Advances in X-ray Analysis Vol. 45

A DIFFRACTOMETER FOR X-RAY STUDIES OF TBC BOND COATS BENEATH ZIRCONIA TOP COATS K. Vaidyanathan, D. Pease, E. Jordan, H. Canistraro, M. Gell, T. Watkins
A HISTORICAL REVIEW OF RETAINED AUSTENITE AND ITS MEASUREMENT BY X-RAY DIFFRACTION S.H. Magner, R.J. De Angelis, W.N. Weins, J.D. Makinson
A NEW REGULARIZATION METHOD TO DETERMINE STRAINS/STRESS DEPTH PROFILES FROM DIFFRACTION EXPERIMENTS H. Wern, P. Klein, G. Marchand
A NON-DESTRUCTIVE X-RAY FLUORESCENCE METHOD FOR ANALYSIS OF METAL ALLOY WIRE SAMPLES S.J. Goldstein, L.D. Sivils
A QUARTER OF CENTURY OF ROUND ROBIN TESTS ON XRD G. Berti, M. D'Acunto, F. De Marco
A QUICK AND RELIABLE FUSION METHOD FOR SILICON AND FERROSILICON J. Blanchette
AN INNOVATED LABORATORY XAFS APPARATUS T. Taguchi, J. Harada, K. Tohji, K. Shinoda
ANALYSIS OF LEAD IN CANDLE PARTICULATE EMISSIONS BY XRF USING UNIQUANT (Registered Trademark) 4 S.J. Wasson, Z. Guo
APATITE STRUCTURES J.C. Elliott, R.M. Wilson, S.E.P. Dowker
APPLICATIONS OF 2D DETECTORS IN X-RAY ANALYSIS M.B. Dickerson, K. Pathak, K.H. Sandhage, R.L. Snyder, U. Balachandran, B. Ma, R.D. Blaugher, R.N. Bhattacharya
AUTOMATED PROCESSING OF 2D POWDER DIFFRACTION DATA S. Vogel, L. Ehm, K. Knorr, G. Braun
BACKGROUND SUBTRACTION FOR TRACE-ELEMENT ANALYSIS - ANALYTICAL COMPARISON OF METHODS R.A. Couture
CALIBRATION MONITORING OF DIFFRACTOMETERS G. Berti, M. D'Acunto
CHARACTERIZATION OF NANOMETER LAYERED STRUCTURES USING MULTIPLE WAVELENGTH X-RAY REFLECTOMETRY AND SIMULATED ANNEALING DATA ANALYSIS E. Ziegler, C. Ferrero, F. Lamy, C. Chapron, Ch. Morawe
DAMAGE EVOLUTION IN Ti-SiC UNIDIRECTIONAL FIBER COMPOSITES J.C. Hanan, G.A. Swift, E. Ustundag, I.J. Beyerlein, B. Clausen, J. Almer, U. Lienert, D.R. Haeffner
DEEP MULTILAYER GRATINGS WITH ADJUSTABLE BANDPASS FOR XRF SPECTROSCOPY V.V. Martynov, Yu. Platonov
DEVELOPMENT OF ACCELERATOR - BASED X-RAY FLUORESCENCE FOR LARGE SAMPLE ASSAY D.P. Wells, F.A. Selim, J.F. Harmon, W. Scates, J. Kwofie, R. Spaulding, S.P. Duttagupta, J.L. Jones, T. White, T. Roney
DEVELOPMENT OF MgO CERAMIC STANDARDS FOR X-RAY AND NEUTRON LINE BROADENING ASSESSMENTS S. Pratapa, B. O'Connor
EFFECT OF HEAT TREATMENT ON RESIDUAL STRESS PROFILES OF PULSE-PLATED CRACK-FREE Cr LAYER Y. Kobayashi, J. Nagasawa, K. Watanabe, K. Nakamura, T. Sasaki, Y. Hirose
ELASTIC STRAIN EVOLUTION IN SINGLE-FIBER METAL MATRIX COMPOSITES UNDER TENSILE LOADING J.C. Hanan, E. Ustundag, I.J. Beyerlein, G.A. Swift, B. Clausen, D.W. Brown, M.A.M. Bourke
FACTORS INFLUENCING QUANTITATIVE RESULTS FOR COAL COMBUSTION BY-PRODUCTS USING THE RIETVELD METHOD R.M. Gonzalez, T.D. Lorbiecke, B.W. McIntyre, J.D. Cathcart, M. Brownfield, R.S. Winborn
FATIGUE CRACKS IN ALUMINUM SAMPLES STUDIED WITH X-RAY PHASE CONTRAST IMAGING AND WITH ABSORPTION MICROTOMOGRAPHY S.R. Stock, K. Ignatiev, G.R. Davis, J.C. Elliott, K. Fezzaa, W.-K. Lee
FEASIBILITY OF IN SITU TXRF A. Singh, P. Goldenzweig, K. Baur, S. Brennan, P. Pianetta
FOCUSING POLYCAPILLARY OPTICS FOR DIFFRACTION H. Huang, C.A. MacDonald, W.M. Gibson, J.R. Ruble, J.X. Ho, D.C. Carter, J. Chik, I. Ponomarev
FUNDAMENTAL PARAMETER METHOD FOR THE LOW ENERGY REGION INCLUDING THE CASCADE EFFECT AND THE PHOTOELECTRON EXCITATION N. Kawahara, T. Shoji, T. Yamada, Y. Kataoka, B. Beckhoff, G. Ulm, M. Mantler
HIGH CONTRAST IMAGING WITH POLYCAPILLARY OPTICS C.A. MacDonald, W.M. Gibson, F.R. Sugiro
HIGH RESOLUTION DEBYE-SCHERRER CAMERA INSTALLED AT SPring-8 M. Takata, E. Nishibori, K. Kato, Y. Kubota, Y. Kuroiwa, M. Sakata
http://www.icdd.com/resources/axa/vol45/V45_25.pdf D. Balzar, N.C. Popa
IMPROVED MODELING OF RESIDUAL STRAIN/STRESS AND CRYSTALLITE-SIZE DISTRIBUTION IN RIETVELD REFINEMENT B. O'Connor, S. Pratapa
IN SITU HIGH-TEMPERATURE STUDY OF SILVER BEHENATE REDUCTION TO SILVER METAL USING SYNCHROTRON RADIATION T. Blanton, M. Lelental, S. Zdzieszynski, S.T. Misture
INFLUENCE OF RENITRIDING FOR THERMAL FATIGUE PROPERTIES ON NITRIDED HOT WORK DIE STEEL (H13) K. Yatsushiro, M. Sano, M. Hihara, K. Okada, M. Kuramoto
IN-SITU XRD TO OPTIMIZE POWDER SYNTHESIS OF AURIVILLIUS PHASES M.S. Haluska, S.A. Speakman, S.T. Misture
JOHN CRISS COMMEMORATIVE SESSION: QUANTITATIVE XRF - OPENING REMARKS J.V. Gilfrich
MATRIX-INDEPENDENT XRF METHODS FOR CERTIFICATION OF STANDARD REFERENCE MATERIALS J.R. Sieber
MEASUREMENT OF RESIDUAL STRESSES IN FIBER REINFORCED COMPOSITES BASED ON X-RAY DIFFRACTION B. Benedikt, P.K. Predecki, L. Kumosa, P. Rupnowski, M. Kumosa
MICRO STRAIN IN HMX INVESTIGATED WITH POWDER X-RAY DIFFRACTION AND CORRELATION WITH THE MECHANICAL SENSITIVITY M. Herrmann, W. Engel, H. Goebel
MICRO-STRAIN IN Y0.5*R0.5*Ba2*Cu3*O7-x* (R=Yb, Tm, Er, Ho, Dy, Gd, Eu, Sm, AND Nd) E.J. Peterson, W.L. Hults, M. Simpson, J. Yates Coulter, J.L. Smith
MINERAL PHASE MICROSTRUCTURE IN TEETH OF THE SHORT SPINED SEA URCHIN (Lytechinus variegatus) STUDIED WITH X-RAY PHASE CONTRAST IMAGING AND WITH ABSORPTION MICROTOMOGRAPHY S.R. Stock, T. Dahl, J. Barss, A. Veiss, K. Fezzaa, W.K. Lee
NON-DESTRUCTIVE 3D STRUCTURAL STUDIES BY X-RAY MICROTOMOGRAPHY G.R. Davis, S.E.P. Dowker, J.C. Elliott, P. Anderson, H.S. Wassif, A. Boyde, A.E. Goodship, S.R. Stock, K. Ignatiev
NON-TRADITIONAL POWDER CRYSTALLOGRAPHY IN THE PETROCHEMICAL INDUSTRY J.A. Kaduk
POLYCAPILLARY OPTICS AND X-RAY ANALYTICAL TECHNIQUES Y. Yan, W.M. Gibson
POLYCAPILLARY OPTICS BASED NEUTRON FOCUSING FOR SMALL SAMPLE NEUTRON CRYSTALLOGRAPHY W.M. Gibson, H.H. Chen-Mayer, D.F.R. Mildner, H.J. Prask, A.J. Schultz, R. Youngman, T. Gna*upel-Herold, M.E. Miller, R. Vitt
POLYCAPILLARY OPTICS FOR ANGULAR FILTERING OF X-RAYS AND NEUTRONS IN TWO DIMENSIONS W.M. Gibson, H. Huang, J. Nicolich, P. Klein, C.A. MacDonald
POLYCAPILLARY OPTICS: AN ENABLING TECHNOLOGY FOR NEW APPLICATIONS D. Gibson, W. Gibson
PREDICTING FATIGUE FAILURE USING TWO-DIMENSIONAL X-RAY DETECTOR R.G. Tissot, M.O. Eatough, R.P. Goehner
QUANTIFICATION OF GALLIUM IN DRIED RESIDUE SAMPLES BY XRF: AN IMPROVED SAMPLE PREPARATION METHOD FOR ANALYZING PLUTONIUM METAL C.G. Worley
QUANTIFICATION OF MERCURY, LEAD, AND CADMIUM IN AQUEOUS SOLUTIONS BY ENERGY K X-RAY FLUORESCENCE SPECTROSCOPY P. Suwanathada, T.A. DeVol
QUANTITATIVE ANALYSIS OF LOW-Z ELEMENTS IN TOTAL REFLECTION X-RAY FLUORESCENCE SPECTROSCOPY M. Doi, M. Yamagami, T. Shoji, T. Yamada
RIETVELD REFINEMENT OF LiCoO2-TYPE LAYERED STRUCTURES: SEMI-QUANTITATIVE ANALYSIS OF Li CONTENTS M.A. Rodriguez, D. Ingersoll, D.H. Doughty
RIETVELD REFINEMENT OF POWDER DATA FROM MULTILAYER OPTICS S.T. Misture
RIETVELD STRUCTURE REFINEMENT OF CARBONATE AND SULFITE ETTRINGITE D.G. Grier, E.L. Jarabek, R.B. Peterson, L.E. Mergen, G.J. McCarthy
SELFCONSISTENT DETERMINATION OF THE X-RAY ELASTIC CONSTANTS OF POLYCRYSTALLINE MATERIALS FOR ARBITRARY CRYSTAL SYMMETRY N. Koch, H. Wern
SIGNIFICANCE OF EXPERIMENTAL ERRORS IN RESIDUAL STRESS DETERMINATIONS USING THETA : THETA DIFFRACTOMETERS H.W. King, S.H. Ferguson, S. Gursan, M. Yildiz
SIMULTANEOUS XRF/XRD WITH LOW-POWER X-RAY TUBES S. Cornaby, A. Reyes-Mena, P.W. Moody, T. Hughes, A. Stradling, T. Grow, L.V. Knight
SR-XRF INVESTIGATION OF HUMAN BONE P. Wobrauschek, G. Pepponi, C. Streli, C. Jokubonis, G. Falkenberg, W. Osterode
STRESS ERRORS ASSOCIATED WITH MINIATURIZATION OF X-RAY STRESS ANALYZER T. Goto, Y. Gong
STRUCTURAL AND OPTICAL PROPERTIES OF IRIDIUM FILMS ANNEALED IN AIR S. Kohli, D. Niles, C.D. Rithner, P.K. Dorhout
SULFATE ATTACK OF PORTLAND CEMENT STUDIED BY X-RAY MICROTOMOGRAPHY (MICRO-CT) S.R. Stock, K. Ignatiev, A.P. Wilkinson, N. Naik, K.E. Kurtis
SURFACE AREA OF INTERSTRATIFIED PHYLLOSILICATES IN ATHABASCA OIL SANDS FROM SYNCHROTRON XRD O.E. Omotoso, R.J. Mikula, P.W. Stephens
SYNCHROTRON X-RAY AND NEUTRON FIBER DIFFRACTION STUDIES OF CELLULOSE POLYMORPHS Y. Nishiyama, H. Chanzy, M. Wada, J. Sugiyama, K. Mazeau, T. Forsyth, C. Riekel, M. Mueller, B. Rasmussen, P. Langan
SYSTEMATIC ERRORS IN METAL STRIP DIFFRACTION FURNACES S.T. Misture, C.R. Hubbard, X.L. Wang
TEMPERATURE-INDUCED CONTRAST VARIATION AS A TOOL FOR CHARACTERIZING ANISOTROPIC POLYMER MICROSTRUCTURES J.D.Barnes, R. Kolb, W. Bras
TEXTURE AND PRESS FORMABILITY OF DUAL-PHASE STAINLESS STEEL SHEET T. Goto, T. Kondoh, T. Sasaki, Y. Hirose, H. Inoue
THE CHANGING YEARS: 1970-1980 C.O. Ruud
THE CHANGING YEARS: 1980-1997 P. Predecki, The University of Denver, Denver, CO
THE LINE OVERLAP CORRECTION BY THEORETICAL INTENSITY Y. Yamada, Y. Kataoka, N. Kawahara, H. Kohno, J. Martin, A. Martin
THE NAMES BEHIND THE DENVER CONFERENCE AWARDS: THE BIRKS AWARD IN X-RAY SPECTROMETRY J.V. Gilfrich
THE RESIDUAL STRESS MEASUREMENT OF TiCN PVD FILMS S. Takago, M. Gotoh, T. Sasaki, Y. Hirose
THE VERY EARLY YEARS OF THE DENVER X-RAY CONFERENCE W.M. Mueller
TOTAL REFLECTION X-RAY FLUORESCENCE FOR ENVIRONMENTAL SAMPLES M. Schmeling
TXRF FOR SEMICONDUCTOR APPLICATIONS Y. Mori
TXRF TO MONITOR FOR HIGH K DIELECTRIC MATERIAL CONTAMINATION IN A SEMICONDUCTOR FAB C. Sparks, M. Beebe
USABILITY OF PORTABLE X-RAY SPECTROMETER FOR DISCRIMINATION OF VALENCE STATES I.A. Brytov, R.I. Plotnikov, B.D. Kalinin
USE OF ACCURATE STRUCTURE DATA FROM X-RAY POWDER DIFFRACTION TO SIMULATE THE MAGNETIC PROPERTIES OF RARE EARTHS J. Ho*lsa*, M. Lahtinen, M. Lastusaari, J. Nittykoski, R.S. Puche, J. Valkonen
USE OF IN-SITU XRD TO DEVELOP CONDUCTING CERAMICS WITH THE AURIVILLIUS CRYSTAL STRUCTURE S.A. Speakman, V.B. Modi, M.S. Haluska, S.T. Misture
X-RAY ANALYSIS OF RESIDUAL STRESS DISTRIBUTION IN WELD REGION J.T. Assis, V. Monin, J.R. Teodosio, T. Gurova
X-RAY DIFFRACTION AND VIBRATIONAL SPECTROSCOPY OF CATALYSTS FOR EXHAUST AFTERTREATMENT R.D. England, H. Fang, T.R. Watkins, M.J. Lance, D. Blom
X-RAY DIFFRACTION STUDY ON HIGHLY ORDERED MESOSTRUCTURED THIN FILMS T. Noma, H. Miyata, K. Takada, A. Iida
X-RAY DIFFRACTION STUDY ON THE FORMATION OF ULTRAFINE NANOSTRUCTURES BY CRYSTALLIZATION OF METALLIC GLASSES N. Mattern
X-RAY FLUORESCENCE MICROANALYSIS OF BIOMEDICAL AND ENVIRONMENTAL SAMPLES M. Lankosz, M. Boruchowska, J. Ostachowicz, D. Adamek, B. Tomik
X-RAY FOCUSING CRYSTAL VON HAMOS SPECTROMETER WITH A CCD LINEAR ARRAY AS A DETECTOR A. Shevelko, L. Knight, Q. Wang, O. Yakushev, P.N. Lebedev
X-RAY OPTICS FOR TWO-DIMENSIONAL DIFFRACTION B.B. He, U. Preckwinkel
X-RAY STRESS MEASUREMENT FOR Ni-Al SYSTEM INTERMETALLIC COMPOUND PREPARED BY SHS-METHOD T. Murotani, J. He, T. Sasaki, H. Hirose
XRD PEAK BROADENING EFFECTS IN U-Mo ALPHA" PHASE E. Dabush, J. Sariel, I. Dahan, G. Kimmel
XRF ANALYSIS OF AUTOMOTIVE CATALYSTS BY FLUX/FUSION A.R. Drews