Advances in X-ray Analysis Vol. 44

A COMPACT X-RAY SPECTROMETER WITH MULTI-CAPILLARY X-RAY LENS AND FLAT CRYSTALS H. Soejima, Shimadzu Scientific Research, Kyoto, Japan, T. Narusawa, Kochi University of Technology, Kochi, Japan
A CONTINUOUS ELECTRON DENSITY APPROACH IN RIETVELD ANALYSIS FOR STRUCTURE INVESTIGATIONS OF THE MESOPOROUS SILICATE MATERIALS L.A. Solovyov, S.D. Kirik, Institute of Chemistry and Chemical Engineering, Krasnoyarsk, Russia, A.N. Shmakov, V.N. Romannikov, Boreskov Institute of Catalysis, Novosibirsk, Russia
A CRITICAL EVALUATION OF LINE OVERLAP CORRECTIONS IN X-RAY SPECTROMETRY L.E. Creasy, Titanium Metals Corporation, Morgantown, PA
ACCURATE QUANTIFICATION OF DRIED RESIDUE THIN FILMS USING X-RAY FLUORESCENCE C.G. Worley, G.J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM
ADVANCE AND FUNCTION OF GEOCHEMICAL MAPPING USING WAVELENGTH DISPERSIVE X-RAY FLUORESCENCE SPECTROMETRY IN CHINA G. Ma, G. Liang, L. Luo, X. Zhan, National Research Center of Geological Analysis, Beijing, China, G. Li, Institute of Geophysical and Geochemical Exploration, Hebei, China
AN ELASTIC CONSTANTS DATABASE AND XEC CALCULATOR FOR USE IN XRD RESIDUAL STRESS ANALYSIS A.C. Vermeulen, Philips Analytical, Almelo, The Netherlands
AN EVALUATION OF XRD AND XRF METHODS USED IN AN ALUMINUM BATH ANALYSIS S. Kirik, Institute of Chemistry and Chemical Engineering, Krasnoyarsk, Russia, I. Yakimov, Academy of Non-ferrous Metals and Gold, Krasnoyarsk, Russia
AN INSTRUMENT FOR RAPID TEXTURE MAPPING ON 200 MM WAFERS K.J. Kozaczek, R.I. Martin, D.S. Kurtz, P.R. Moran, S.P. O'Leary, R.L. Martin, HyperNex, Inc., State College, PA
AN INVESTIGATION OF GIANT MAGNETORESISTANCE (GMR) SPIN-VALVE STRUCTURES USING X-RAY DIFFRACTION AND REFLECTIVITY E. Brown, EB Scientific Enterprises, Golden, CO, M. Wormington, Bede Scientific Incorporated, Englewood, CO
AN X-RAY DIFFRACTION STUDY OF TRIPHENYL BASED DISCOTIC LIQUID CRYSTALS T. Blanton, Eastman Kodak Company, Rochester, NY, H.P. Chen, J. Mastrangelo, S.H. Chen, University of Rochester, Rochester, NY
AN XRD STUDY OF THE STRUCTURE AND MICROSTRUCTURE OF THE LABORATORY SYNTHESIZED CRYSTALS OF MgNb2O6 (MN) and PbMg1/3Nb2/3O3 (PMN) C.O. Paiva-Santos, A.A. Cavalheiro, M.A. Zaghete, M. Cilense, J.A. Varela, UNESP.Araraquara, SP Brazil, M.T. Silva Giotto, UFSCar. Sa*o Carlos, SP Brazil, Y.P. Mascarenhas, USP. Sa*o Carlos, SP Brazil
ANALYSIS OF PIGMENTS USED IN THE SCROLL PAINTINGS OF A NATIONAL TREASURE "TALE OF GENJI" USING A PORTABLE X-RAY FLUORESCENCE SPECTROMETER K. Sugihara, K. Tamuara, M. Satoh, Seiko Instruments, Inc., Chiba, Japan, Y. Hayakawa, Y. Hirao, S. Miura, Tokyo National Research Institute of Cultural Properties, Tokyo, Japan, H. Yotsutsuji, Y. Tokugawa, Tokugawa Art Museum, Aichi, Japan
ANALYSIS OF RESIDUAL STRESS STATE IN SPEED GEARS FOR AUTOMOTIVE VEHICLES T. Gurova, J.R. Teodo*sio, Universidade Federal do Rio de Janeiro, Rio de Janeiro, Brasil, V. Monine, Instituto Polite*cnico do Rio de Janeiro, Nova Friburgo, Brasil
ANALYTICAL MICRO X-RAY FLUORESENCE SPECTROMETER W. Chang, J. Kerner and E. Franco, ARACOR, Sunnyvale, CA
APPLICATIONS OF FAST X-RAY REFLECTOMETRY - A NEW TOOL FOR IN-SITU THIN FILM ANALYSIS D.K. Agnihotri, R. Ortega, Rigaku/USA, The Woodlands, TX
APPLYING THE RIETVELD METHOD TO MINERAL FILLED POLYPHENYLENE SULFIDE COMPOUNDS R.W. Morton, J.J. Gislason, R.L. Heald, Phillips Petroleum Company, Bartlesville, OK, D.E. Simon, DES Consulting, Broken Arrow, OK, J.F. Geibel, Chevron Philips Chemical Company, Bartlesville, OK
APPROACHING A UNIVERSAL SAMPLE PREPARATION METHOD FOR XRF ANALYSIS OF POWDER MATERIALS J. Anzelmo, A. Seyfarth, L. Arias, Bruker AXS, Inc., Madison, WI
AUTOMATED RIETVELD-ANALYSIS OF LARGE NUMBERS OF DATASETS S. Vogel, H.-G. Priesmeyer, Christian-Albrechts-Universita*t Kiel, Kiel, Germany
CALCULATION OF MAJOR CRYSTALLOGRAPHIC POLES ALONG ODF FIBERS PARALLEL TO THE GAMMA FIBER S.H. Magner, B.M. Wilson, University of Nebraska, Lincoln, NE, R.J. De Angelis, University of Florida, Shalimar, FL
CALIBRATION OF A HIGH TEMPERATURE X-RAY DIFFRACTION STAGE BY DIFFERENTIAL THERMAL EXPANSION A.R. Drews, Ford Research Laboratories, Dearborn, MI
CHARACTERIZATION OF X-RAY DIFFRACTION SYSTEM WITH A MICROFOCUS X-RAY SOURCE AND A POLYCAPILLARY OPTIC M. Gubarev, M. Joy, NASA/Marshall Space Flight Center, Huntsville, AL, E. Ciszak, NASA/Marshall Space Flight Center, Huntsville, AL and Universities Space Research Association, Huntsville, AL, I. Ponomarev, X-ray Optical Systems, Inc., Albany, NY
COMPARISON OF LABORATORY-BASED X-RAY MICRODIFFRACTION AND ELECTRON BACKSCATTER DIFFRACTION FOR PHASE IDENTIFICATION J.R. Verkouteren, J.A. Small, National Institute of Standards and Technology, Gaithersburg, MD, J.R. Michael, Sandia National Laboratories, Albuquerque, NM
COMPARISON OF THREE UNIVERSAL CURVES FOR THE ESCAPE PROBABILITY OF X-RAY EXCITED ELECTRONS: I. THEORY H. Ebel, R. Svagera, M.F. Ebel, W.S.M. Werner, Technische Universita*t Wien, Wien, Austria
COMPARISON OF THREE UNIVERSAL CURVES FOR THE ESCAPE PROBABILITY OF X-RAY EXCITED ELECTRONS: II. EVALUATION OF LAYER THICKNESSES DETERMINED BY TOTAL ELECTRON YIELD (TEY) H. Ebel, R. Svagera, M.F. Ebel, W.S.M. Werner, Technische Universita*t Wien, Wien, Austria
COMPLETE POLE FIGURE MEASUREMENT USING ONLY BACK-REFLECTION METHOD WITH IMAGING PLATE AND APPLICATION TO THREE-DIMENSIONAL ANALYSIS OF TEXTURE T. Goto, T. Kondoh, Aichi Institute of Technology, Toyota, Japan, H. Hirose, Kinjyo College, Mattou, Japan, T. Sasaki, Kanazawa University, Kanazawa, Japan
COMPOSITION DEPENDENCE OF X-RAY ELASTIC CONSTANTS OF TITANIUM ALUMINIDE INTERMETALLIC COMPOUNDS T. Kondoh, T. Goto, Aichi Institute of Technology, Toyota, Japan, T. Sasaki, Y. Hirose, Kanazawa University, Kanazawa, Japan
DETERMINATION OF FLUORESCENCE YIELDS USING MONOCHROMATIZED UNDULATOR RADIATION OF HIGH SPECTRAL PURITY AND WELL-KNOWN FLUX B. Beckhoff, G. Ulm, Physikalisch-Technische Bundesanstalt, Berlin, Germany
DETERMINATION OF THE ELECTRON DENSITY DISTRIBUTION IN TETRAGONAL BaTiO3 USING THE MAXIMUM ENTROPY METHOD J. Harada, K. Yugami, Rigaku Corporation, Tokyo, Japan, M. Sakata, E. Nishibori, M. Takata, Nagoya University, Nagoya, Japan, Y. Akishige, T. Nakata, H. Tanakac, Shimane University, Matsue, Japan, Y. Kuroiwa, Okayama University, Okayama, Japan
EDXRF ANALYSIS OF PIGMENTS OF WORKS OF ART FROM THE SPAIN'S CULTURAL HERITAGE J.L. Ferrero, C. Roldan, D. Juanes, C. Morera, and E. Rollano, Institut de Ciencia dels Materials de la Universitat de Valencia C/Dr. Molier, 50. E46100-Burjassot, Espana
EFFECT OF PRESSURE ON THE STRUCTURE OF NiAl2O4 I. Halevy, D. Dragoi, E. U*stu*ndag, A. Yue, E. Arredondo, California Institute of Technology, Pasadena, CA, J. Hu, M. Somayazulu, NSLS - Brookhaven National Laboratory, Upton, NY
ENGINEERING APPLICATIONS OF X-RAY STRESS ANALYSIS N. Ganev, I. Kraus, Czech Technical University, Prague, Czech Republic
FOCUSING CRYSTAL VON HAMOS SPECTROMETERS FOR XRF APPLICATIONS D. Clark Turner, A. Reyes-Mena, J.D. Phillips, H.K. Pew, P.W. Moody, S. Voronov, MOXTEK, Inc., Orem, UT, A.P. Shevelko, Russian Academy of Sciences, L.V. Knight, Brigham Young University
FUSED BEADS FROM METAL DRILLINGS AND CHIPS EXAMPLE OF APPLICATION TO TIN-LEAD ALLOYS J. Blanchette, F. Claisse, Corporation Scientifique Claisse, Inc., Que*bec, Canada
HIGH RESOLUTION TEXTURE ANALYSIS OF THIN BLANKET FILMS DISCREET TEST STRUCTURES IN SEMICONDUCTOR DEVICES K.J. Kozaczek, R.I. Martin, D.S. Kurtz, P.R. Moran, S.P. O'Leary, R.L. Martin, HyperNex, Inc., State College, PA
IN SITU X-RAY DIFFRACTION ANALYSIS OF DISORDER AND STRAIN IN ION IMPLANTED CERAMIC THIN FILMS S. Grigull, European Synchrotron Radiation Facility, Grenoble, France, M. Ishimaru, M. Nastasi, Los Alamos National Laboratory, Los Alamos, New Mexico, C.A. Zorman, M. Mehregany, Case Western Reserve University, Cleveland, Ohio
INFLUENCE OF TEXTURE AND ANISOTROPHY ON MICROSTRESSES AND FLOW BEHAVIOR IN A DUPLEX STAINLESS STEEL DURING LOADING J. Johansson Moverare, M. Ode*n, Linkoping University, Linko*ping, Sweden
INTELLIGENT INTERPOLATION FOR BACKGROUND SUBTRACTION - A HYBRID APPROACH FOR TRACE-ELEMENT ANALYSIS R.A. Couture, Washington University, St. Louis, MO
INVESTIGATION OF THE REDUCTION OF NiAl2O4 E. U*stu*ndag, California Institute of Technology, Pasadena, CA, B. Clausen, M.A.M. Bourke, Los Alamos National Laboratory, Los Alamos, NM
MEASUREMENT OF RESIDUAL PHASE STRESS OF THE METAL MATRIX COMPOSITE MATERIAL USING SYNCHROTRON RADIATION S. Takago, T. Sasaki, Y. Hirose, Kanazawa University, Kanazawa, Japan, K. Akita, Tokyo Metropolitan University, Tokyo, Japan, Y. Yoshioka, Musashi Institute of Technology, Tokyo, Japan
MICRO-DIFFRACTION WITH MONO-CAPILLARIES M.J. Fransen, J.H.A. Vasterink, J. te Nijenhuis, Philips Analytical, Almelo, The Netherlands
NON-DESTRUCTIVE IN-SITU REAL-TIME MEASUREMENTS OF STRUCTURAL PHASE TRANSITIONS USING NEUTRON TRANSMISSION S. Vogel, H.-G. Priesmeyer, Christian-Albrechts-Universita*t Kiel, Kiel, Germany, M. Bourke, Los Alamos National Laboratory, Los Alamos, NM, E. U*stu*ndag, J.C. Hanan, California Institute of Technology, Pasadena, CA
NUMERICAL SIMULATION OF THE X-RAY STRESS ANALYSIS TECHNIQUE IN POLYCRYSTALLINE MATERIALS WITH HEXAGONAL CRYSTAL SYMMETRY H. Wern, T. Maas, N. Koch, HTW des Saarlandes, Saarbru*cken, Germany
PORTABLE XRF INSTRUMENTATION FOR MINING D.J. Watson, T. Howe, D. Kenning, Edax Portable Products Division, Kennewick, WA, J. Nicolosi, Edax, Inc., Mahwah, NJ
PREDICTION OF THE CRYSTAL STRUCTURE OF BYNARY AND TERNARY INORGANIC COMPOUNDS USING SYMMETRY RESTRICTIONS AND POWDER DIFFRACTION DATA L. Reinaudi, P. Serra, E.P.M. Leiva, R.E. Carbonio, Universidad Nacional de Co*rdoba, Co*rdoba, Argentina
PROBLEMS BY USING PRESSED POWDER PELLETS FOR XRF ANALYSIS OF FERROSILICON ALLOYS T. Eivindson, O*. Mikkelsen, Elkem ASA Research, Norway
PROGRESS IN X-RAY DIFFRACTION OF RESIDUAL MACRO-STRESS DETERMINATION RELATED TO SURFACE LAYER GRADIENTS AND ANISOTROPY S.J. Skrzypek, A. Baczman*ski, University of Mining and Metallurgy, Krako*w, Poland
RESIDUAL STRAINS IN A PIGMA WELDED BERYLLIUM RINGS D.W. Brown, R. Varma, M.A.M. Bourke, P. Burgardt, B. Clausen, Los Alamos National Laboratory, Los Alamos, NM, S. Spooner, T. Ely, Oak Ridge National Laboratory, Oak Ridge, TN, M.R. Daymond, ISIS, Rutherford Appleton Laboratory, United Kingdom
RESIDUAL STRESSES IN Ti-SiC COMPOSITES J.C. Hanan, D. Dragoi, E. U*stu*ndag, California Institute of Technology, Pasadena, CA, I.C. Noyan, IBM, Yorktown Heights, NY, D. Haeffner, P. Lee, Argonne National Laboratory, Argonne, IL
RESIDUAL STRESSES IN TUNGSTEN/BULK METALLIC GLASS COMPOSITES D. Dragoi, E. U*stu*ndag, B. Clausen, California Institute of Technology, Pasadena, CA, M.A.M. Bourke, Los Alamos National Laboratory, Los Alamos, NM
STANDARD REFERENCE MATERIAL *TM (SRM 1990) FOR SINGLE CRYSTAL DIFFRACTOMETER ALIGNMENT W. Wong-Ng, J. Armstrong, M. Levenson, L.P. Cook, National Institute of Standards and Technology, Gaithersburg, MD, T. Siegrist, Lund University, Sweden, G. DeTitta, Hauptman-Woodward Medical Research Institute, Buffalo, NY, L. Finger, Geophysical Laborat
STUDY AND SERVICE CONTROL OF STRESS STATE OF HIGH-STRENGTH STEEL CABLES, USED IN PRESTRESSED CONCRET STRUCTURES V. Monine, Instituto Polite*cnico do Rio de Janeiro, Nova Friburgo, Brasil, T. Gurova, J.R. Teodo*sio, Universidade Federal do Rio de Janeiro, Rio de Janeiro, Brasil
STUDY ON EVALUATION OF RESIDUAL PHASE STRESS OF THE DUAL PHASE STAINLESS STEEL H. Hirose, Kinjo Junior College, Matto, Japan, H. Hashi, T. Sasaki, Kanazawa University, Kanazawa, Japan
STUDY ON FRACTURE ANALYSIS OF (alpha+gamma) DUAL PHASE STAINLESS STEEL USING X-RAY DIFFRACTION H. Hirose, Kinjo Junior College, Matto, Japan, T. Hamagami, T. Sasaki, Kanazawa University, Kanazawa, Japan
TEXTURE CHARACTERIZATION IN X-RAY AND NEUTRON POWDER DIFFRACTION DATA USING THE GENERALIZED SPHERICAL-HARMONIC H. Sitepu, National Institute of Standards and Technology, Gaithersburg, MD and SUNY, Stony Brook, NY, H.J. Prask, M.D. Vaudin, National Institute of Standards and Technology, Gaithersburg, MD
THE CNESTEN EDXRF SPECTROMETERS - SENSITIVITY, CALIBRATION, AND APPLICATION TO GEOCHEMISTRY A. Rahmani, F. Benyai*ch, A. Saadane, Universite* My Ismail, Mekne*s, Morocco, M. Bounakhla, CNESTEN, Rabat, Morocco
THE IMPORTANCE OF THE SPECIMEN DISPLACEMENT CORRECTION IN RIETVELD PATTERN FITTING WITH SYMMETRIC REFLECTION-OPTICS DIFFRACTION DATA B. O'Connor, D. Li, Curtin University of Technology, Perth, Australia, B. Hunter, Lucas Heights Research Laboratories, Menai, Australia
THE USE OF X-RAY REFLECTOMETRY FOR SINGLE FILM THICKNESS ANALYSIS IN GMR MULTILAYER STACKS C. Schug, B. York, J. Marien, H. Blank, IBM Storage Technology Division
USING A CHARGE-COUPLED DEVICE (CCD) TO GATHER X-RAY FLUORESCENCE (XRF) AND X-RAY DIFFRACTION (XRD) INFORMATION SIMULTANEOUSLY A. Reyes, H.K. Pew, P. Moody, MOXTEK, Inc., Orem, UT, L.V. Knight, S. Cornaby, T. Hughes, A. Stradling, Brigham Young University
WAVELET REPRESENTATION OF DIFFRACTION POLE FIGURES H. Schaeben, J. Prestin, Freiberg University of Mining and Technology, Freiberg, Germany
WHITE AND MONOCHROMATIC X-RAY MICROBEAM INVESTIGATIONS OF MATERIALS MICROSTRUCTURE AND TRI-AXIAL STRESS B.C. Larson, G.E. Ice, N. Tamura, W. Yang, J.Z. Tishler, J.-S. Chung, J.D. Budai, K.-S. Chung, Oak Ridge National Laboratory, Oak Ridge, TN; H. Weiland, Alcoa Technical Center, Alcoa Center, PA;W.P. Lowe, Howard University, Washington D.C.
X-RAY DIFFRACTION IMAGING AS A TOOL OF MESOSTRUCTURE ANALYSIS J. Fiala, S*koda Research, Ltd., Plzen*, Czech Republic
X-RAY FLUORESCENCE ANALYSIS BASED ON KNOWLEDGE SYSTEM L. Luo, X. Wu, L. Gan, G. Liang, G. Ma, National Research Center of Geoanalysis, Beijing, China
X-RAY MICROBEAM DIFFRACTION COMPARISON OF MESOTEXTURES IN PLATES OF THREE ALUMINUM ALLOYS K. Ignatiev, S.R. Stock, Georgia Institute of Technology, Atlanta, GA, Z.U. Rek, Stanford Synchrotron Radiation Laboratory, Stanford, CA
X-RAY SMALL-SIZED AUTOMATIC TENSOMETER TRIM V. Trofimov, St. Petersburg State Technical University, Russia, J. Macleod, JME, Suffolk, United Kingdom
X-RAY STRESS ANALYSIS IN PRESENCE OF GRADIENTS AND TEXTURE Ch. Genzel, Hahn-Meitner-Institut Berlin, Germany
X-RAY STRESS DETERMINATION OF COLD-ROLLED STEEL SHEET USING ORIENTATION DISTRIBUTION FUNCTION S. Ejiri, Y. Shirasuna, Seisen Jogakuin College, Nagano, Japan, T. Sasaki, Y. Hirose, Kanazawa University, Kanazawa, Japan, H. Inoue, University of Osaka Prefecture, Osaka, Japan
XRD RAPID SCREENING SYSTEM FOR COMBINATORIAL CHEMISTRY B.B. He, J. Anzelmo, P. LaPuma, U. Preckwinkel, K. Smith, Bruker Analytical X-ray Systems, Madison, WI
XRF'S ROLE IN THE PRODUCTION OF MAGNESIUM METAL BY THE MAGNATHERMIC METHOD H.L. Baker, Northwest Alloys, Inc., Addy, WA