTION OF SUBMONOLAYERS BY MEASUREMENT OF THE TOTAL ELECTRON YIELD (TEY) OF X-RAY EXCITED ELECTRON EMISSION Horst Ebel, Robert Svagera, Christian Hager, Maria F.Ebel, Horst Ebel, Robert Svagera, Christian Hager, Maria F.Ebel, Christian Eisenmenger-Sittner, Johann Wernisch, and Michael Mantler
DETERMINATION OF ELEMENTAL IMPURITIES IN U308 BY WAVELENGTH-DISPERSIVE X-RAY FLUORESCENCE SPECTROMETRY Jozef Leon Parus, Wolfgang Raab, Renata Mikolajczak
DEVELOPMENT OF FAST TEXTURE MAPPING SYSTEM WITH ENERGY DISPERSIVE X-RAY DIFFRACTION METHOD Muneyuki Imafuku
DIFFRACATION LINE-PROFILE SHAPE BY SYNCHROTRON AND LABORATORY X-RAY SOURCES Davor Balzar, Peter W. Stephens , and Hassel Ledbetter
EFFECTS OF THERMAL FATIGUE ON NITRIDING HOT WORKING DIE STEEL (H13) Koji Yatsushiro and Masahiko Hihara, Katsuhiro Tagawa and Makoto Kuramoto
GRAZING INCIDENCE X-RAY MEASUREMENT OF INTERFACE ROUGHNESS IN SPUTTERED CU/CO MULTILAYERS B K Tanner, D E Joyce, T P A Hase, I Pape, and P J Grundy
GRAZING INCIDENCE X-RAY SCATTERING FOR THE CHARACTERISATION OF INP WAFERS C.D.Moore, T.P.A.Hase and B.K. Tanner
GRAZING-INCIDENCE X-RAY TECHNIQUE FOR SURFACE, INTERFACE, AND THIN-FILM ANALYSIS T. C. Huang, IBM Almaden Research Center, 650 Harry Road, San Jose CA 95 119;P. K. Predecki, Department of Engineering, University of Denver, Denver, CO 80208
HEAVY ION BACKSCATTERING SPECTROMETRY OF TXRF CALIBRATION STANDARDS D. Werho, R. B. Gregory, S. N. Schauer, X. Liu, G. F. Carney, Motorola, Inc., AZ; J. C. Banks, D. Werho,+ R. B. Gregory, S. N. Schauer, X. Liu, G. F. Carney, Motorola, Inc., AZ; J. C. Banks, J. A. Knapp, B. L. Doyle, Sandia National Labs, NM; and A. C. D
HIGH-RESOLUTION X-RAY DIFFRACTION STUDY OF PARTIALLY RELAXED INGAADGAAS MULTIQUANTUM WELL P-I-N DIODES ON (001) GAAS A. Sanz-Hen, J.F. Valtuefia, M. Garrido, J.P.R. David, C. Villarg, E.J. Abrilt,M. Aguilar, I. Izpura , R. Greyt, F. Gonzalez-Sanz , R. Lorenzoz, and M. Lopez
IN SITU THIN FILM CRYSTALLIZATION STUDIES USING HIGH TEMPERATURE GRAZING INCIDENCE X-RAY DIFFRACTION (HTGIXRD) Mark A. Rodriguez and Ralph G. Tissot, Sandia National Laboratories
INFLUENCE OF IMAGE PROCESSING CONDITIONS OF DEBYE SCHERRER RING IMAGES IN X-RAY STRESS MEASUREMENT USING AN IMAGING PLATE Toshihiko SASAKI, Yukio HIROSE, Katsunari SASAKI, Shoichi YASUKA WA
INFLUENCE OF THE SPECTROSCOPIC RESOLUTION ON THE XRF ANALYSIS OF ARSENIC Joseph F. Dlouhy, Krassimir N. Stoev
INVESTIGATION OF COMPRESSION AND THERMAL EXPANSION OF ALPHA-MNTE USING A CUBIC-ANVIL X-RAY DIFFRACTION PRESS W.Paszkowicz, E.Dynowska and T.Peun
INVESTIGATIONS OF THIN TIN-FILMS USING GRAZING INCIDENCE REFLECTOMETRY AND DIFFRACTOMETRY J.Klimke, C.Eggs and H. Wulff
LATTICE PARAMETERS OF BATI SOLID SOLUTIONS CONTAINING DY AND HO AT HIGH TEMPERATURE Hitoshi OHSATO, Motoaki IMAEDA, Yoshikazn OKINO, Hiroshi KISHI, Takashi OKUDA
MEASUREMENT CAPABILITIES OF X-RAY FLUORESCENCE FOR BPSG FILMS K.O. Goyal, J.W. Westphal
MEASUREMENT OF ACTUAL STRESSES DURING FATIGUE PROCESS Hironori Nishihata, Shin-ichi Ohya and Yasuo Yoshioka
MULTIPLE-DETECTOR SYSTEM FOR POWDER DIFFRACTION USING SYNCHROTRON RADIATION H. Toraya
NEUTRON DIFFRACTION MEASUREMENTS AND MODELING OF RESIDUAL STRAINS IN METAL MATRIX COMPOSITES C. R. Hubbard, S. T. Misture and X. L. Wang, A. Saigal and G. G. Leisk
NEW LOW AND HIGH TEMPERATURE POWDER DIFFRACTION FACILITIES AT DARESBURY LABORATORY C.C. Tang, G. Bushnell-Wye, S.M. Clark, M.C. Miller, T. Rathbone and A.A. Neild
NEW PERFORMANCES OF SOFT X-RAY SPECTROMETRY (LEEIXS) IN SURFACE NEW PERFORMANCES OF SOFT X-RAY SPECTROMETRY (LEEIXS) IN SURFACE ANALYSIS OF ORGANIC AND INORGANIC MATERIALS M. ROMAND, M. CHARBONNIER, J. BABOROWSKI
NON-DESTRUCTIVE AND PARTIALLY DESTRUCTIVE DETERMINATION OF RESIDUAL STRESS STATES WITH STEEP SUBSURFACE GRADIENTS B. Eigenmann
NOVEL USE OF IMAGING PLATES IN POWDER DIFFRACTION ON THE AUSTRALIAN NATIONAL BEAMLINE FACILITY D.J. Cookson, R.F. Garrett
ORIGINS OF OSCILLATIONS IN D VS. SIN2RYPLOTS MEASURED FROM TUNGSTEN THIN FILMS I. C. NOYAN, C. C. GOLDSMITH
PARALLEL BEAM POWDER DIFFRACTOMETRY USING A LABORATORY X-RAY SOURCE R. D. Deslattes, J.-L. Staudenmann, L. T. Hudson, A. Henins, and J. P. Cline
PARTICULATE CONTAMINATION FROM TXRF INSTRUMENTATION Dennis Werho, Thomas Wetteroth, Stephen N. Schauer, and George F. Carney
POWDER DIFFRACTION STUDY OF ZN1-XMGXSE ALLOYS W.Paszkowicz, Z. Spolnik, F .Firszt and H.Meczynska
POWDER PATTERN DECOMPOSITION WITH THE AID OF PREFERRED ORIENTATION R. Cerny
QUANTIFICATION OF CARBON IN A BINARY SYSTEM BY THE FUNDAMENTAL PARAMETER METHOD Franz A. Weber, Luiz B. Da Silva, Troy W. Barbee, Jr., and Dino Ciarlo
QUANTITATIVE PHASE ANALYSIS USING A NEW RIETVELD ALGORITYM ASSISTED BY IMPROVED STABILITY AND CONVERGENCE BEHAVIOR Bergmann, J., Kleeberg, R., Taut, T., Haase, A.
RECOMMENDATION FOR CALCULATED REFERENCE POWDER DIFFRACTION PATTERNS C. K. Lowe-Ma, J P. Cline, C. E. Crowder, A. Kaduk, S. B. Robie, D. K. Smith, R. A. Young
RESIDUAL MACROSTRESS IN PLASMA-SPRAYED B4C COATINGS W. Fischer, H. Gruhn, V.R. Vosberg, W. Mallener, and H. Stover
RESIDUAL STRAIN MEASUREMENT IN THERMAL BARRIER COATINGS Thomas R. Watkins, Scott P. Beckman ’ and Camden R. Hubbard
RESIDUAL STRESS ANALYSIS OF CERAMIC COATINGS BY MEANS OF SYNCHROTRON RADIATION XRD P. Scardi, M. Leoni, S. Veneri
ROUTINE X-RAY FLUORESCENCE SPECTROMETRC ANALYSIS BY VERBA-XRD Petro 0. Verkhovodov
SECOND ORDER STRESSES IN SINGLE PHASE AND MULTIPHASE MATERIALS EXAMPLES OF EXPERIMENTAL AND MODELING APPROACHES J.L. LEBRUN, K. INAL
SELFCONSISTENT EVALUATION OF RESIDUAL SHEAR STRESS PROFILES NEAR GROUND SURFACES H. Wern
SEPARATION OF STRUCTURAL DEFECTS IN MOCVD GROWN GAN AND AIN FILMS ON C-PLANE SAPPHIRE BY HRXRD T. Metzger, R. Stommer, M. Schuster, H. Gobel, E. Born, 0. Ambacher and M. Stutzmann
SOLID SOLUTION BEHAVIOUR OF SYNTHETIC MONAZITE AND XENOTIME FROM STRUCTURE REFINEMENT OF POWDER DATA BOB VAN EMDEN, MIKE R. THORNBER, JIM GRAHAM AND FRANK J. LINCOLN.
STRAIN BROADENING CAUSED BY DISLOCATIONS T. Ungar
STRUCTURAL PHASE TRANSITIONS AND CHEMICAL TRANSFORMATIONS OF CSH2P04 CRYSTALS Wieslawa Bronowska,Wybrzeie Wyspiahkiego
STRUCTURE SOLUTION OF LITHIUM DIBORATE HYDRATE A COMPARISON OF POWDER DIFFRACTION WLTH SINGLE CRYSTAL ANALYSES M. Louer, D. Louer, E. Betourne, and M. Touboul
TEMPERATURE DEPENDENCE OF RESIDUAL STRESS IN TIN FILMS ON 316 STAINLESS STEEL H.W. King, J.D. Brown, T.A. Caughlin, D.R. Nagy
TEMPERATURE DISCREPANCIES IN HIGH TEMPERATURE DIFFRACTOMETRY H.W. Ring, E.A. Payzant and T.A. Caughlin
TEST DATA FOR THE CALCULATION OF POWDER PATTERNS FOR INTERMETALLIC PHASES L. D. Calvert, P. L. Wallace, T. C. Huang, J. A. Kaduk, J. N. Dann, M. H. Mueller, A. C. Roberts L. D. Calvert, P. L. Wallace, T. C. Huang, J. A. Kaduk,4 J. N. Dann, M. H. Mueller, A. C. Roberts
THE DETERMINATION OF TOXIC ELEMENTS IN HAZARDOUS LIQUID WASTE USING HIGH RESOLUTION EDXRD SPECTROMETRY Andrew T. Ellis, Philip A. Russell and Ray James
THE EFFECT OF GELATIN ON SILVER HALIDE STRAIN IN PHOTOGRAPHIC FILMS T. N. Blanton, T. R. Watkins , M. A. Howey
THE EFFECT OF THE GROWTH TEMPERATURE ON THE STRUCTURE OF CO-O-CO TRILAYERS T. P. A. Hase, I. Pape, B. K. Tanner, S. M. Thompson, S. M. Jordan and J.-J. Freijo
THE MONOLITHIC CAPILLARY X-RAY LENS, ITS BASIC PHYSICAL CHARACTERISTICS AND APPLICATIONS Yiming Yan
USE OF CALVERT’S TEST DATA FOR THE EVALUATION OF POWDER PATTERN CALCULATION PROGRAMS J.N. Dann, A.C. Roberts, P.L. Wallace, M.H. Mueller
X-RAY ANALYSIS OF DEPTH DISTRIBUTIONS OF RESIDUAL STRESSES AND STRESS-FREE LATTICE PARAMETERS IN PVD GRADIENT COATINGS OF OF TI(C,N) ON CEMENTED CARBIDE Andreas Kampfe, Paul K. Predecki and Bernd Eigenmann
X-RAY ANALYSIS OF MAGNETIC MULTILAYERS V. Valvoda and M. Chladek
X-RAY DIFFRACTION STUDY OF HIGH TC SUPERCONDUCTORS AND RELATED PHASES AT HIGH PRESSURES W. Wong-Ng, E. J. Gonzalez and G. J. Piermarini, Ch. Wolters and J. Schwartz, M. R. Gallas
X-RAY EMISSION STUDIES OF CERAMIC THIN FILMS OBTAINED BY X-RAY EMISSION STUDIES OF CERAMIC THIN FILMS OBTAINED BY LOW-PRESSURE MAGNETRON SPUTTERING M. CHARBONNIER, J. BABOROWSKI, M. ROMAND
X-RAY IMAGING OF POLYCRYSTALLINE AND AMORPHOUS MATERIALS T. Wroblewski
X-RAY METHODS FOR MONITORING MACHINERY CONDITION Robert R. Whitlock
X-RAY STRESS MEASUREMENT OF N&AL INTERMETALLIC COMPOUND USING IMAGING PLATE Tokimasa GOTO, Toshihiko SASAKP, Hiroyuki TABATA, Yukio HIROSE
X-RAY STUDY OF RESIDUAL STRESSES IN THIN CHROMIUM METALLIZATIONS ON GLASS SUBSTRATES L. S. Suominen, C. Zhou, MA. Korhonen, and C.-Y. Li
XRD AND TEM CHARACTERIZATION OF COMPOUND SEMICONDUCTOR SOLID SOLUTIONS SN(S,SE) AND (PB,CD)S B.R. Jarabek., D.G. Grier., D.L. Simonson, D.J. Seidler, P. Boudjouk and G.J. McCarthy, L.P. Keller
XRD LINE PROFILE ANALYSIS OF HTC SUPERCONDUCTING THIN FILMS P. Scardi, A. Migliori, L. Correra, F.C. Matacotta and V.A. Dediu
XRF ANALYSIS - THEORY, EXPERIMENT, AND REGRESSION Anthony J. Klimasara