Advances in X-ray Analysis Vol. 42 including 70 PDF files

A DIRECT ALGORITHM FOR SOLVING ILL-CONDITIONED LINEAR ALGEBRAIC SYSTEMS K.J. Kozaczek , X.J. Xue, S.K. Kurtz and D.S. Kurtz, HyperNex, Inc., State College, PA
A MODIFIED APPROACH TO HOMOGENEITY TESTING AT MICROSCALE M. Mattiuzzi and A. Markowicz, IAEA Laboratories, A-2444 Seibersdorf, AUSTRIA
ACCESSING THE ELASTIC PROPERTIES OF CUBIC MATERIALS WITH DIFFRACTION METHODS T. Gnaupel-Herold, P.C. Brand and H.J. Prask, National Institute of Standards and Technology, Gaithersburg, MD
ADVANCES IN X-RAY COMPUTED MICROTOMOGRAPHY AT THE NSLS B.A. Dowd, A.B. Andrews, K.W. Jones, R.B. Marr, A.M. Peskin, and D.P. Siddons, NSLS, Brookhaven National Laboratory, Upton, NY
ADVANTAGES OF USING 2D DETECTORS FOR RESIDUAL STRESS MEASUREMENTS B.B. He, U. Preckwinkel and K.L. Smith, Bruker Analytical X-ray Systems, Inc., Madison, WI
AN ELECTROCHEMICAL CELL FOR IN-SITU X-RAY CHARACTERIZATION M.A. Rodriguez, D. Ingersoll and D.H. Doughty, Sandia National Laboratories, Albuquerque, NM
AN X-RAY FLUORESCENCE STUDY OF LAKE SEDIMENTS FROM ANCIENT TURKEY USING SYNCHROTRON RADIATION E.S. Friedman, Y. Sato, A. Alatas, C.E. Johnson, T.J. Wilkinson, K.A. Yener, B. Lai, G. Jennings, S.M. Mini and E.E. Alp, Oriental Institute, Chicago, IL
AN XRD MORPHOLOGY INDEX FOR TALCS: THE EFFECT OF PARTICLE SIZE AND MORPHOLOGY ON THE SPECIFIC SURFACE AREA H.J. Holland and M.J. Murtagh, Corning Incorporated, Corning, NY
ANALYSIS BY X-RAY DIFFRACTION OF THE MECHANICAL BEHAVIOUR OF AUSTENITIC AND FERRITIC PHASES OF A DUPLEX STAINLESS STEEL L. Meirdi, K. Inal and J.L. Lebrun, LM3-MetX, 75013 Paris, FRANCE
APPLICATIONS AND PERSPECTIVES OF A NEW INNOVATIVE XRF-XRD SPECTROMETER IN INDUSTRIAL PROCESS CONTROL D. Bonvin, R. Yellepeddi and A. Buman, ARL, CH-1024 Ecublens, SWITZERLAND
APPLICATIONS OF MICRO XRF FOR THE ANALYSIS OF TRADITIONAL JAPANESE "AINU" GLASS BEADS AND OTHER ARTIFACTS K. Sugihara, M. Satoh, Y. Hayakawa, A. Saito and T. Sasaki, Seiko Instruments, Inc., Chiba 261-8507, JAPAN
AUTOMATED MONITORING OF STACK GAS EMISSIONS BY EDXRF O. Haupt, R. Harmel, C. Schafer and W. Dannecker, University of Hamburg, 20146 Hamburg, GERMANY
BST THIN FILM EVALUATION USING X-RAY FLUORESCENCE AND REFLECTIVITY METHODS M. Funahashi, M. Kuraoka, S. Fujimura, H. Kobayashi, H. Kohno and R. Wilson, Rigaku/USA, Inc., Danvers, MA
CHARACTERIZATION OF METAL BENZOTRIAZOLES AND RELATED POLYMERS S.J. Wasson, M.C. Kerzic, J.W. Hall, M.A. Cates and J.R. Wasson, U.S. Environmental Protection Agency, Research Triangle Park, NC
CHARACTERIZATION OF STRAIN IN THIN-FILM STRUCTURES WITH MICRODIFFRACTION J.L. Jordan-Sweet, I.C. Noyan, E. Liniger, S.K. Kaldor and P.-C. Wang, NSLS 725A / X20, Upton, NY
CHECKING AND ESTIMATING RIR VALUES Q. Johnson and R.S. Zhou, Materials Data, Inc., Livermore, CA
COMPARISON BETWEEN ORIENTATION-DEPENDENT STORED ENERGY OF COLD ROLLED AND STRESS RELIEVED INTERSTITIAL FREE STEEL N. Rajmohan, Y. Hayakawa, J.A. Szpunar and J.H. Root, McGill University, Montreal, QC, H3A 2B2, CANADA
CONFOCAL GRADED D-SPACING MULTILAYER BEAM CONDITIONING OPTICS B. Verman, L. Jiang, B. Kim, R. Smith and N. Grupido, Osmic, Inc., Troy, MI
CONSIDERATIONS ON THE DETECTION LIMIT OF TEY (TOTAL ELECTRON YIELD) M. Ebel, H. Ebel and Robert Svagera, Technische Universitat Wien, A-1040 Wien, AUSTRIA
CORRELATION OF NEAR SURFACE MORPHOLOGY OF POLYPROPYLENE AND PAINT ADHESION STUDIED BY GRAZING INCIDENCE X-RAY DIFFRACTION A.R. Drews, D.F. Mielewski and H.K. Plummer, Jr., Ford Research Laboratory, Dearborn, MI
DB2DI: EXTRACTING PEAK-HEIGHT D-I DATA FOR THE POWDER DIFFRACTION FILE FROM RIETVELD ANALYSES D.K.Smith and R.A. Young, The Pennsylvania State University, State College, PA
DEVELOPMENT OF AN XRF METROLOGY METHOD FOR COMPOSITION AND THICKNESS OF BARIUM STRONTIUM TITANATE THIN FILMS T. Remmel and D. Werho, Motorola, Inc., Tempe, AZ
DIGITIZED DATABASE QUANTIFICATION, DDBQ, ANALYSIS OF COMPLEX MIXTURES USING FULLY DIGITIZED PATTERNS D.K. Smith and G.G. Johnson, Jr., The Pennsylvania State University, State College, PA
DISORDERING POLYCRYSTALLINE MATERIALS: APPLICATIONS TO RIETVELD REFINEMENTS A. Cabeza, E.R. Losilla, H.S. Martinez-Tapia, S. Bruque and M.A.G. Aranda, Universidad de Malaga, 29071 Malaga, SPAIN
EFFECTS OF THERMAL CYCLES ON RESIDUAL STRESS FOR NITRIDED AND SULPHONITRIDED HOT WORK DIE STEEL K. Yatsushiro, M. Hihara, K. Okada, S. Yabuuchi and M. Kuramoto, Yamanashi Industrial Technology Center, Yamanashi 400-0055, JAPAN
ESTIMATING RESIDUAL STRESS TENSOR IN ALUMINUM AND COPPER THIN FILMS AND INTERCONNECTS X.J. Xue, K.J.Kozaczek, D.S. Kurtz and S.K. Kurtz, HyperNex, Inc., State College, PA
EVALUATION OF ENERGY-DISPERSIVE X-RAY FLUORESCENCE FOR MOBILE ANALYSIS OF HAZARDOUS METALS IN TRANSURANIC WASTE S.J. Goldstein, Los Alamos National Laboratory, Los Alamos, NM
EXEFS J. Kawai, K. Hayashi and K. Maeda, Kyoto University, Kyoto 606-8501, JAPAN
FUNDAMENTAL PARAMETER METHODS IN XRF SPECTROSCOPY H.A. van Sprang, Philips Research Labs, 5656 AA Eindhoven, THE NETHERLANDS
FURTHER APPLICATIONS OF KOSSEL TECHNIQUE BY MEANS OF ELECTRON AND SYNCHROTRON BEAM EXCITATION J. Bauch, J. Brechbuhl and H.-J. Ullrich, TU Dresden, D-01069 Dresden, GERMANY
HIGH RESOLUTION X-RAY DIFFRACTION AND PHOTOLUMINESCENCE CORRELATION AS AN ACCURATE AND NONDESTRUCTIVE EVALUATION TECHNIQUE FOR PHEMT STRUCTURES A. Torabi, S.K. Brierley, P.S. Lyman, W.E. Quinn and W.E. Hoke, Microelectronics, Andover, MA
IMPROVED GRADED MULTILAYER MIRRORS FOR XRD APPLICATIONS C. Michaelsen, P. Ricardo, D. Anders, M. Schuster, J. Schilling and H. Gobel, GKSS Research Center, D-21502 Geesthacht, GERMANY
INFLUENCE OF REFINEMENT STRATEGIES ON RIETVELD PHASE COMPOSITION DETERMINATIONS B. O'Connor and D. Li, Curtin University of Technology, Perth, WA 6845, AUSTRALIA
IN-SITU ENVIRONMENTAL XRF W.T. Elam, J.W. Adams, K.R. Hudson, B.J. McDonald, J.V. Gilfrich and J. Galambos, Naval Research Laboratory, Washington, DC
LOCAL ATOMIC IMAGE OF 0.02% ZN IN GAAS WAFER USING X-RAY HOLOGRAPHY K. Hayashi, T. Yamamoto, J. Kawai, M. Suzuki, S. Goto, S. Hayakawa, K. Sakurai and Y. Gohshi, Kyoto University, Kyoto 606-8501, JAPAN
LOGICAL STEPS IN THE AUTOMATED LACHANCE-TRAILL XRF MATRIX CORRECTION METHOD UTILIZING AN ELECTRONIC SPREADSHEET A.J. Klimasara, OSRAM SYLVANIA Development, Inc., Beverly, Massachusetts
LOW TEMPERATURE X-RAY INVESTIGATIONS OF RB2LI4(SEO4)3 2H2O W. Bronowska and A. Pietraszko, Wroclaw University of Technology, 50-370 Wroclaw, POLAND
MEASUREMENTS OF RESIDUAL STRESSES IN MICRON REGIONS BY USING SYNCHROTRON EXCITED KOSSEL DIFFRACTION J. Brechbuhl, J. Bauch and H.-J. Ullrich, TU Dresden, D-01069 Dresden, GERMANY
MICROSTRUCTURE OF CLAY-POLYMER COMPOSITES T.N. Blanton, D. Majumdar and S.M. Melpolder, Eastman Kodak Company, Rochester, NY
MODELING OF X-RAY DIFFRACTION STRESS ANALYSIS IN POLYCRYSTALLINE INTERCONNECTS WITH SHARP FIBER TEXTURES X.J. Xue, K.J. Kozaczek, S.K. Kurtz and D.S. Kurtz, HyperNex, Inc., State College, PA
NEW DEVELOPMENTS IN MICROSTRUCTURE ANALYSIS VIA RIETVELD REFINEMENT A. Le Bail, Universite du Maine, 72085 Le Mans Cedex 9, FRANCE
NON-AMBIENT U-DIFFRACTION T. Wroblewski and E. Woldt, HASYLAB@DESY, D-22603 Hamburg, GERMANY
ON THE ENERGY DEPENDENCE OF THE DETECTOR EFFICIENCY OF A SI-PIN DIODE H. Ebel, M. Mantler, S. Saxinger, R. Svagera, B. Wernsperger, P. Wobrauschek and A.C. Huber, Technische Universitat Wien, A-1040 Wien, AUSTRIA
OPTIMIZING THE ELEMENTAL SENSITIVITY AND FOCAL SPOT SIZE OF A MONOLITHIC POLYCAPILLARY OPTIC USING MICRO-X-RAY FLUORESCENCE C. Worley, G.J. Havrilla, N. Gao and Q.-F. Xiao, Los Alamos National Laboratory, Los Alamos, NM
POWDER DIFFRACTION OF ORGANOMETALLIC COMPOUNDS: THE ACTIVE USE OF MULTIPLE OBSERVATIONS N. Masciocchi and A. Sironi, Universita di Milano, I-20133 Milano, ITALY
PROPOSAL OF METHOD TO MAKE POLE FIGURE USING IMAGING PLATE T. Goto, T. Sasaki, Y. Hirose and S. Nagasima, Kanazawa University, Ishikawa-ken, 920-11, JAPAN
QUANTITATIVE ANALYSIS OF THE PHASE TRANSFORMATIONS IN NANOCRYSTALLINE MATERIALS VIA RIETVELD REFINEMENT X. Bokhimi, A. Morales, O. Novaro, T. Lopez, R. Gomez and A. Garcia-Ruiz, The National University of Mexico, 01000 Mexico D.F., MEXICO
QUANTITATIVE DESCRIPTION OF FIBER TEXTURES IN CUBIC METALS R. De Angelis, T. Snyder, J. House and W. Hosford, University of Nebraska, Niceville, FL
QUANTITATIVE X-RAY DIFFRACTOMETRY AND STRUCTURAL ANALYSIS OF MAGNESIUM TITANATE MIXTURES USING THE RIETVELD REFINEMENT G. Kimmel and J. Zabicky, , Omer, 84965, ISRAEL
QUANTITATIVE XRD ANALYSIS OF COAL COMBUSTION BY-PRODUCTS BY THE RIETVELD METHOD. TESTING WITH STANDARD MIXTURES R.S. Winburn, S.L. Lerach, B.R. Jarabek, M.A. Wisdom, D.G. Grier and G.J. McCarthy, North Dakota State University, Fargo, ND
ROUTINE QUANTITATIVE PHASE ANALYSIS OF NIOBIUM-BEARING LATERITIC ORES D. Kampata, J. Naud and P. Sonnet, Universite Catholique de Louvain, 1348 Louvain-la-Neuve, BELGIUM
SEPARATION AND QUANTIFICATION OF THE AMORPHOUS PHASE USING THE RIETVELD FULL PATTERN ANALYSIS OF SOME INDUSTRIAL SEMI-CRYSTALLINE MATERIALS P. Riello, P. Canton, A. Benedetti and G. Fagherazzi, Universita di Venezia, 30123 Venezia, ITALY
SOLVING CRYSTAL STRUCTURES OF INORGANIC, ORGANIC AND COORDINATION COMPOUNDS USING SYNCHROTRON POWDER DATA J.A. Kaduk, Amoco Corporation, Naperville, IL
SPECIMEN PREPARATION LIMITATIONS IN TRACE ELEMENT ANALYSIS QUANTIFICATION USING MICRO-X-RAY FLUORESCENCE L.P. Colletti and G.J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM
STRUCTURAL AND RESIDUAL STRESS ANALYSIS BY X-RAY DIFFRACTION ON POLYMERIC MATERIALS AND COMPOSITES V. Hauk, Institute fur Werkstoffkunde, D 52056 Aachen, GERMANY
TEMPERATURE RESOLVED EVALUATION OF RESIDUAL STRESSES IN AN ALPHA-AL2O3 SCALE USING PARALLEL BEAM X-RAY DIFFRACTION M. Gross, V. Kolarik, L. Singheiser, W. Engel and N. Eisenreich, Fraunhofer Institute fur Chemische Technologie, D-76318 Pfinztal, GERMANY
TEXTURE DETERMINATION IN HIGHLY STRESSED PVD THIN FILMS P. Scardi, M. Leoni and Y.H. Dong, Universita di Trento, 38050 Mesiano (TN), ITALY
THE USE OF WAVELET TRANSFORMS FOR X-RAY DIFFRACTION ANALYSIS S. Bates, Kratos Analytical Inc., Chestnut Ridge, NY
THIN FILM DENSITY DETERMINATION BY MULTIPLE RADIATION ENERGY DISPERSIVE X-RAY REFLECTIVITY D. Windover and S.L. Lee, ARDEC, Benet Laboratories, Watervliet, NY
THIN FILM SORBENTS FOR TXRF ANALYSIS A.P. Morovov, L.D. Danilin, V.V. Zhmailo, Yu. V. Ignat'ev, N.V. Pilipenko, V.V. Nazarov, M.G. Vasin, V.V. Chulkov and V.N. Funin, RFNC-VNIIEF, Nizhni Novgorod region, 607190, RUSSIA
THIN FILMS CHARACTERIZATION BY SYNCHROTRON X-RAY MICRO-DIFFRACTION USING GRAZING EXIT CONDITIONS T. Noma, K. Takada and A. Iida, Photon Factory, Tsukuba, Ibaraki 305, JAPAN
USE OF ODF DATA TO QUANTITATIVELY DESCRIBE FIBER TEXTURES W.F. Hosford, J. O'Brien, J. House and R. De Angelis, University of Michigan, Ann Arbor, MI
WIDE ANGLE GEOMETRY EDXRF SPECTROMETERS WITH SECONDARY TARGET AND DIRECT EXCITATION MODES B. Yokhin, Jordan Valley AR Ltd., Migdal-Haemek, 23100, ISRAEL
X-RAY ANALYSIS OF THE MECHANICAL STATE OF A NICKEL BASED MULTICRYSTAL ON THE MESOSCOPIC SCALE: ROLE OF THE GRAIN ORIENTATION AND ITS BOUNDARY F. Eberl, J.L. Lebrun and G. Cailletaud, LM3-MetX, 75013 Paris, FRANCE
X-RAY CHARACTERIZATION OF COMPOUNDS IN THE SRO-PBO SYSTEM W. Wong-Ng, J.P. Cline, L.P. Cook and W. Greenwood, NIST, Gaithersburg, MD
X-RAY DIFFRACTION SIGNATURES OF DEFECTS IN NANOCRYSTALLINE MATERIALS J.D. Makinson, J.S. Lee, S.H. Magner, R.J. De Angelis, W.N. Weins and A.S. Hieronymus, University of Nebraska, Lincoln, NE
X-RAY FRACTOGRAPHIC STUDY OF SINTERED FE-CR STEEL/TIN SYSTEM COMPOSITE MATERIALS S. Takago, T. Sasaki, M. Miyano and Y. Hirose, Kanazawa University, Ishikawa, 920-1192, JAPAN
X-RAY OPTICS Eberhard Spiller, Spiller X-ray Optics, Mt. Kisco, NY
X-RAY STUDY ON TRI-AXIAL STRESS MEASUREMENT OF DIAMOND FILM H. Hirose and T. Sasaki, Kanazawa University, Ishikawa-ken, 920-11, JAPAN
XRF MAPPING: NEW TOOLS FOR DISTRIBUTION ANALYSES B. Scruggs, M. Haschke, L. Herczeg and J. Nicolosi, EDAX Inc., Mahwah, NJ