Advances in X-ray Analysis Vol. 43

A GRAZING INCIDENCE X-RAY FLUORESCENCE ANALYSIS OF THE COMPOSITION OF (BA,SR)TIO3* (BST) AND SRRUO3* (SRO) STACKED FILMS S. Terada, H. Furukawa, H. Murakami and K. Nishihagi, TECHNOS Co., Ltd., Osaka 573-0164, Japan
A METHOD FOR OBTAINING STRESS-DEPTH PROFILES BY ABSORPTION CONSTRAINED PROFILE FITTING OF DIFFRACTION PEAKS T. Ely, P.K. Predecki and I.C. Noyan, University of Denver, Denver, CO
A PORTABLE X-RAY APPARATUS FOR BOTH STRESS MEASUREMENT AND PHASE ANALYSIS UNDER FIELD CONDITIONS V. Monin, J.R. Teodosio and T. Gurova, UFRJ, Rio de Janeiro, Brazil
ACCURACY OF XRPD MEASUREMENT VIA DIFFRACTION INSTRUMENTAL MONITORING G. Berti, Universita' di Pisa, 56126 Pisa, Italy
AMBIGUITIES OF MICRO AND NANO STRUCTURAL DETERMINATION G. Berti, Universita' di Pisa, 56126 Pisa, Italy
AN IMPROVED AEROSOL GENERATION SYSTEM FOR THE PREPARATION OF XRF CALIBRATION FILTERS C. Vanhoof, V. Corthouts and N. De Brucker, VITO, , Belgium
AN INNOVATION IN TRANSMISSION COEFFICIENT MEASUREMENT B.B. He and K.L. Smith, Bruker Analytical X-ray Systems, Inc., Madison, WI
AN UPDATE TO NRLXRF AND NBSGSC W.T. Elam and J.R. Sieber, National Institute of Standards and Technology, Gaithersburg, MD
ANALYSIS OF INTRINSIC STRESS IN DIAMOND FILMS BY X-RAY DIFFRACTION Q. Yang, L. Zhao and H. Xiao and N. Zhao, Vienna University of Technology, 1090 Wien, Austria
APPLICATION OF MICRO X-RAY FLUORESCENCE SPECTROMETRY FOR LOCALIZED AREA ANALYSIS OF BIOLOGICAL AND ENVIRONMENTAL MATERIALS J.R. Sieber, M. Lankosz and M. Boruchowska, National Institute of Standards & Technology, Gaithersburg, MD
APPLICATION OF NI/C G*BEL MIRRORS AS PARALLEL BEAM X-RAY OPTICS FOR CU K* AND MO K* RADIATION T. Holz, R. Dietsch, H. Mai and L. Br*gemann, FhG-IWS, D-01277 Dresden, Germany
APPLICATION OF POLYCAPILLARY OPTICS FOR PARALLEL BEAM POWDER DIFFRACTION S.T. Misture and M. Haller, The NY State College of Ceramics at Alfred University, Alfred, NY
ATTAINING 1% ACCURACY IN ABSOLUTE PHASE COMPOSITION LEVELS BY RIETVELD ANALYSIS B.H. O'Connor and D.Y. Li, Curtin University of Technology, Perth, WA 6845, Australia
BARIUM STRONTIUM TITANATE THIN FILM ANALYSIS T. Remmel, M. Schulberg, S. Fujimura, H. Honma, H. Kobayashi, H. Kohno, S. Owens, R. Deslattes and J. Pedulla, Motorola, Inc., Tempe, AZ
BEAM COLLIMATION USING POLYCAPILLARY X-RAY OPTICS FOR LARGE AREA DIFFRACTION APPLICATIONS S.D. Padiyar, H. Wang, M.V. Gubarev, W.M. Gibson and C.A. MacDonald, University at Albany, State University of New York, Albany, NY
CHARACTERIZATION OF PU-CONTAINING PARTICLES BY X-RAY MICROFLUORESCENCE M. Mattiuzzi, A. Markowicz and P. Danesi, IAEA Laboratories, A-2444 Seibersdorf, Austria
CHARACTERIZATION OF SURFACES AND THIN FILMS USING A HIGH PERFORMANCE GRAZING INCIDENCE X-RAY DIFFRACTOMETER S. Matsuno, M. Kuba, Y. Moriyasu, T. Morishita and K. Omote, Asahi Chemical Industry CO. LTD., Shizuoka, 416-8501, Japan
COMPLETE DATA SETS ACQUIRED WITH DIFFERENT POLYCAPILLARY OPTIC - SOURCE CONFIGURATIONS F.A. Hofmann, W.M. Gibson, C.A. MacDonald, D.A. Carter, J.X. Ho and J.R. Ruble, University at Albany, SUNY, Albany, NY
DETERMINATION OF RESIDUAL STRESSES IN HARDENED GEARS R. Herbst, M. Mantler and L. Markega*rd, Vienna University of Technology, A-1040 Vienna, Austria
DEVELOPMENT OF AN AUTOMATED SAMPLE PREPARATION STATION FOR MICROSAMPLE X-RAY ANALYSIS (MXA) D. Clark Turner, E.C. Anderson, B. Shumway, Process Analytics, Orem, UT
DIFFRACTING PARTICLE SIZE ANALYSIS OF MARTENSITE - RETAINED AUSTENITE MICROSTRUCTURES J.D. Makinson, W.N. Weins, T.W. Snyder and R.J. De Angelis, University of Nebraska, Lincoln, NE
ED-XRF SPECTRUM EVALUATION AND QUANTITATIVE ANALYSIS USING MULTIVARIATE AND NONLINEAR TECHNIQUES P. Van Espen and P. Lemberge, University of Antwerp, B-2610 Antwerp, Belgium
EFFECT OF CALIBRATION SPECIMEN PREPARATION TECHNIQUES ON NARROW RANGE X-RAY FLUORESCENCE CALIBRATION ACCURACY S.H. Nettles, Construction Technology Laboratories, Inc., Skokie, IL
EFFECTS OF SUBSTRATE COATING WITH METAL SPRAYING ON RESIDUAL STRESSES IN SPUTTERED TITANIUM-NITRIDE FILMS Y.Miyoshi, H. Tanabe, T. Takamatsu, T. Sameshima, T. Ejima and K. Ueda, The University of Shiga Prefecture, Hikone Shiga 522-8533, Japan
EVALUATION OF RESIDUAL STRESS GRADIENTS BY DIFFRACTION METHODS WITH WAVELETS; A NEURAL NETWORK APPROACH H. Wern, HTW des Saarlandes, D-66117 Saarbrucken, Germany
FUNDAMENTALS OF TWO-DIMENSIONAL X-RAY DIFFRACTION (XRD2*) B.B. He, U. Preckwinkel and K.L. Smith, Bruker Analytical X-ray Systems, Inc., Madison, WI
GLIDE TWIN OF CHALCOPYRITE-TYPE AGGAS2*: MORPHOLOGY AND FORMATION MECHANISM H.K. Eba, N. Ishizawa and Y. Noda, National Research Institute for Metals, Ibaraki, 305-0047, Japan
GRADED D-SPACING MULTILAYER OPTICS FOR VARIOUS ENERGIES B. Verman, B. Kim, D. Wilcox, D. Broadway, Y. Platonov, N. Grupido and L. Jiang, Osmic, Inc., Troy, MI
GRAZING INCIDENCE X-RAY DIFFRACTION CHARACTERIZATION OF CORROSION DEPOSITS INDUCED BY CARBON DIOXIDE ON MILD STEEL S. Sembiring, B. O'Connor, D. Li, A. van Riessen, C. Buckley, I. Low and R. De Marco, Curtin University of Technology, Perth, WA 6845, Australia
GRAZING INCIDENCE X-RAY DIFFRACTOMETER FOR DETERMINING IN-PLANE STRUCTURE OF THIN-FILMS K. Omote and J. Harada, X-ray Research Lab. Rigaku Corp., Tokyo 196-8666, Japan
HEAVY ELEMENT DETERMINATION IN HEALTH-RELATED ORGANIC MATRIX MATERIALS BY TOTAL REFLECTION X-RAY FLUORESCENCE E.D. Greaves, Universidad Simon Bolivar, Carcas 1080, Venezuela
HIGH RESOLUTION X-RAY MEASUREMENTS OF STRAIN-MEDIATED DIFFUSION IN CUINSE2 P. Fons, S. Niki, A. Yamada, M. Uchino and H. Oyanagi, Electrotechnical Laboratory, Tsukuba, Ibaraki 305, Japan
IDENTIFICATION OF CUCL IN SI BY XRD-XRF ANALYSIS C.-T. Li and L. Tarhay, Dow Corning Corporation, Midland, MI
INFLUENCE OF REHEATING TEMPERATURE ON RESIDUAL STRESS IN NITRIDED HOT WORK DIE STEEL (H13) K. Yatsushiro, M. Hihara and M. Kuramoto, Polytechnic University, Kanagawa 229-1196, Japan
INTERNAL STANDARDS IN HIGH TEMPERATURE XRD M. Mantler and G. Hammerschmid, Vienna University of Technology, A-1040 Vienna, Austria
INVESTIGATION OF ELECTRON EXCITED X-RAY SPECTRA IN DEPENDENCE ON THE ANGLE OF ELECTRON INCIDENCE H. Ebel, R. Svagera, J. Wernisch, M.F. Ebel and M. Sander, Institut fur Angewandte und Technische Physik, A-1040 Wien, Austria
LATTICE PARAMETERS OF GALLIUM NITRIDE AT HIGH TEMPERATURES AND RESULTING EPITAXIAL MISFITS WITH ALUMINA AND SILICON CARBIDE SUBSTRATES C.J. Rawn and J. Chaudhuri, Oak Ridge National Laboratory, Oak Ridge, TN
MATHEMATICAL PROPERTIES OF DIFFRACTION POLE FIGURES H. Schaeben, Freiberg University of Technology and Mining, D 09596 Freiberg, Germany
MEASUREMENT AND ANALYSIS OF RESIDUAL STRESS IN *-PHASE IRON NITRIDE LAYERS AS A FUNCTION OF DEPTH T.R. Watkins, R.D. England, C. Klepser and N. Jarayaman, Oak Ridge National Laboratory, Oak Ridge, TN
MOLECULAR CRYSTAL STRUCTURES FROM POWDER DIFFRACTION DATA: APPLICATIONS TO PHARMACEUTICAL ANALYSIS AND TO THE CHEMISTRY OF DYES V.V. Chernyshev, A.V. Yatsenko, A.N. Fitch, E.J. Sonneveld, V.A. Makarov and H. Schenk, Moscow State University, 119899 Moscow, Russia
NARROW ROCKING CURVE MULTILAYER X-RAY MIRRORS S.M. Owens, R.D. Deslattes and J. Pedulla, National Institute of Standards & Technology, Gaithersburg, MD
NEUTRON STRESS MEASUREMENT USING NEUTRON IMAGING PLATE T. Sasaki, N. Minakawa, Y. Morii, N. Niimura and Y. Hirose, Kanazawa University, Ishikawa, 920-1192, Japan
PARALLEL BEAM METHODS IN POWDER DIFFRACTION AND TEXTURE IN THE LABORATORY R.A. Clapp and M. Haller, Diffraction Technology Pty. Ltd., Mitchell, A.C.T 2911, Australia
PHASE ANALYSIS OF CARBON-CERAMIC COMPOSITES SYNTHESIZED BY IN-SITU SINTERING Q. Yang, H. Xiao and M. Mantler, Vienna University of Technology, 1090 Wien, Austria
POLYCAPILLARY X-RAY OPTICS FOR X-RAY ASTRONOMY C.H. Russell, M. Gubarev, J. Kolodziejczak, M. Joy, C.A. MacDonald and W.M. Gibson, National Institute of Standards & Technology, Gaithersburg, MD
PREPARATION AND CHARACTERIZATION OF DRIED-RESIDUE CALIBRATION STANDARDS FOR USE IN MICROSAMPLE X-RAY ANALYSIS (MXA) E.C. Anderson, B. Shumway and D.C. Turner, Process Analytics, Orem, UT
QUANTIFICATION OF FERRITE SPINEL AND HEMATITE IN FLY ASH MAGNETICALLY ENRICHED FRACTIONS R.S. Winburn, S.L. Lerach, G.J. McCarthy, D.G. Grier and J.D. Cathcart, North Dakota State University, Fargo, ND
QUANTITATIVE POLE FIGURE ANALYSIS OF ORIENTED POLYETHYLENE FILMS J.H. Butler, S.M. Wapp and F.H. Chambon, Exxon Chemical Company, Baytown, TX
QUANTITATIVE SURFACE ANALYSIS BY X-RAY INDUCED ELECTRON EMISSION H. Ebel, R. Svagera and M.F. Ebel, Technische Universitaet Wien, A-1040 Wien, Austria
REALIZATION OF AN ASYMMETRIC MULTILAYER X-RAY MIRROR S.M. Owens, R.D. Deslattes and J. Pedulla, National Institute of Standards & Technology, Gaithersburg, MD
REMOTE X-RAY DIFFRACTION AND X-RAY FLUORESCENCE ANALYSIS ON PLANETARY SURFACES D.F. Blake, NASA Ames Research Center, Moffett Field, CA
RESEARCH IN QUANTITATIVE X-RAY FLUORESCENCE MICROANALYSIS OF PATTERNED THIN FILMS M. Lankosz, J.R. Sieber and J. Pedulla, National Institute of Standards and Technology, Gaithersburg, MD
RESIDUAL STRESS ANALYSIS - A USEFUL TOOL TO ACCESS THE FATIGUE BEHAVIOR OF STRUCTURAL COMPONENTS B. Scholtes, University of Kassel, D-34109 Kassel, Germany
RESIDUAL STRESS ANALYSIS OF GRAPHITE/POLYMER COMPOSITES USING THE CONCEPT OF METALLIC INCLUSIONS D. Dragoi, P. Predecki, M. Kumosa and M. Castelli, California Institute of Technology, Pasadena, CA
SELECTED METHODS OF EVALUATING RESIDUAL STRESS GRADIENTS MEASURED BY X-RAY DIFFRACTION. TRADITIONAL, FULL TENSOR, AND WAVELET L. Suominen and D. Carr, Stresstech Oy, 40500 Jyvaskyla, Finland
SIMULTANEOUS MEASUREMENTS OF SEVERAL POLE FIGURES USING AN IMAGING PLATE T. Goto, T. Sasaki and H. Hirose, Kanazawa University, Ishikawa-ken, 920-1192, Japan
STRUCTURE DEVELOPMENT DURING THE HEAT-DRAW PROCESS OF NYLON 66 FIBER BY SYNCHROTRON X-RAY DIFFRACTION S. Ran, S. Cruz, X. Zong, D. Fang, B. Chu, B.S. Hsiao, R. Ross, H. Chang and D. Londono, State University of New York at Stony Brook, Stony Brook, NY
STUDY OF THE FATIGUE FRACTURE SURFACE REGIONS OF STEELS USING MICROBEAM SYNCHROTRON X-RAY DIFFRACTION Y. Yoshioka, K.Akita, H. Suzuki and T.Sasaki, Musashi Institute of Technology, Setagaya, Tokyo 158-8557, Japan
SYNCHROTRON STUDIES OF POLYMERS AT HIGH SPATIAL AND TEMPORAL RESOLUTION A. Mahendrasingam, C. Martin, S. Bingham, W. Fuller and D.J. Blundell, Keele University, Staffordshire ST5 5BG, United Kingdom
SYSTEMATIC ERRORS IN LINEAR PSD BASED HTXRD SYSTEMS E.A. Payzant and W.S. Harrison, III, Oak Ridge National Laboratory, Oak Ridge, TN
THE ANALYTICAL POSSIBILITIES OF A PORTABLE TXRF-SPECTROMETER U. Waldschlager, INTAX GmbH, 12489 Berlin, Germany
THE EVALUATION OF STRUCTURE PARAMETERS OF A MO/SI SUPERLATTICE USING X-RAY SCATTERING DATA AND A GENETIC ALGORITHM A. Ulyanenkov, K. Omote and J. Harada, Rigaku Corp., 196-8666 Tokyo, Japan
THE INFLUENCE OF SPECIMEN SIZE AND BEAM DIVERGENCE ON QUANTITATIVE XRF BY FUNDAMENTAL PARAMETER METHODS M. Mantler and B. Hochleitner, Vienna University of Technology, A-1040 Vienna, Austria
THE MODIFICATION OF TXRF-METHOD BY USE OF X-RAY SLITLESS COLLIMATOR V.K. Egorov, O.S. Kondratiev, A.P. Zuev and E.V. Egorov, Institute Problems Microelectronic Technology RAS, 142432, Institute Prospect, 19, Russia
TIME DEPENDENT CHARACTERIZATION OF OMBROTROPHIC PEAT CORES FROM POLAND AND AUSTRIA FOR STUDYING ATMOSPHERIC DEPOSITION OF METALS B. Holynska, B. Ostachowicz, J. Ostachowicz, L. Samek, P. Wachniew, E. Madeyska, P. Wobrauschek, C. Streli and G. Halmetschlager, University of Mining and Metallurgy, 30-059 Krakow, Poland
TUNABLE MULTILAYER-MIRROR OPTICS FOR TABLE-TOP X-RAY MICROTOMOGRAPHY N. Gurker, R. Nell and W. Backfrieder, Vienna University of Technology, A-1040 Vienna, Austria
TWO-DIMENSIONAL SMALL ANGLE SCATTERING FROM SUBMONOLAYER ISLANDS P.F. Miceli, A. Sahiner, C. Botez, W.C. Elliott and P.W. Stephens, University of Missouri-Columbia, Columbia, MO
ULTRA-TRACE ANALYSIS BY MICRO X-RAY FLUORESCENCE SPECTROSCOPY M. Haschke, P. Pfannekuch and B. Scruggs, EDAX Inc., Mahwah, NJ
VXRF: A SOFTWARE PACKAGE FOR TEACHING (AND LEARNING) XRF M. Mantler, Vienna University of Technology, A-1040 Vienna, Austria
X-RAY CHARACTERIZATION OF RESISTOR/DIELECTRIC MATERIAL FOR LOW TEMPERATURE CO-FIRED CERAMIC PACKAGES M.A. Rodriguez, P. Yang, P. Kotula and D. Dimos, Sandia National Laboratories, Albuquerque, NM
X-RAY FRACTOGRAPHY STUDY OF A SINTERED COMPOSITES SYSTEM OF AL2O3/SIC (WHISKER) T. Mori, M. Kawasaki, T. Sasaki and Y. Hirose, Kanazawa University, Ishikawa, 920-1192, Japan
X-RAY MEASUREMENT OF TRI-AXIAL RESIDUAL MACRO- AND MICROSTRESS IN FE-CR STEEL/TIN SYSTEM COMPOSITE MATERIALS PREPARED BY POWDER METALLURGY S. Takago, T. Sasaki and Y. Hirose, Kanazawa University, Ishikawa, 920-1192, Japan
X-RAY STRESS ANALYSIS ON POLYCRYSTALLINE MATERIALS USING TWO-DIMENSIONAL DETECTORS A. Ka*mpfe, B. Eigenmann, E. Macherauch, D. Lo*he, B. Ka*mpfe and S. Goldenbogen, Universitaet Karlsruhe, D-76128 Karlsruhe, Germany
X-RAY STRESS MEASUREMENT FOR TITANIUM ALUMINIDE INTERMETALLIC COMPOUND T. Kondoh, T. Goto, T. Sasaki, Y. Hirose, Kanazawa University, Ishikawa-ken, 920-1192, Japan
X-RAY STUDY OF SHOT PEENING MATERIAL DURING FATIGUE S. Takahashi, M. Hashimoto and Y. Hirose, Kanazawa University, Kanazawa, 920-1192, Japan
X-RAY STUDY OF THE INHOMOGENEITY OF SURFACE RESIDUAL STRESSES AFTER SHOT-PEENING TREATMENT V. Monin, J.R. Teodosio, T. Gurova and J.T. Assis, UFRJ, Rio de Janeiro, Brazil
XRF IDENTIFICATION OF ALLOYS USING LOTUS APPROACH 97* DATABASE WITH ASM INTERNATIONAL* DATA A.J. Klimasara, Osram Sylvania, Inc., Beverly, MA