Advances in X-ray Analysis Vol. 41

A COMPARISON OF DETECTORS USED FOR MICRODIFFRACTION APPLICATIONS Michael 0. Eatough, Mark A. Rodrigue, Thomas N. Blanton, Ralph G. Tissot
A COMPARISON OF SOFTWARE PACKAGES FOR X-RAY FLUORESCENCE ANALYSIS OF SILICATES ON FUSION DISKS HCC Cloete
A PRACTICAL HOT STAGE FOR HIGH TEMPERATURE MICRO-ANALYSIS Ralph G. Tissot Jr. and Mark Rodriguez
ADVANCES IN XFUMF AND XRD USING MONOLITHIC CAPILLARY X-RAY LENS Ding Xunliang, , He Jejun, Wei Fuzhong, Xie Jindong, Wang Dachun, Li Yude, Chen Baozhen, Chen Jun and Yan Yiming,
AN EVALUATION OF THE ANALYSIS OF MONAZITE AND REE COMPOUNDS BY WIXRFS: A SPECTROSCOPIST'S NIGHTMARE (OR CHALLENGE?) James P. Willis, Edward B. McNew
ANALYSIS OF SUB-MM STRUCTURES IN LARGE BULKY SAMPLES USING MICRO-X-RAY FLUORESCENT SPECTROMETRY Joseph A . Nicolosi,Michae l Haschke Joseph A . Nicolosi, Michael Haschke
APPLICATION OF RIETVELD REFINEMENT COMBINED WITH FORCE FIELD ENERGY MINIMIZATION TO STRUCTURE INVESTIGATION OF CYCLO=TRIS(2,6=PYRIDYLFORMAMIDINE) P. Friedel and D. Jehnichen, J. Bergmann, T. Taut, A. Haase
APPLICATIONS OF THE MONTE CARLO - LIBRARY LEAST-SQUARES METHOD TO THE IN VZVO XRF MEASUREMENT OF LEAD IN BONE Q. Ao, S. H. Lee, and R. P. Gardner
ASYMMETRIC LATTICE DISTORTION IN PSEUDOMORPHIC MULTILAYERS GROWN ON MISORIENTED SUBSTRATES A. Sanz-Hervas, C. Villar, M. Garrido, J.F. Valtuena, M. Aguilar, J.P.R. David, J.S. Robert,M.A.G. Halliwelld, E.J. Abril, M. Lopez, and I. Izpurab
BENDING MULTILAYERS - A SIMPLE METHOD TO INCREASE THE SENSITIVITY IN TXRF R. Schwaiger, P. Wobrauschek and C. Streli
CALIBRATION STANDARDS FOR XRFA OF EMITTED AEROSAL PARTICLES COLLECTED ON A NEWLY DEVELOPED FILTER BAND WITH AN AUTOMATED SAMPLER Olaf Haupt, Rtidiger Harmel and Walter Dannecker
CHARACTERIZATION OF BARIUM STRONTIUM TITANATE FILMS USING XRD Thomas Remmel, Richard Gregory and Beth Baumert
CHARACTERIZATION OF MICROGRAVITY AND GROUND-BASED GROWN CRYSTALS USING SYNCHROTRON WHITE BEAM X-RAY TOPOGRAPHY AND HIGH RESOLUTION TRIPLE AXIS X-RAY DIFFRACTION H. Chung, Y. Guo, J. Su, M. Dudley, H. M. Volz, C. Salles, R.J. Matyi
CHARACTERIZATION OF MO-TA FILMS Hans J. Holland, Thomas R. Watkins and Gordon F. Foster
CHARACTERIZATION OF STANDARD REFERENCE MATERIALS USING SYNCHROTRON RADIATION DIFFRACTION DATA Brian O’Connor, Arie van Riessen and Graeme Burton, David Cookson, Richard Garrett
CHARACTERIZATION OF X-RAY OPTIC PERFORMANCE Jerome Gormley, Terrence Jach, Eric Steel, and Qi-Fan Xiao
COMPARATIVE STUDIES OF FRACTAL PARAMETERS OF SI(LO0) SURFACES MEASURED BY X-RAY SCATTERING AND ATOMIC FORCE MICROSCOPY R. Stommer, A. R. Martin, Th. Geue H Goebel, W. Hub, U. Pietsch.
DEMYSITIFICATION OF ALGORITHMS AND INFLUENCE COEFFIECIENTS IN QUANTITATIVE XRF ANALYSIS Gerald R. Lachance
DESIGN CONSIDERATIONS FOR AN EDXRF SYSTEM FOR IN VIVO ELEMENTAL ANALYSIS Lucian Wielopolski
DESIGNS FOR NEUTRON RADIOGRAPHY AND COMPUTED TOMOGRAPHY AT OAK RIDGE NATIONAL LABORATORY Dudley A. Raine III, Camden R. Hubbard,Paul M. Whaley, and Michael C. Wright
DETERMINATION OF GERMANIUM CONTENT IN COAL ASH BY WAVELENGTH-DISPERSIVE X-RAY FLUORESCENCE SPECTROMETRY AND INDUCTIVELY COUPLED PLASMA - MASS SPECTROMETRY Yanhong Zhang, Jonathan L. Talbott, Luann Wiedenmann, Joe DeBarr and Ilham Demir
DEVELOPMENT OF THE DRIED SPOT SPECIMEN PREPARATION METHODOLOGY AND APPLICATION TO MXRF ANALYSIS Lisa P. Colletti and George J. Havrilla
DIRECT METHODS OF STRUCTURE ANALYSIS IN POLYMER CRYSTALLOGRAPHY Douglas L. Dorset and Mary P. McCourt
DOUBLE MULTILAYER MONOCHROMATOR WITH FIXED EXIT GEOMETRY H.Gatterbauer, P.Wobrauschek, F.Hegediis, P.Biini, C.Streli
DYNAMICAL EFFECTS IN HIGH RESOLUTION TOPOGRAPHIC IMAGING OF ELECTRONIC DEVICES W.T. Beard, K.G. Lipetzky, R.W. Armstrong
ED(P)XRF: SCREENING ANALYSIS AND QUANTITATIVE ANALYSIS WITH POLARIZED X-RAYS R. Schramm, J. Heckel, K. Molt
EDXRF CHARACTERIZATION OF BST FILMS James R. Bogert, Hyun Ja Kwon, William Jo, Hyun Ha Kim, Young Woo Jeong, and Jeong Soo Lee, Hak Ro Yoon and In Seung Ban
ERROR ANALYSIS OF THE IN VW0 XRF MEASUREMENT OF LEAD IN BONE BY MONTE CARLO SIMULATION Q. Ao, S. H. Lee, and R. P. Gardner
ESCAPE PROBABILITY OF ELECTRONS IN TOTAL ELECTRON YIELD EXPERIMENTS Horst Ebel, Robert Svagera, Wolfgang S.M. Werner and Maria F. Ebel
EVALUATION OF MONOLITHIC POLYCAPILLARY X-RAY LENSES FOR SUB-MM LOCAL XRF ANALYSIS OF ARTISTIC OBJECTS B. Vekemans, K. Janssens , G Vittiglio, F. Adams, L. Andong, Y. Yiming
EVALUATION OF SOME SAMPLE SUPPORT FILMS FOR MICROSAMPLEX-RAY ANALYSIS A.W. Wilson, D.C. Turner, A.A. Robbins
GRAIN ORIENTATIONS IN ELECTROLYTIC HIGH CONTRACTION AND LOVE CONTRACTION CHROMIUM DEPOSITION S.L. Lee, D. Windover, K. Mello
HIGH RESOLUTION X-RAY DIFFRACITON APPLIED TO STRAIN RELAXATION OF LATTICE MISMATCHED SEMICONDUCTOR FILMS P.M. Mooney and J.L. Jordan-Sweet
HIGH RESOLUTION X-RAY DIFFRACTION ANALYSIS OF GALLIUM NITRIDE/SILICON CARBIDE HETEROSTRUCTURES H.M. Volz, R.J. Matyi, and J.M. Redwing
HIGH RESOLUTION X-RAY DIFFRACTION AND X-RAY REFLECTIVITY STUDIES OF INAS/ALGAASSH DEEP QUANTUM WELLS Shin-ya Matsuno, Naohiro Kuze, Hiromasa Goto, Masayuki Kuba, Kazuto Hoshino
IMPROVED INTER-ELEMENT CORRECTION FACTORS FOR THE DETERMINATION OF ADDITIVE AND TRACE ELEMENTS IN LUBRICANTS Mario Van Driessche, John R. Sieber
IN C/1VFL XRF SPECTROSCOPY: SUMMARY OF WORKSHOP II Q. Ao, R. Gardner,J. Iwanczyk, L. Wielopolski, L. Wielopolski
INTERNAL STRESS DISTRIBUTION ANALYSIS IN THIN TEXTURED COATINGS BY X-RAY DIFFRACTION - PROBLEMS AND ATTEMPTS AT THEIR SOLUTIONS Christoph Genzel
INVESTIGATIONS OF THIN LAYERS BY TEY, XRF, EPMA AND XPS - A COMPARISON OF X-RAY ANALYTICAL METHODS Maria F. Ebel, Robert Svagera, Mario Lindner, Nikolaus Praxmarer, Christian Hager and Horst Ebel
ION-EXCHANGE FILMS FOR ELEMENT CONCENTRATION IN X-RAY FLUORESCENCE ANALYSIS WITH TOTAL REFLECTION OF THE PRIMARY BEAM. A.P.Morovov, L.D.Danilin, V.V.Zhmailo, Yu.V.Ignatiev, A.E.Lakhtikov, V.V.Nazarov, M.G.Vasin, V.V.Chulkov, V.N.Funin
ISSUES WITH TXRF ANGLE SCANS AND CALIBRATION Dennis Werho, Stephen N. Schauer, and George F. Carney
LITHIUM BASED BORATE FUSION OF GYPSUM/HIGH SULFATE SAMPES: A NEW APPROACH Donald J. Broton
LONG TERM STATISTICS OF X-RAY SPECTROMETERS J. F. Dlouhy, D. Mathieu, K. N. Stoev
MACROSCOPIC AND MICROSCOPIC RESIDUAL STRESSES IN CERAMICS DUE TO CONTACT LOADING Wulf Pfeiffer and Michael Rombach
MAXIMIZING THE IMPACT OF YOUR DATA: APPLICATIONS OF RIETVELD ANALYSIS TO INDUSTRIAL PROBLEM SOLVING James A. Kaduk
MEASUREMENT OF MACRO- AND MICROSTRESSES OF COMPOSITE MATERIALS BY X-RAY DIFFRACTION METHOD USING IMAGING PLATE Toshihiko Sasaki, Shoichi Yasukawa, Shigeki Takago and Yukio Hirose
MEASUREMENT OF NITRIDED SIO2/SI INTERFACE ROUGHNESS BY CRYSTAL-TRUNCATION ROD PROFILING J.L. Jordan-Sweet and R. Ludeke, T.B. Hook, K.W. Evans-Lutterodt
MEASUREMENT OF X-RAY ELASTIC CONSTANTS OF NIDL USING AN IMAGING PLATE Tokimasa Goto, Toshihiko Sasaki, Yukio Hirose
MICRO-ANALYSIS OF ARTIST' PIGMENTS BY GRAZING -EMISSION X-RAY FLUORESCENCE SPECTROMETRY Martine Claes, Rita Van Ham, Koen Janssens and RenC Van Grieken, Reinhold Klockenk%mper and Alex von Bohlen
MICRODIFFRACTION IN THE SCANNING ELECTRON MICROSCOPTE (SEM) R. P. Goehner, J. R. Michael, and M. E. Schlienger,
MICRODIFFRACTION USING COLLIMATING AND CONVERGENT BEAM POLYCAPILLARY OPTICS S. M. Owens, F. A. Hofmann, C. A. MacDonald, and W. M. Gibson
MINERAL CLASSIFICATION IN THE MINERAL POWDER DIFFRACTION FILE Deane K. Smith
MONTE CARLO SIMULATION OF PULSE PILE UP R. P. Gardner and S. H. Lee
MULTIPHASE REFINEMENT STUDY OF THE PRBA&U408 COMPOUND BY RIETVELD METHOD T.J. Lee, T. S. Lin and C.Y. Wan.
NEUTRON MACRO STRESS MAPPING Torben Lorentzen
NEUTRON SCATTERING CHARACTERIZATION OF PURE AND RARE-EARTH MODIFIED ZIRCONIA CATALYSTS James W. Richardson, Jr., Chun-Keung Loong and Pappannan Thiyagarajan, Masakuni Ozawa and Sugura Suzuki
NEW THIN FILM STRUCTURES OBSERVED IN THE SR-BI-TA-0 SYSTEM Mark A. Rodriguez, T. J. Boyle, and B. A. Hemandez
NEW X-RAY DETECTORS FOR XRF ANALYSIS Jan S. Iwanczyk & Bradley E. Patt
NEW X-RAY DIFFRACTION LINE PROFILE FUNCTION BASED ON CRYSTALITE SIZE AND STRAIN DISTRIBUTIONS DETERMINED FROM MEAN FIELD THEORY AND STATISTICAL MECHANICS Brian R. York
OPTIMIZATION OF TAPERED CAPILLARY OPTICS FOR USE AT THE MICROFOCUS BEAMLINE (ID13) AT THE EUROPEAN SYNCHROTRON RADIATION FACILITY (ESRF) L. Vincze, K. Janssens and F. Adams, A. Rindby, P. Engstrijm and C. Riekel
PEAK IDENTIFICATION OF CONVENTIONAL X-RAY DIFFRACTION PATTERNS FOR MBE FEPT THIN FILMS ON MGO SINGLE-CRYSTAL SUBSTRATES H.-C. Lin, H.-C. Chien, Y.-S. Huang, S.-L. Chang, and T.-C. Huang*
POLYGONAL GRAPHIC REPRESENTATIONS APPLIED TO SEMI-QUANTITATIVE ANALYSIS FOR 3 AND 4 ELEMENTS IN XRF Marcia Garcia and Rodolfo Figueroa
PRACTICAL APPLICATIONS OF OPTICAL INVERS PROBLEM TECHNIQUE TO CHARACTERIZATION OF MULTILAYERS A. Yu. Nikulin, P. V. Petrashen
PRECISION OF ABSOLUTE LATTICE PARAMETERS MEASURE BY DOUBLE AXIS DIFFRACTOMETRY M.A. Davidson and S.R. Stock
PRELIMINARY COMPARISON OF MONOLITHIC AND APERTURE OPTICS FOR MXRF George J. Havrilla, Christopher G. Worley
PROFILE FITTING AND DIFFRACTION LINE-BROADENING ANALYSIS Daniel Louer and Nathalie Audebrand
PULSED LASER DEPOSITION OF LATERALLY GRADED NE-MULTILAYERS AND THEIR APPLICATION IN PARALLEL BEAM X-RAY OPTICS T. Holz, R. Dietsch, H. Mai,L. Briigemann, S. Hopfe, R. Scholz, R. Krawietz, B. Wehner
QUANTIFICATION OF TXRF ANALYSIS I. Szaloki, T. Utaka, Y. Tsuji , K. Taniguchi
QUANTITATIVE ANALYSIS OF THIN FILMS AND MULTIPLE THIN FILM STRUCTURES BY MONTE-CARLO TECHNIQUES M.Mantler
QUANTITATIVE PHASE ANALYSIS USING THE RIETVELD METHOD FOR SAMPLES IN THE TI-CR BINARY SYSTEMS Ofer Beeri and Giora Kimmel
QUANTITATIVE PHASE ANALYSIS USING THE WHOLE-POWDER-PATTERN DECOMPOSITION METHOD: APPLICATION TO TEN-COMPONENT MIXTURES AND NATURAL PRODUCTS Shigeo Hayashi and Hideo Toraya
QUANTITATIVE TEY (TOTAL ELECTRON YIELD) - THEORY, INSTRUMENTATION AND EXPRIMENTAL RESULTS Horst Ebel, Robert Svagera, Maria F. Ebel and Matthias Baron
REDUCTION OF THE SAMPLE SIZE IN THE ANALYSIS OF ROCK BY EDXRF Riidiger Harmel, Ulrike Otto, Olaf Haupt, Clemens Sch$er and Walter Dannecker,
RESIDUAL STRESS GRADIENTS IN A TUNGSTEN FILM BY GRAZING-INCIDENCE XRD T Ely, P.K. Predecki and I.C. Noyan
RESIDUAL STRESSES IN A MULTILAYER SYSTEM OF COATINGS Arthur J. McGinnis, Thomas R. Watkins and K. Jagannadham
RESULTS OF X-RAY INVESTIGATIONS ON HYDRATION PRODUCTS OF CEMENTITIOUS MATERIALS USING SPECIAL SPECIMEN HOLDERS AND PREPARATION TECHNIQUES Herbert Poellmann
SCOPE AND LIMITATIONS FOR SEMI-QUANTITATIVE XRF ANALYSIS Peter L Warren, Pamela Y Shadforth
SPECTRAL DISTRIBUTION FROM END WINDOW X-RAY TUBES N. Broll, P. de Chateaubourg
STRAIN AND STRESS MEASUREMENTS WITH A TWO-DIMENSIONAL DETECTOR Baoping Bob He and Kingsley L. Smith
STUDY OF HIGH TEMPERATURE OXIDATION KINETICS OF STEEL USING GRAZING X-RAY REFLECTOMETRY A. Knoll, E. Smigiel, N. Broll, A. Cornet
STUDY OF LIGHT ELEMENT ANALYSIS OF THIN FILMS FOR FUNDAMENTAL PARAME TER METHOD Y. Kataoka, N. Kawahara, T. Arai, M. Uda
SYNCHROTRON WHITE BEAM X-RAY TOPOGRAPHY STUDIES OF STRUCTURAL DEFECTS IN MICROGRAVITY-GROWTH CDZNTE SINGLE CRYSTALS B. Raghothamachar, H. Chung, M. Dudley, D.J. Larson Jr.
TEXTURE CHANGE ASSOCIATED WITH ROLLING CONTACT NEAR THE SURFACE OF CARBURIZED STEEL Todd W. Snyder, Robert J. DeAngelis, W.N. Weins, John D. Makinson, Robert V. Lawrence
THE EFFECT OF CO CONTENT ON FATIGUE CRACK GROWTH CHARACTERISTICS OF WC-CO CEMENTED CARBIDES Myung-Hwan Boo, Sae-Wook Oh, Young-Chul Park, Yukio Hirose
THE EFFECT OF THE DIFFRACTOMETER'S RESOLUTION FUNCTION IN HIGH RESOLUTION TRIPLE CRYSTAL X-RAY DIFFRACTION P.D. Moran and R.J. Matyi
THE EFFECTS OF RESONANT CYCLING ON SOFT LEAD ZIRCONATE TITANATE (PZT). J. D. Makinson and D. Breiner
THE IN VIVA MEASUREMENT OF TRACE HEAVEY METALS BY K X-RAY FLUORESCENCE Fiona E. McNeil1 and Joanne M. O’Meara
THE LOCAL STRUCTURE OF MISCIBLE POLYMER BLENDS G.R.Mitchell and Y-S.Chiou
THE VALIDITY OF THE COHERENT SCATTER PEAK NORMALIZATION OF X-RAY INTENSITIES DETECTED DURING IN VIVO XRF MEASUREMENTS OF METALS IN BONE J. M. O’Meara, D. R. Chettle, and F. E. McNeil
THREE-DIMENSIONAL MICROBEAM DIFFRACTION TOMOGRAPHY OF FATIGUE CRACK ASPERITIES IN AL-LI 2090. J.D. Haase, D.P. Piotrowski, A. Guvenilir, J. R. Witt and S. R. Stock
TIME-RESOLVED STUDIES OF ALUMINA CERAMICS PROCESSING WITH NEUTRON AND SYNCHROTRON RADIATION DATA Brian O’Connor, Deyu Li, Bee K Gan, Bruno Latella and John Carter
TIME-RESOLVED X-RAY RHEOLOGY APPLIED TO CRYTALLIZABLE POLYMERS G.R.Mitchell, J.A.Pople, E.Andresen and P.G.Brownsey
TRIPLE AXIS DIFFRACTION STUDIES OF INP GRATING STRUCTURES G.D. U’Ren, M.S. Goorsky, E.M. Koontz, G.S. Petrich, L.A. Kolodziejski,M.H.Lim, V.V. Wang, H.I. Smith, K.M. Matney, and M. Wormington
USE OF POLYCAPILLARY OPTICS IN XRF ANALYSIS AND DIFFRACTION INVESTIGATIONS Muradin A.Kumakhov
X-AY DIFFRACTION ANALYSIS OF MBE PT,, (X=0.5) THIN FILMS H.C. Chien and S.L. Chang, R.F.C. Farrow, D. Weller, R.F. Marks and T.C. Huang
X-RAY ELASTIC CONSTANTS OF SINTERED HIGH CHROMIUM STEEL CONTAINING TITANIUM NITRIDE: COMPARISON OF MODELS Masaharu Miyano , Toshihiko Sasaki, Shigeki Takago, Shouichi Ejiri,Yukio Hirose Yukio Hirose
X-RAY OPTICAL CONSIDERATIONS ON PARABOLIC GRADED MULTILAYERS ON THE DIFFRACTED BEAM SIDE IN X-RAY DIFFRACTION R. Stammer, R. Hopler , M. Schuster and H. Goebel
X-RAY STUDY OF SOFT AND HARD MAGNETIC THIN FILMS Po-Wen Wang
XRD AND VSM ANALYSIS OF NANOSTRUCTURED CU-CO ALLOYS S. K. Gupta and M. G. Gartley
XRF ANALYSIS OF ROCKS AND MINERALS FOR MAJOR AND TRACE ELEMENTS ON A SINGLE LOW DILUTION LI-TETRABORATE FUSED BEAD D. M. Johnson, P. R. Hooper, and R. M. Conrey,
XRF OF INHOMOGENEOUS SPECIMENS BY MONTE-CARLO TECHNIQUES M.Mantler